Chenming Hu

520 total citations
19 papers, 381 citations indexed

About

Chenming Hu is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, Chenming Hu has authored 19 papers receiving a total of 381 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 3 papers in Biomedical Engineering and 3 papers in Materials Chemistry. Recurrent topics in Chenming Hu's work include Semiconductor materials and devices (16 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). Chenming Hu is often cited by papers focused on Semiconductor materials and devices (16 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). Chenming Hu collaborates with scholars based in United States, Switzerland and Italy. Chenming Hu's co-authors include K.F. Schuegraf, C. Wann, Bin Yu, K. Noda, J.C. King, Elyse Rosenbaum, Michael D. Bartlett, Dong Hae Ho, Ling Li and D. Sinitsky and has published in prestigious journals such as Proceedings of the National Academy of Sciences, IEEE Transactions on Electron Devices and Nature Electronics.

In The Last Decade

Chenming Hu

16 papers receiving 359 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Chenming Hu United States	9	344	44	44	21	11	19	381
Gianpietro Carnevale Italy	7	157 0.5×	55 1.3×	28 0.6×	42 2.0×	11 1.0×	16	187
S. Inaba Japan	14	512 1.5×	57 1.3×	34 0.8×	56 2.7×	22 2.0×	54	533
Y. Kamigaki Japan	9	355 1.0×	27 0.6×	95 2.2×	32 1.5×	15 1.4×	18	370
V. Lapras France	11	319 0.9×	88 2.0×	26 0.6×	35 1.7×	9 0.8×	20	353
X. Li Singapore	10	399 1.2×	32 0.7×	47 1.1×	18 0.9×	16 1.5×	19	411
Zixuan Sun China	12	325 0.9×	23 0.5×	55 1.3×	18 0.9×	21 1.9×	50	362
Jenn-Gang Chern United States	7	420 1.2×	66 1.5×	30 0.7×	45 2.1×	23 2.1×	13	436
C. Papadas France	14	480 1.4×	38 0.9×	129 2.9×	41 2.0×	10 0.9×	60	508
M. Cho Belgium	12	446 1.3×	19 0.4×	50 1.1×	28 1.3×	9 0.8×	24	457
P. O’Neil United States	6	249 0.7×	25 0.6×	74 1.7×	59 2.8×	15 1.4×	14	268

Countries citing papers authored by Chenming Hu

Since Specialization

Citations

This map shows the geographic impact of Chenming Hu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chenming Hu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chenming Hu more than expected).

Fields of papers citing papers by Chenming Hu

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Chenming Hu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chenming Hu. The network helps show where Chenming Hu may publish in the future.

Co-authorship network of co-authors of Chenming Hu

This figure shows the co-authorship network connecting the top 25 collaborators of Chenming Hu. A scholar is included among the top collaborators of Chenming Hu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Chenming Hu. Chenming Hu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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19 of 19 papers shown

Hu, Chenming, Ravi Tutika, Zhifei Deng, et al.. (2025). Mineralized sclerites in the gorgonian coral Leptogorgia chilensis as a natural jamming system. Proceedings of the National Academy of Sciences. 122(44). e2504541122–e2504541122.

Xia, Yier, et al.. (2025). Metallization Filling and Electrical Performance of High-Aspect-Ratio Through Silicon Via with Electroless Deposited Co Liner. ECS Journal of Solid State Science and Technology. 14(5). 54003–54003.

Ho, Dong Hae, Chenming Hu, Ling Li, & Michael D. Bartlett. (2024). Soft electronic vias and interconnects through rapid three-dimensional assembly of liquid metal microdroplets. Nature Electronics. 7(11). 1015–1024. 21 indexed citations

Lin, Cheng‐Ming, et al.. (2013). EUV degradation of high performance Ge MOSFETs. 31. 1–2. 1 indexed citations

Hu, Chenming, et al.. (2008). Air spacer MOSFET technology for 20nm node and beyond. 53–56. 10 indexed citations

Hu, Chenming. (2002). Low-voltage CMOS device scaling. 86–87. 19 indexed citations

Wan, Hui, Fung, Pin Su, Mansun Chan, & Chenming Hu. (2002). Tendency for full depletion due to gate tunneling current. 140–142. 5 indexed citations

Assaderaghi, F., P.K. Ko, & Chenming Hu. (2002). Room temperature observation of velocity overshoot in silicon inversion layers. 116–117.

Wann, C. & Chenming Hu. (2002). High endurance ultra-thin tunnel oxide for dynamic memory application. 867–870. 6 indexed citations

10.

Hu, Chenming. (2002). SOI and nanoscale MOSFETs. 3–4. 10 indexed citations

11.

Jiang, C.-S., Dipankar Pramanik, & Chenming Hu. (2002). Hot carrier reliability considerations for low Vdd CMOS technology. 322–324. 2 indexed citations

12.

Hu, Chenming. (2001). BSIM model for circuit design using advanced technologies. 5–10. 14 indexed citations

13.

Polishchuk, I., et al.. (2001). Intrinsic reliability projections for a thin JVD silicon nitride gate dielectric in P-MOSFET. IEEE Transactions on Device and Materials Reliability. 1(1). 4–8. 5 indexed citations

14.

Yu, Bin, et al.. (1997). Short-channel effect improved by lateral channel-engineering in deep-submicronmeter MOSFET's. IEEE Transactions on Electron Devices. 44(4). 627–634. 138 indexed citations

15.

Assaderaghi, F., et al.. (1997). High-field transport of inversion-layer electrons and holes including velocity overshoot. IEEE Transactions on Electron Devices. 44(4). 664–671. 25 indexed citations

16.

Tu, R., J.C. King, Hyungcheol Shin, & Chenming Hu. (1997). Simulating process-induced gate oxide damage in circuits. IEEE Transactions on Electron Devices. 44(9). 1393–1400. 8 indexed citations

17.

Rosenbaum, Elyse, J.C. King, & Chenming Hu. (1996). Accelerated testing of SiO/sub 2/ reliability. IEEE Transactions on Electron Devices. 43(1). 70–80. 52 indexed citations

18.

Schuegraf, K.F. & Chenming Hu. (1994). Effects of temperature and defects on breakdown lifetime of thin SiO/sub 2/ at very low voltages. IEEE Transactions on Electron Devices. 41(7). 1227–1232. 63 indexed citations

19.

Yu, Bin, H.-J. Wann, F. Assaderaghi, et al.. (1994). Interface characterization of fully-depleted SOI MOSFET by a subthreshold I-V method. 63–64. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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