Allen Gu

586 total citations
30 papers, 459 citations indexed

About

Allen Gu is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering. According to data from OpenAlex, Allen Gu has authored 30 papers receiving a total of 459 indexed citations (citations by other indexed papers that have themselves been cited), including 21 papers in Electrical and Electronic Engineering, 15 papers in Surfaces, Coatings and Films and 5 papers in Biomedical Engineering. Recurrent topics in Allen Gu's work include Integrated Circuits and Semiconductor Failure Analysis (18 papers), Advancements in Photolithography Techniques (15 papers) and Electron and X-Ray Spectroscopy Techniques (15 papers). Allen Gu is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (18 papers), Advancements in Photolithography Techniques (15 papers) and Electron and X-Ray Spectroscopy Techniques (15 papers). Allen Gu collaborates with scholars based in United States, Germany and United Kingdom. Allen Gu's co-authors include Jeff Gelb, Bin Bai, Songtao Wu, Wenjing Yang, Ling Su, Rukai Zhu, Xiangxiang Zhang, Stephen J. Harris, Robert S. Bradley and Peter Lee and has published in prestigious journals such as Advanced Energy Materials, Journal of Biomechanics and Alzheimer s Research & Therapy.

In The Last Decade

Allen Gu

28 papers receiving 452 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Allen Gu United States 8 186 145 139 129 64 30 459
Erika Tudisco Sweden 16 249 1.3× 124 0.9× 110 0.8× 116 0.9× 83 1.3× 37 678
Moshe Eliyahu Israel 5 340 1.8× 40 0.3× 186 1.3× 184 1.4× 8 0.1× 5 504
Zohaib Atiq Khan Canada 6 93 0.5× 120 0.8× 80 0.6× 128 1.0× 40 0.6× 9 404
Haifeng Liang China 19 325 1.7× 364 2.5× 89 0.6× 101 0.8× 32 0.5× 70 1.1k
Wenbo Wang China 15 217 1.2× 64 0.4× 298 2.1× 18 0.1× 16 0.3× 37 714
Daniel Vavřı́k Czechia 15 137 0.7× 42 0.3× 126 0.9× 37 0.3× 18 0.3× 59 612
Eva Héripré France 17 526 2.8× 27 0.2× 417 3.0× 117 0.9× 26 0.4× 49 1.0k
Yanwei Liu China 14 218 1.2× 26 0.2× 225 1.6× 80 0.6× 6 0.1× 56 523
J. Neuenschwander Switzerland 11 92 0.5× 188 1.3× 141 1.0× 30 0.2× 9 0.1× 24 407
Chin Y. Poon United States 8 312 1.7× 49 0.3× 316 2.3× 29 0.2× 15 0.2× 9 612

Countries citing papers authored by Allen Gu

Since Specialization
Citations

This map shows the geographic impact of Allen Gu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Allen Gu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Allen Gu more than expected).

Fields of papers citing papers by Allen Gu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Allen Gu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Allen Gu. The network helps show where Allen Gu may publish in the future.

Co-authorship network of co-authors of Allen Gu

This figure shows the co-authorship network connecting the top 25 collaborators of Allen Gu. A scholar is included among the top collaborators of Allen Gu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Allen Gu. Allen Gu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Liu, Cheng‐Hsin, et al.. (2024). A Correlative Microscopic Workflow Powered by Artificial Intelligence to Accelerate Failure Analysis of Next-Generation Semiconductor Packages. Proceedings - International Symposium for Testing and Failure Analysis. 84918. 312–316.
2.
Li, Susan, et al.. (2024). Detecting Wafer-Level Cu Pillar Defects using Advanced 3D X-ray Microscopy (XRM) with Submicron Resolution. Journal of Failure Analysis and Prevention. 24(5). 2232–2239.
3.
Villarraga-Gómez, Herminso, et al.. (2023). Workflows for assessing electronic devices with 3D X-ray microscopy and nanoscale computed tomography. e-Journal of Nondestructive Testing. 28(3). 2 indexed citations
4.
Gu, Allen, Andrew Lonsdale, Lauren M. Brown, et al.. (2023). TALLSorts: a T-cell acute lymphoblastic leukemia subtype classifier using RNA-seq expression data. Blood Advances. 7(24). 7402–7406. 3 indexed citations
5.
Li, Susan, et al.. (2023). Detecting Wafer Level Cu Pillar Defects Using Advanced 3D X-ray Microscopy (XRM) with Submicron Resolution. Proceedings - International Symposium for Testing and Failure Analysis. 84741. 432–435. 1 indexed citations
6.
7.
Yang, Yanjing, et al.. (2023). An Artificial Intelligence Powered Resolution Recovery Technique and Workflow to Accelerate Package Level Failure Analysis with 3D X-ray Microscopy. Proceedings - International Symposium for Testing and Failure Analysis. 3 indexed citations
8.
Hartfield, Cheryl, et al.. (2022). Emerging Technologies for Advanced 3D Package Characterization to Enable the More-Than-Moore Era. ECS Transactions. 109(2). 15–29. 2 indexed citations
9.
Hartfield, Cheryl, et al.. (2022). Emerging Technologies for Advanced 3D Package Characterization to Enable the More-Than-Moore Era. ECS Meeting Abstracts. MA2022-02(17). 855–855. 1 indexed citations
10.
11.
Andrew, Matthew, et al.. (2022). Fully automated deep learning-based resolution recovery. 20–20. 4 indexed citations
12.
Harris, W. C., Allen Gu, & Masako Terada. (2022). Putting AI to Work: A Practical and Simple Application to Improve 3D X-ray FA. 2 indexed citations
13.
Andrew, Matthew, Andriy Andreyev, Lars Omlor, et al.. (2022). Fully automated deep-learning-based resolution recovery. 117–117. 2 indexed citations
14.
15.
Hartfield, Cheryl, Christian Schmidt, Allen Gu, & Stephen T. Kelly. (2018). From PCB to BEOL: 3D X-Ray Microscopy for Advanced Semiconductor Packaging. 1–7. 20 indexed citations
16.
Wang, Teng, et al.. (2016). Application of 3D X-Ray Microscopy for 3D IC Process Development. 13(1). 2 indexed citations
17.
Chu, C. H., et al.. (2016). High resolution 3D X-ray microscopy for streamlined failure analysis workflow. 216–219. 9 indexed citations
18.
Du, Jing, et al.. (2015). Biomechanics and strain mapping in bone as related to immediately-loaded dental implants. Journal of Biomechanics. 48(12). 3486–3494. 41 indexed citations
19.
Bai, Bin, Rukai Zhu, Songtao Wu, et al.. (2013). Multi-scale method of Nano(Micro)-CT study on microscopic pore structure of tight sandstone of Yanchang Formation, Ordos Basin. Petroleum Exploration and Development. 40(3). 354–358. 193 indexed citations
20.
Li, Bin, et al.. (2011). Stem cell factor and granulocyte colony-stimulating factor reduce β-amyloid deposits in the brains of APP/PS1 transgenic mice. Alzheimer s Research & Therapy. 3(2). 8–8. 21 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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