Cheryl Hartfield
- Biomedical Engineering
- Electrical and Electronic Engineering
- Materials Chemistry
- Surfaces, Coatings and Films top 10%
- Computational Mechanics
- Co-authors
- David R. DiercksEric A. StachNorman SalmonBrian P. GormanMichael W. FayChristopher ParmenterPhilippe H. GeubelleNancy R. Sottos
- Topics
- Integrated Circuits and Semiconductor Failure Analysis (17 papers)Electron and X-Ray Spectroscopy Techniques (11 papers)Advanced Electron Microscopy Techniques and Applications (8 papers)
- Journals
- Thin Solid FilmsJournal of Vacuum Science & Technology A Vacuum Surfaces and FilmsMicroscopy Research and Technique
- Partner nations
- United StatesGermanyUnited Kingdom
In The Last Decade
Cheryl Hartfield
26 papers receiving 294 citations
Peers
Comparison fields: 5 of 57
- Biomedical Engineering 136
- Electrical and Electronic Engineering 130
- Materials Chemistry 81
- Surfaces, Coatings and Films 55
- Computational Mechanics 53
Countries citing papers authored by Cheryl Hartfield
This map shows the geographic impact of Cheryl Hartfield's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Cheryl Hartfield with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Cheryl Hartfield more than expected).
Fields of papers citing papers by Cheryl Hartfield
This network shows the impact of papers produced by Cheryl Hartfield. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Cheryl Hartfield. The network helps show where Cheryl Hartfield may publish in the future.
Co-authorship network of co-authors of Cheryl Hartfield
This figure shows the co-authorship network connecting the top 25 collaborators of Cheryl Hartfield. A scholar is included among the top collaborators of Cheryl Hartfield based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Cheryl Hartfield. Cheryl Hartfield is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 2 | |
| 3 | 1 | |
| 4 | 2 | |
| 5 | 22 | |
| 6 | 3 | |
| 7 | 6 | |
| 8 | 2 | |
| 9 | 20 | |
| 10 | 1 | |
| 11 | 7 | |
| 12 | 3 | |
| 13 | 70 | |
| 14 | 38 | |
| 15 | 5 | |
| 16 | 2 | |
| 17 | 33 | |
| 18 | 4 | |
| 19 | 5 | |
| 20 | 4 |
About Cheryl Hartfield
Cheryl Hartfield is a scholar working on Structural Biology, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 30 papers that have together received 304 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (17 papers), Electron and X-Ray Spectroscopy Techniques (11 papers) and Advanced Electron Microscopy Techniques and Applications (8 papers). The work is most often cited by research in Structural Biology (46 citations), Surfaces, Coatings and Films (55 citations) and Metals and Alloys (19 citations). Cheryl Hartfield has collaborated with scholars based in United States, Germany and United Kingdom. Frequent co-authors include David R. Diercks, Eric A. Stach, Norman Salmon, Brian P. Gorman, Michael W. Fay, Christopher Parmenter, Philippe H. Geubelle, Nancy R. Sottos, Hoda M. Eltaher and Stephen T. Kelly. Their work appears in journals such as Thin Solid Films, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Microscopy Research and Technique.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.