Thomas M. Moore

1.8k total citations · 1 hit paper
43 papers, 1.3k citations indexed

About

Thomas M. Moore is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Structural Biology. According to data from OpenAlex, Thomas M. Moore has authored 43 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Electrical and Electronic Engineering, 9 papers in Materials Chemistry and 8 papers in Structural Biology. Recurrent topics in Thomas M. Moore's work include Integrated Circuits and Semiconductor Failure Analysis (11 papers), Advanced Electron Microscopy Techniques and Applications (8 papers) and Electron and X-Ray Spectroscopy Techniques (8 papers). Thomas M. Moore is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (11 papers), Advanced Electron Microscopy Techniques and Applications (8 papers) and Electron and X-Ray Spectroscopy Techniques (8 papers). Thomas M. Moore collaborates with scholars based in United States. Thomas M. Moore's co-authors include R. J. Matyi, John N. Randall, Mark A. Reed, Rahul Aggarwal, A. E. Wetsel, Jess E. Jones, Guangyao Gao, Joshua V. Ruppel, X. Peter Zhang and A. E. Taylor and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Chemical Communications.

In The Last Decade

Thomas M. Moore

39 papers receiving 1.2k citations

Hit Papers

Observation of discrete electronic states in a zero-dimen... 1988 2026 2000 2013 1988 200 400 600
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Observation of discrete electronic states in a zero-dimensional semiconductor nanostructure
    1988 749 citations Mark A. Reed, John N. Randall et al. Physical Review Letters profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Thomas M. Moore United States 14 673 563 332 153 101 43 1.3k
David J. Michalak United States 22 617 0.9× 904 1.6× 593 1.8× 277 1.8× 40 0.4× 50 1.5k
Pascal Pochet France 25 571 0.8× 803 1.4× 1.3k 4.1× 209 1.4× 122 1.2× 84 1.9k
C.M.C. de Castilho Brazil 19 363 0.5× 373 0.7× 1.1k 3.2× 178 1.2× 55 0.5× 71 1.4k
Tomoya Ono Japan 18 637 0.9× 734 1.3× 535 1.6× 108 0.7× 76 0.8× 100 1.2k
K. Cho United States 12 472 0.7× 1.2k 2.1× 635 1.9× 63 0.4× 27 0.3× 17 1.8k
Guy Jacob France 20 443 0.7× 553 1.0× 620 1.9× 94 0.6× 174 1.7× 61 1.4k
Thomas Gruhn Germany 21 223 0.3× 229 0.4× 1.0k 3.0× 168 1.1× 104 1.0× 56 1.4k
Martin Švec Czechia 22 759 1.1× 686 1.2× 925 2.8× 384 2.5× 134 1.3× 76 1.6k
Takayoshi Tanji Japan 18 296 0.4× 253 0.4× 482 1.5× 127 0.8× 175 1.7× 99 1.2k
B. S. Wherrett United Kingdom 14 609 0.9× 513 0.9× 346 1.0× 218 1.4× 30 0.3× 45 1.1k

Countries citing papers authored by Thomas M. Moore

Since Specialization
Citations

This map shows the geographic impact of Thomas M. Moore's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas M. Moore with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas M. Moore more than expected).

Fields of papers citing papers by Thomas M. Moore

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Thomas M. Moore. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas M. Moore. The network helps show where Thomas M. Moore may publish in the future.

Co-authorship network of co-authors of Thomas M. Moore

This figure shows the co-authorship network connecting the top 25 collaborators of Thomas M. Moore. A scholar is included among the top collaborators of Thomas M. Moore based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Thomas M. Moore. Thomas M. Moore is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Dyck, Ondrej, Kai Xiao, Benjamin Wolf, et al.. (2025). A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy. Advanced Materials Technologies. 10(5). 1 indexed citations
2.
Dyck, Ondrej, Kai Xiao, Benjamin Wolf, et al.. (2025). A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy (Adv. Mater. Technol. 5/2025). Advanced Materials Technologies. 10(5). 1 indexed citations
3.
Wu, Yueying, Chenze Liu, Thomas M. Moore, et al.. (2018). Exploring Photothermal Pathways via in Situ Laser Heating in the Transmission Electron Microscope: Recrystallization, Grain Growth, Phase Separation, and Dewetting in Ag0.5Ni0.5 Thin Films. Microscopy and Microanalysis. 24(6). 647–656. 22 indexed citations
4.
Stanford, Michael G., Kyle Mahady, Brett B. Lewis, et al.. (2016). Laser-Assisted Focused He+ Ion Beam Induced Etching with and without XeF2 Gas Assist. ACS Applied Materials & Interfaces. 8(42). 29155–29162. 31 indexed citations
5.
Moore, Thomas M., et al.. (2016). GOTHIC 8.1 Benchmark to ThAI Facility Experiment with Steam-Helium Stratification. Nuclear Technology. 196(2). 260–269. 2 indexed citations
6.
Moore, Thomas M., et al.. (2012). A rapid microfluidic synthesis of [18F]fluoroarenes from nitroarenes. Applied Radiation and Isotopes. 71(1). 47–50. 4 indexed citations
7.
King, Judy, Smriti Agarwal, Nutan Prasain, et al.. (2008). Quantum Dots - Utilization in TEM. Microscopy and Microanalysis. 14(S2). 702–703. 2 indexed citations
8.
Moore, Thomas M., et al.. (2005). Mechanical Conversion for High-Throughput TEM Sample Preparation. Microscopy and Microanalysis. 11(S02). 1 indexed citations
9.
Hartfield, Cheryl, et al.. (2003). Mechanical and Electrical Characterization of an IC Bond Pad Stack Using a Novel In-Situ Methodology. Proceedings - International Symposium for Testing and Failure Analysis. 30866. 486–495. 4 indexed citations
10.
Lewis, Warren, et al.. (2002). Designing high-power components for optical telecommunications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4679. 198–198. 10 indexed citations
11.
12.
Taylor, A. E. & Thomas M. Moore. (1999). Capillary fluid exchange.. AJP Advances in Physiology Education. 277(6). S203–S203. 35 indexed citations
13.
Pecht, Michael, et al.. (1999). New findings in the occurrence of false-healing in plastic encapsulated microcircuits using scanning acoustic microscopy. IEEE Transactions on Components and Packaging Technologies. 22(2). 266–269. 5 indexed citations
14.
Moore, Thomas M., et al.. (1994). Failure Criteria for Inspection Using Acoustic Microscopy After Moisture Sensitivity Testing of Plastic Surface Mount Devices.. 1994. 229–239. 2 indexed citations
15.
Moore, Thomas M.. (1992). C-mode acoustic microscopy applied to integrated circuit package inspection. Solid-State Electronics. 35(3). 411–421. 12 indexed citations
16.
Shih, H. D., K. Bradshaw, H.Q. Tserng, et al.. (1989). Millimeter‐wave in0.17Ga0.83as power mesfets on GaAs(100) substrates. Microwave and Optical Technology Letters. 2(5). 153–155. 3 indexed citations
17.
Randall, John N., et al.. (1988). Microstructure fabrication and transport through quantum dots. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 6(1). 302–305. 22 indexed citations
18.
Reed, Mark A., John N. Randall, Rahul Aggarwal, et al.. (1988). Observation of discrete electronic states in a zero-dimensional semiconductor nanostructure. Physical Review Letters. 60(6). 535–537. 749 indexed citations breakdown →
19.
Moore, Thomas M., et al.. (1986). Microstructural Characterization of GaAs Substrates. MRS Proceedings. 69.
20.
Moore, Thomas M.. (1983). Electron microprobe techniques for routine compositional analysis of (Hg,Cd)Te. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 1(3). 1651–1655. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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