Robert G. Long

674 total citations
17 papers, 560 citations indexed

About

Robert G. Long is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Computational Mechanics. According to data from OpenAlex, Robert G. Long has authored 17 papers receiving a total of 560 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Atomic and Molecular Physics, and Optics, 8 papers in Electrical and Electronic Engineering and 3 papers in Computational Mechanics. Recurrent topics in Robert G. Long's work include Semiconductor materials and interfaces (12 papers), Surface and Thin Film Phenomena (8 papers) and Semiconductor materials and devices (4 papers). Robert G. Long is often cited by papers focused on Semiconductor materials and interfaces (12 papers), Surface and Thin Film Phenomena (8 papers) and Semiconductor materials and devices (4 papers). Robert G. Long collaborates with scholars based in United States, Israel and France. Robert G. Long's co-authors include John E. Mahan, K.M. Geib, G. Y. Robinson, Gang Bai, M. Nathan, Marc‐A. Nicolet, C. W. Wilmsen, James Becker, Isabelle Berbézier and J. Derrien and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

Robert G. Long

17 papers receiving 541 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Robert G. Long United States 10 476 342 118 78 49 17 560
K. E. Strege United States 11 343 0.7× 358 1.0× 116 1.0× 42 0.5× 50 1.0× 18 508
M. Kusaka Japan 12 367 0.8× 375 1.1× 137 1.2× 76 1.0× 89 1.8× 84 602
J. Henz Switzerland 15 535 1.1× 316 0.9× 78 0.7× 48 0.6× 136 2.8× 23 596
A. Appelbaum United States 13 309 0.6× 301 0.9× 102 0.9× 81 1.0× 84 1.7× 37 517
A. H. Reader Netherlands 13 390 0.8× 383 1.1× 197 1.7× 120 1.5× 73 1.5× 32 594
M. Ospelt Switzerland 15 437 0.9× 334 1.0× 125 1.1× 22 0.3× 89 1.8× 24 545
W. Hammer United States 10 483 1.0× 335 1.0× 121 1.0× 201 2.6× 53 1.1× 13 575
R.M. Ware United Kingdom 11 275 0.6× 252 0.7× 138 1.2× 50 0.6× 21 0.4× 19 399
D.L. Barrett United States 14 194 0.4× 548 1.6× 126 1.1× 64 0.8× 30 0.6× 34 632
C.‐D. Lien United States 12 485 1.0× 390 1.1× 135 1.1× 150 1.9× 63 1.3× 20 568

Countries citing papers authored by Robert G. Long

Since Specialization
Citations

This map shows the geographic impact of Robert G. Long's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Robert G. Long with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Robert G. Long more than expected).

Fields of papers citing papers by Robert G. Long

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Robert G. Long. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Robert G. Long. The network helps show where Robert G. Long may publish in the future.

Co-authorship network of co-authors of Robert G. Long

This figure shows the co-authorship network connecting the top 25 collaborators of Robert G. Long. A scholar is included among the top collaborators of Robert G. Long based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Robert G. Long. Robert G. Long is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

17 of 17 papers shown
1.
Becker, James, John E. Mahan, & Robert G. Long. (1995). ReSi2 thin-film infrared detectors. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 13(3). 1133–1135. 17 indexed citations
2.
Long, Robert G., James Becker, & John E. Mahan. (1995). Infrared detection with a ReSi2 thin film photoresistor. Applied Physics Letters. 66(7). 875–876. 4 indexed citations
3.
Long, Robert G., James Becker, John E. Mahan, A. Vantomme, & Marc‐A. Nicolet. (1995). Heteroepitaxial relationships for CrSi2 thin films on Si(111). Journal of Applied Physics. 77(7). 3088–3094. 4 indexed citations
4.
Becker, James, Robert G. Long, & John E. Mahan. (1994). Reflection high-energy electron diffraction patterns of carbide-contaminated silicon surfaces. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 12(1). 174–178. 16 indexed citations
5.
Vantomme, A., Marc‐A. Nicolet, Robert G. Long, & John E. Mahan. (1994). Epitaxial ternary RexMo1−xSi2 thin films on Si(100). Journal of Applied Physics. 75(8). 3924–3927. 1 indexed citations
6.
Long, Robert G., et al.. (1993). The Template Technique Applied to Epitaxial Growth of CrSi2 on Silicon (111). MRS Proceedings. 317. 2 indexed citations
7.
Vantomme, A., et al.. (1993). Reactive deposition epitaxy of CrSi2. Applied Surface Science. 73. 146–152. 16 indexed citations
8.
Mahan, John E., V. Le Thanh, Joël Chevrier, et al.. (1993). Surface electron-diffraction patterns of β-FeSi2 films epitaxially grown on silicon. Journal of Applied Physics. 74(3). 1747–1761. 70 indexed citations
9.
Mahan, John E., Gang Bai, M‐A. Nicolet, Robert G. Long, & K.M. Geib. (1992). Microstructure and morphology of some epitaxial ReSi2 films on (001) silicon. Thin Solid Films. 207(1-2). 223–230. 6 indexed citations
10.
Geib, K.M., John E. Mahan, Robert G. Long, M. Nathan, & Gang Bai. (1991). Epitaxial orientation and morphology of β-FeSi2 on (001) silicon. Journal of Applied Physics. 70(3). 1730–1736. 63 indexed citations
11.
Mahan, John E., K.M. Geib, G. Y. Robinson, & Robert G. Long. (1990). A review of the geometrical fundamentals of reflection high-energy electron diffraction with application to silicon surfaces. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8(5). 3692–3700. 78 indexed citations
12.
Mahan, John E., K.M. Geib, G. Y. Robinson, et al.. (1990). Epitaxial tendencies of ReSi2 on (001) silicon. Applied Physics Letters. 56(24). 2439–2441. 16 indexed citations
13.
Geib, K.M., et al.. (1990). Reaction between SiC and W, Mo, and Ta at elevated temperatures. Journal of Applied Physics. 68(6). 2796–2800. 72 indexed citations
14.
Mahan, John E., K.M. Geib, G. Y. Robinson, et al.. (1990). Epitaxial films of semiconducting FeSi2 on (001) silicon. Applied Physics Letters. 56(21). 2126–2128. 154 indexed citations
15.
Long, Robert G. & John E. Mahan. (1990). Two pseudobinary semiconducting silicides: RexMo1−xSi2 and CrxV1−xSi2. Applied Physics Letters. 56(17). 1655–1657. 8 indexed citations
16.
Long, Robert G., M. Bost, & John E. Mahan. (1988). Optical and electrical properties of semiconducting rhenium disilicide thin films. Thin Solid Films. 162. 29–40. 28 indexed citations
17.
Long, Robert G., M. Bost, & John E. Mahan. (1988). Metallic behavior of lanthanum disilicide. Applied Physics Letters. 53(14). 1272–1273. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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