Cheryl Hartfield

433 total citations
30 papers, 304 citations indexed

About

Cheryl Hartfield is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering. According to data from OpenAlex, Cheryl Hartfield has authored 30 papers receiving a total of 304 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Electrical and Electronic Engineering, 11 papers in Surfaces, Coatings and Films and 11 papers in Biomedical Engineering. Recurrent topics in Cheryl Hartfield's work include Integrated Circuits and Semiconductor Failure Analysis (17 papers), Electron and X-Ray Spectroscopy Techniques (11 papers) and Advanced Electron Microscopy Techniques and Applications (8 papers). Cheryl Hartfield is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (17 papers), Electron and X-Ray Spectroscopy Techniques (11 papers) and Advanced Electron Microscopy Techniques and Applications (8 papers). Cheryl Hartfield collaborates with scholars based in United States, Germany and United Kingdom. Cheryl Hartfield's co-authors include Eric A. Stach, Norman Salmon, Brian P. Gorman, David R. Diercks, Christopher Parmenter, Philippe H. Geubelle, Nancy R. Sottos, Michael W. Fay, Hoda M. Eltaher and Stephen T. Kelly and has published in prestigious journals such as Thin Solid Films, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Microscopy Research and Technique.

In The Last Decade

Cheryl Hartfield

26 papers receiving 294 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Cheryl Hartfield United States 8 136 130 81 55 53 30 304
Kyle Mahady United States 15 101 0.7× 168 1.3× 112 1.4× 87 1.6× 237 4.5× 19 391
Sunao Ishihara Japan 11 108 0.8× 163 1.3× 129 1.6× 29 0.5× 71 1.3× 48 417
D. P. Adams United States 8 185 1.4× 199 1.5× 63 0.8× 32 0.6× 82 1.5× 10 353
Angelina Orthacker Austria 8 59 0.4× 58 0.4× 121 1.5× 63 1.1× 49 0.9× 8 327
Ken-ichiro Nakamatsu Japan 14 306 2.3× 252 1.9× 118 1.5× 29 0.5× 56 1.1× 40 453
Stephen Schwarz United States 8 30 0.2× 90 0.7× 104 1.3× 34 0.6× 54 1.0× 11 244
N. Hayasaka Japan 13 88 0.6× 415 3.2× 108 1.3× 55 1.0× 83 1.6× 32 494
K. Ansari Singapore 12 275 2.0× 266 2.0× 63 0.8× 72 1.3× 107 2.0× 23 446
S. Fakhfakh Tunisia 14 69 0.5× 244 1.9× 171 2.1× 240 4.4× 48 0.9× 40 455
Sang‐Gil Ryu United States 11 179 1.3× 183 1.4× 271 3.3× 13 0.2× 47 0.9× 19 444

Countries citing papers authored by Cheryl Hartfield

Since Specialization
Citations

This map shows the geographic impact of Cheryl Hartfield's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Cheryl Hartfield with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Cheryl Hartfield more than expected).

Fields of papers citing papers by Cheryl Hartfield

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Cheryl Hartfield. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Cheryl Hartfield. The network helps show where Cheryl Hartfield may publish in the future.

Co-authorship network of co-authors of Cheryl Hartfield

This figure shows the co-authorship network connecting the top 25 collaborators of Cheryl Hartfield. A scholar is included among the top collaborators of Cheryl Hartfield based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Cheryl Hartfield. Cheryl Hartfield is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Hartfield, Cheryl, et al.. (2024). Consideration of a Ga-FIB in Lamella Sample Prep for EBIC/EBAC Analysis of Advanced-Node SRAMs. Proceedings - International Symposium for Testing and Failure Analysis. 84918. 478–484.
2.
Hartfield, Cheryl, et al.. (2022). Emerging Technologies for Advanced 3D Package Characterization to Enable the More-Than-Moore Era. ECS Transactions. 109(2). 15–29. 2 indexed citations
3.
Hartfield, Cheryl, et al.. (2022). Emerging Technologies for Advanced 3D Package Characterization to Enable the More-Than-Moore Era. ECS Meeting Abstracts. MA2022-02(17). 855–855. 1 indexed citations
4.
Pérez‐Willard, F., et al.. (2022). Laser Ablation: A New Approach to APT Specimen Preparation. Microscopy and Microanalysis. 28(S1). 50–51. 2 indexed citations
5.
Tordoff, B., Cheryl Hartfield, Marcus Kaestner, et al.. (2020). The LaserFIB: new application opportunities combining a high-performance FIB-SEM with femtosecond laser processing in an integrated second chamber. Han-guk hyeonmigyeong hakoeji/Applied microscopy. 50(1). 24–24. 22 indexed citations
6.
Hartfield, Cheryl, et al.. (2020). New physical analysis capability for counterfeit electronics and reverse engineering. 3 indexed citations
7.
Schmidt, Christian, et al.. (2018). Nanoscale 3D X-ray Microscopy for High Density Multi-Chip Packaging FA. Proceedings - International Symposium for Testing and Failure Analysis. 81009. 424–428. 2 indexed citations
8.
Lång, Christian, et al.. (2016). Enhancing Materials and Device Analysis Capability in the SEM and FIB-SEM by using a Nanomanipulator. Microscopy and Microanalysis. 22(S3). 16–17. 1 indexed citations
9.
Parmenter, Christopher, Michael W. Fay, Cheryl Hartfield, & Hoda M. Eltaher. (2016). Making the practically impossible “Merely difficult”—Cryogenic FIB lift‐out for “Damage free” soft matter imaging. Microscopy Research and Technique. 79(4). 298–303. 34 indexed citations
10.
Parmenter, Christopher, et al.. (2014). Cryogenic FIB Lift-out as a Preparation Method for Damage-Free Soft Matter TEM Imaging. Microscopy and Microanalysis. 20(S3). 1224–1225. 7 indexed citations
11.
Antoniou, Nicholas, et al.. (2012). Failure Analysis of Electronic Material Using Cryogenic FIB-SEM. Proceedings - International Symposium for Testing and Failure Analysis. 39791. 399–405. 7 indexed citations
12.
Hartfield, Cheryl, et al.. (2010). Sample Repositioning Solutions for in situ Preparation and Analysis. Microscopy and Microanalysis. 16(S2). 16–17.
13.
Gorman, Brian P., et al.. (2008). Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis. Microscopy Today. 16(4). 42–47. 70 indexed citations
14.
Hartfield, Cheryl, et al.. (2008). Adhesion strength measurement of polymer dielectric interfaces using laser spallation technique. Thin Solid Films. 516(21). 7627–7635. 38 indexed citations
15.
Hartfield, Cheryl, et al.. (2007). Tool-Related ESD Surface Damage (ESDFOS) on Wafers in Cu-Technology. Proceedings - International Symposium for Testing and Failure Analysis. 30903. 262–269. 5 indexed citations
16.
Gupta, Vijay, et al.. (2004). Measurement of Solder Joint Strength and Its Dependence on Thermal Aging in Freestanding and Board-Mounted Packages using a Laser Spallation Technique. Proceedings - International Symposium for Testing and Failure Analysis. 30873. 267–276. 2 indexed citations
17.
Hartfield, Cheryl, et al.. (2004). Interface Reliability Assessments for Copper/Low-k Products. IEEE Transactions on Device and Materials Reliability. 4(2). 129–141. 33 indexed citations
18.
Hartfield, Cheryl, et al.. (2003). Mechanical and Electrical Characterization of an IC Bond Pad Stack Using a Novel In-Situ Methodology. Proceedings - International Symposium for Testing and Failure Analysis. 30866. 486–495. 4 indexed citations
19.
Brož, Jan, et al.. (2003). Probing and wire bonding of aluminum capped copper pads. 140–143. 5 indexed citations
20.
Hartfield, Cheryl, Alasdair W. McDowall, Bruce E. Loveland, & Kirsten Fischer Lindahl. (1991). Cellular location of thymus‐leukemia (TL) antigen as shown by immuno‐cryoultramicrotomy. Journal of Electron Microscopy Technique. 18(2). 148–156. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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