Jacobus M. Sturm
- Materials Chemistry top 10%
- Electrical and Electronic Engineering
- Catalysis top 5%
- Atomic and Molecular Physics, and Optics
- Biomedical Engineering
- Co-authors
- F. BijkerkRobbert Wilhelmus Elisabeth van de KruijsAndrey YakshinChris LeeSébastien GuimondHans‐Joachim FreundH. KuhlenbeckM. V. Ganduglia-Pirovano
- Topics
- Semiconductor materials and devices (25 papers)Ion-surface interactions and analysis (16 papers)Metal and Thin Film Mechanics (14 papers)
- Partner nations
- NetherlandsGermanyRussia
In The Last Decade
Jacobus M. Sturm
59 papers receiving 754 citations
Peers
Comparison fields: 5 of 54
- Materials Chemistry 421
- Electrical and Electronic Engineering 298
- Catalysis 200
- Atomic and Molecular Physics, and Optics 131
- Biomedical Engineering 104
Countries citing papers authored by Jacobus M. Sturm
This map shows the geographic impact of Jacobus M. Sturm's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jacobus M. Sturm with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jacobus M. Sturm more than expected).
Fields of papers citing papers by Jacobus M. Sturm
This network shows the impact of papers produced by Jacobus M. Sturm. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jacobus M. Sturm. The network helps show where Jacobus M. Sturm may publish in the future.
Co-authorship network of co-authors of Jacobus M. Sturm
This figure shows the co-authorship network connecting the top 25 collaborators of Jacobus M. Sturm. A scholar is included among the top collaborators of Jacobus M. Sturm based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jacobus M. Sturm. Jacobus M. Sturm is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 0 | |
| 5 | 1 | |
| 6 | 17 | |
| 7 | 3 | |
| 8 | 6 | |
| 9 | 1 | |
| 10 | 6 | |
| 11 | 4 | |
| 12 | 11 | |
| 13 | 4 | |
| 14 | 10 | |
| 15 | 17 | |
| 16 | 18 | |
| 17 | 53 | |
| 18 | 7 | |
| 19 | 36 | |
| 20 | 2 |
About Jacobus M. Sturm
Jacobus M. Sturm is a scholar working on Catalysis, Surfaces, Coatings and Films and Computational Mechanics, having authored 63 papers that have together received 770 indexed citations. Recurring topics across this work include Semiconductor materials and devices (25 papers), Ion-surface interactions and analysis (16 papers) and Metal and Thin Film Mechanics (14 papers). The work is most often cited by research in Catalysis (200 citations), Surfaces, Coatings and Films (74 citations) and Materials Chemistry (421 citations). Jacobus M. Sturm has collaborated with scholars based in Netherlands, Germany and Russia. Frequent co-authors include F. Bijkerk, Robbert Wilhelmus Elisabeth van de Kruijs, Andrey Yakshin, Chris Lee, Sébastien Guimond, Hans‐Joachim Freund, H. Kuhlenbeck, M. V. Ganduglia-Pirovano, Jens Döbler and Joachim Sauer. Their work appears in journals such as Angewandte Chemie International Edition, Journal of Applied Physics and Langmuir.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.