J. Verhoeven
Impact in
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques
- Radiation top 5%
- X-ray Spectroscopy and Fluorescence Analysis
- Advanced X-ray Imaging Techniques
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 23
- Radiation 19
- X-ray Spectroscopy and Fluorescence Analysis 17
- Advanced X-ray Imaging Techniques 11
- Co-authors
- M.J. van der WielF.H.P.M. HabrakenJohn A. JansenK. van DijkAlbert PolmanC. H. M. MaréeH. ZeijlemakerJ.W.M. Frenken
- Journals
- Surface Science (12 papers)Applied Surface Science (10 papers)Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (6 papers)Applied Physics Letters (5 papers)Journal of Applied Physics (3 papers)
- Partner nations
- NetherlandsUnited KingdomUnited States
In The Last Decade
J. Verhoeven
71 papers receiving 1.3k citations
Peers
Comparison fields: 5 of 77
- Surfaces, Coatings and Films 243
- Radiation 213
- Structural Biology 25
- Orthodontics 63
- Computational Mechanics 284
Countries citing papers authored by J. Verhoeven
This map shows the geographic impact of J. Verhoeven's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Verhoeven with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Verhoeven more than expected).
Fields of papers citing papers by J. Verhoeven
This network shows the impact of papers produced by J. Verhoeven. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Verhoeven. The network helps show where J. Verhoeven may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J. Verhoeven, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 2 | |
| 2 | 2019 | 1 | |
| 3 | 2010 | 1 | |
| 4 | 2008 | 24 | |
| 5 | 2006 | 1 | |
| 6 | 2006 | 3 | |
| 7 | 2004 | 14 | |
| 8 | 2004 | 1 | |
| 9 | A tabletop soft X-ray source based on 5-10 MeV LINACs | 2000 | 2 |
| 10 | 1998 | 12 | |
| 11 | 1998 | 0 | |
| 12 | 1996 | 9 | |
| 13 | 1995 | 129 | |
| 14 | 1994 | 37 | |
| 15 | 1993 | 21 | |
| 16 | 1988 | 4 | |
| 17 | 1988 | 6 | |
| 18 | 1986 | 8 | |
| 19 | 1985 | 9 | |
| 20 | 1975 | 5 |
About J. Verhoeven
J. Verhoeven is a scholar working on Surfaces, Coatings and Films, Radiation, Computational Mechanics, Structural Biology and Electrical and Electronic Engineering, having authored 73 papers that have together received 1.4k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (23 papers), Ion-surface interactions and analysis (22 papers), X-ray Spectroscopy and Fluorescence Analysis (17 papers), Semiconductor materials and devices (15 papers), Metal and Thin Film Mechanics (13 papers), Advanced X-ray Imaging Techniques (11 papers), Diamond and Carbon-based Materials Research (9 papers) and Advancements in Photolithography Techniques (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (243 citations), Radiation (213 citations), Structural Biology (25 citations), Orthodontics (63 citations) and Computational Mechanics (284 citations). J. Verhoeven has collaborated with scholars based in Netherlands, United Kingdom and United States. Frequent co-authors include M.J. van der Wiel, F.H.P.M. Habraken, John A. Jansen, K. van Dijk, Albert Polman, C. H. M. Marée, H. Zeijlemaker, J.W.M. Frenken, Martin Jak and Rutger Schlatmann. Their work appears in journals such as Surface Science, Applied Surface Science, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.