C. Ciofi
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Electrostatic Discharge in Electronics
- Advanced Electrical Measurement Techniques
- Bioengineering top 5%
Papers in
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- Semiconductor materials and devices 53
- Advancements in Semiconductor Devices and Circuit Design 41
- Integrated Circuits and Semiconductor Failure Analysis 25
- Electrostatic Discharge in Electronics 18
- Advanced Electrical Measurement Techniques 17
- Electronic Packaging and Soldering Technologies 14
-
- Analog and Mixed-Signal Circuit Design 40
- Co-authors
- Graziella Scandurra (89 shared papers)Gino Giusi (49 shared papers)Bruno Neri (30 shared papers)Felice Crupi (21 shared papers)C. Nick Pace (16 shared papers)V. Dattilo (9 shared papers)G. Saitta (5 shared papers)A. Arena (11 shared papers)
- Journals
- IEEE Transactions on Instrumentation and Measurement (15 papers)Review of Scientific Instruments (9 papers)Microelectronics Reliability (9 papers)Electronics (7 papers)Sensors (7 papers)
- Partner nations
- ItalyPolandUnited States
In The Last Decade
C. Ciofi
142 papers receiving 1.3k citations
Peers
Comparison fields: 5 of 81
- Electrical and Electronic Engineering 1.1k
- Bioengineering 85
- Electrochemistry 67
- Biomedical Engineering 454
- Polymers and Plastics 110
Countries citing papers authored by C. Ciofi
This map shows the geographic impact of C. Ciofi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Ciofi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Ciofi more than expected).
Fields of papers citing papers by C. Ciofi
This network shows the impact of papers produced by C. Ciofi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Ciofi. The network helps show where C. Ciofi may publish in the future.
Co-authors
The 25 scholars most cited alongside C. Ciofi, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 148 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2000 | 66 | |
| 2 | 2015 | 61 | |
| 3 | 2006 | 48 | |
| 4 | 2009 | 44 | |
| 5 | 2014 | 39 | |
| 6 | 2003 | 36 | |
| 7 | 2004 | 34 | |
| 8 | 1997 | 33 | |
| 9 | 2013 | 32 | |
| 10 | 2018 | 31 | |
| 11 | 1997 | 28 | |
| 12 | 2002 | 26 | |
| 13 | 2023 | 25 | |
| 14 | 1998 | 25 | |
| 15 | 2006 | 24 | |
| 16 | 2014 | 24 | |
| 17 | 2011 | 24 | |
| 18 | 1997 | 24 | |
| 19 | 1998 | 23 | |
| 20 | 2006 | 23 |
About C. Ciofi
C. Ciofi is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics and Polymers and Plastics, having authored 148 papers that have together received 1.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (53 papers), Advancements in Semiconductor Devices and Circuit Design (41 papers), Analog and Mixed-Signal Circuit Design (40 papers), Integrated Circuits and Semiconductor Failure Analysis (25 papers), Copper Interconnects and Reliability (23 papers), Electrostatic Discharge in Electronics (18 papers), Advanced Electrical Measurement Techniques (17 papers) and Electronic Packaging and Soldering Technologies (14 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.1k citations), Bioengineering (85 citations), Electrochemistry (67 citations), Biomedical Engineering (454 citations) and Polymers and Plastics (110 citations). C. Ciofi has collaborated with scholars based in Italy, Poland and United States. Frequent co-authors include Graziella Scandurra, Gino Giusi, Bruno Neri, Felice Crupi, C. Nick Pace, V. Dattilo, G. Saitta, A. Arena, G. Groeseneken and Marco De Marinis. Their work appears in journals such as IEEE Transactions on Instrumentation and Measurement, Review of Scientific Instruments, Microelectronics Reliability, Electronics and Sensors.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.