V. Dattilo

86.2k total citations
15 papers, 93 citations indexed

About

V. Dattilo is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Astronomy and Astrophysics. According to data from OpenAlex, V. Dattilo has authored 15 papers receiving a total of 93 indexed citations (citations by other indexed papers that have themselves been cited), including 10 papers in Electrical and Electronic Engineering, 7 papers in Electronic, Optical and Magnetic Materials and 5 papers in Astronomy and Astrophysics. Recurrent topics in V. Dattilo's work include Copper Interconnects and Reliability (7 papers), Electronic Packaging and Soldering Technologies (7 papers) and Semiconductor materials and devices (6 papers). V. Dattilo is often cited by papers focused on Copper Interconnects and Reliability (7 papers), Electronic Packaging and Soldering Technologies (7 papers) and Semiconductor materials and devices (6 papers). V. Dattilo collaborates with scholars based in Italy, Ireland and France. V. Dattilo's co-authors include Bruno Neri, C. Ciofi, R. Giannetti, A. Mathewson, Sean Foley, Paolo Bruschi, A. Diligenti, A. Nannini, A. Porzio and S. Solimeno and has published in prestigious journals such as IEEE Transactions on Electron Devices, Physics Letters A and IEEE Transactions on Instrumentation and Measurement.

In The Last Decade

V. Dattilo

14 papers receiving 85 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
V. Dattilo Italy 5 73 39 31 10 4 15 93
S. Kanakasabapathy United States 5 64 0.9× 20 0.5× 36 1.2× 14 1.4× 2 0.5× 6 85
D. Ney France 7 145 2.0× 84 2.2× 20 0.6× 3 0.3× 3 0.8× 34 156
Shuyang Yang China 11 111 1.5× 85 2.2× 34 1.1× 11 1.1× 1 0.3× 21 259
R. Bolam United States 9 244 3.3× 39 1.0× 12 0.4× 7 0.7× 2 0.5× 30 249
Stanisław Stopiński Poland 6 101 1.4× 7 0.2× 39 1.3× 13 1.3× 2 0.5× 26 116
Chih-Sheng Chang Taiwan 8 241 3.3× 18 0.5× 38 1.2× 32 3.2× 2 0.5× 18 250
M. Inoue Japan 5 69 0.9× 7 0.2× 13 0.4× 9 0.9× 2 0.5× 12 85
H. Katto Japan 10 255 3.5× 16 0.4× 36 1.2× 19 1.9× 4 1.0× 34 262
Emre Alptekin United States 7 149 2.0× 16 0.4× 94 3.0× 12 1.2× 5 1.3× 17 165
Ibrahim Ban United States 7 145 2.0× 11 0.3× 28 0.9× 11 1.1× 4 1.0× 15 152

Countries citing papers authored by V. Dattilo

Since Specialization
Citations

This map shows the geographic impact of V. Dattilo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Dattilo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Dattilo more than expected).

Fields of papers citing papers by V. Dattilo

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Dattilo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Dattilo. The network helps show where V. Dattilo may publish in the future.

Co-authorship network of co-authors of V. Dattilo

This figure shows the co-authorship network connecting the top 25 collaborators of V. Dattilo. A scholar is included among the top collaborators of V. Dattilo based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with V. Dattilo. V. Dattilo is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

15 of 15 papers shown
1.
Boschi, V., et al.. (2023). The seismic isolation system of Advanced Virgo Plus, Phase II. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 1048. 168021–168021.
2.
3.
Virgilio, A. Di, G. Cella, V. Dattilo, et al.. (2006). Considerations on collected data with the Low Frequency Facility experiment. Journal of Physics Conference Series. 32. 346–352. 1 indexed citations
4.
Dattilo, V.. (2003). The VIRGO suspensions: design and recent performance measurements. Physics Letters A. 318(3). 192–198. 3 indexed citations
5.
Dattilo, V.. (2002). THE ANTISEISMIC SUSPENSION FOR THE VIRGO PROJECT. Archivio istituzionale della ricerca (Alma Mater Studiorum Università di Bologna). 704–711. 1 indexed citations
6.
Dattilo, V., et al.. (2002). Ultra low noise current sources. 2. 1486–1489. 4 indexed citations
7.
Dattilo, V., Bruno Neri, & C. Ciofi. (2000). Low frequency noise evolution during lifetime tests of lines and vias subjected to electromigration. Microelectronics Reliability. 40(8-10). 1323–1327. 6 indexed citations
8.
Ciofi, C., V. Dattilo, & Bruno Neri. (1999). Open Questions on Noise in Metal Lines Subjected to High Current Densities. 1. 483–483. 1 indexed citations
9.
Ciofi, C., V. Dattilo, Bruno Neri, Sean Foley, & A. Mathewson. (1999). Long term noise measurements and median time to failure test for the characterization of electromigration in metal lines. Microelectronics Reliability. 39(11). 1691–1696. 7 indexed citations
10.
Ciofi, C., V. Dattilo, Bruno Neri, Sean Foley, & A. Mathewson. (1999). Long term noise measurements to characterize electromigration in metal lines of ICs. 34. 132–135. 3 indexed citations
11.
Ciofi, C., R. Giannetti, V. Dattilo, & Bruno Neri. (1998). Ultra low-noise current sources. IEEE Transactions on Instrumentation and Measurement. 47(1). 78–81. 23 indexed citations
12.
Ciofi, C., V. Dattilo, & Bruno Neri. (1997). Comments on the utilization of noise measurements for the characterization of electromigration in metal lines. Microelectronics Reliability. 37(10-11). 1607–1610. 3 indexed citations
13.
Bruschi, Paolo, C. Ciofi, V. Dattilo, et al.. (1997). Copper metallizations for integrated circuits: tem analysis and electrical characterization. Journal of Electronic Materials. 26(8). L17–L20. 3 indexed citations
14.
Neri, Bruno, C. Ciofi, & V. Dattilo. (1997). Noise and fluctuations in submicrometric Al-Si interconnect lines. IEEE Transactions on Electron Devices. 44(9). 1454–1459. 33 indexed citations
15.
Ciofi, C., V. Dattilo, & Bruno Neri. (1996). Copper interconnection lines: SARF characterization and lifetime test. Microelectronics Reliability. 36(11-12). 1747–1750. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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