C.‐D. Lien
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- Semiconductor materials and interfaces 17
- Surface and Thin Film Phenomena 4
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- Silicon and Solar Cell Technologies 10
- Integrated Circuits and Semiconductor Failure Analysis 3
- Semiconductor materials and devices 2
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- Intermetallics and Advanced Alloy Properties 9
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- Ion-surface interactions and analysis 3
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- Advanced Materials Characterization Techniques 3
- Cited by
- Atomic and Molecular Physics, and OpticsElectrical and Electronic EngineeringMechanical Engineering
- Journals
- Journal of Applied Physics (5 papers)Thin Solid Films (3 papers)Applied Physics A (3 papers)
- Partner nations
- United States
In The Last Decade
C.‐D. Lien
20 papers receiving 537 citations
Peers
Comparison fields: 5 of 26
- Atomic and Molecular Physics, and Optics 485
- Electrical and Electronic Engineering 390
- Mechanical Engineering 150
- Materials Chemistry 135
- Electronic, Optical and Magnetic Materials 45
Countries citing papers authored by C.‐D. Lien
This map shows the geographic impact of C.‐D. Lien's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.‐D. Lien with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.‐D. Lien more than expected).
Fields of papers citing papers by C.‐D. Lien
This network shows the impact of papers produced by C.‐D. Lien. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.‐D. Lien. The network helps show where C.‐D. Lien may publish in the future.
Co-authorship network
The 16 scholars most cited alongside C.‐D. Lien, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1986 | 56 | |
| 2 | 1986 | 7 | |
| 3 | 1986 | 2 | |
| 4 | 1985 | 8 | |
| 5 | 1985 | 11 | |
| 6 | 1985 | 39 | |
| 7 | 1985 | 19 | |
| 8 | 1985 | 12 | |
| 9 | 1985 | 5 | |
| 10 | 1984 | 118 | |
| 11 | 1984 | 43 | |
| 12 | 1984 | 52 | |
| 13 | 1984 | 3 | |
| 14 | 1984 | 3 | |
| 15 | 1984 | 74 | |
| 16 | 1984 | 42 | |
| 17 | 1983 | 24 | |
| 18 | 1983 | 2 | |
| 19 | 1982 | 17 | |
| 20 | 1982 | 31 |
About C.‐D. Lien
C.‐D. Lien is a scholar working on Atomic and Molecular Physics, and Optics, Mechanical Engineering, Electrical and Electronic Engineering, Condensed Matter Physics and Computational Mechanics, having authored 20 papers that have together received 568 indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (17 papers), Silicon and Solar Cell Technologies (10 papers), Intermetallics and Advanced Alloy Properties (9 papers), Surface and Thin Film Phenomena (4 papers), Ion-surface interactions and analysis (3 papers), Advanced Materials Characterization Techniques (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Semiconductor materials and devices (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (485 citations), Electrical and Electronic Engineering (390 citations), Mechanical Engineering (150 citations), Materials Chemistry (135 citations) and Electronic, Optical and Magnetic Materials (45 citations). C.‐D. Lien has collaborated with scholars based in United States. Frequent co-authors include M.−A. Nicolet, M‐A. Nicolet, S. S. Lau, F. C. T. So, S.S. Lau, L.S. Wieluński, M. Finetti, C. S. Pai, M-A. Nicolet and Katherine M. Stika. Their work appears in journals such as Journal of Applied Physics, Thin Solid Films, Applied Physics A, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Journal of Electronic Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.