C. Bowen

408 total citations
14 papers, 211 citations indexed

About

C. Bowen is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, C. Bowen has authored 14 papers receiving a total of 211 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Electrical and Electronic Engineering, 2 papers in Atomic and Molecular Physics, and Optics and 2 papers in Computational Mechanics. Recurrent topics in C. Bowen's work include Advancements in Semiconductor Devices and Circuit Design (10 papers), Semiconductor materials and devices (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). C. Bowen is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (10 papers), Semiconductor materials and devices (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). C. Bowen collaborates with scholars based in United States. C. Bowen's co-authors include S. Chakravarthi, C. Machala, R. Wise, P.R. Chidambaram, Gerhard Klimeck, Roger K. Lake, Mark E. Law, D. K. Blanks, W. Liu and R. Khamankar and has published in prestigious journals such as IEEE Transactions on Electron Devices and physica status solidi (b).

In The Last Decade

C. Bowen

10 papers receiving 199 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
C. Bowen United States 6 168 60 44 42 14 14 211
P. Gouraud France 5 115 0.7× 29 0.5× 63 1.4× 25 0.6× 11 0.8× 25 148
P. Charvát United States 4 390 2.3× 47 0.8× 93 2.1× 56 1.3× 13 0.9× 5 412
T. Grabolla Germany 10 224 1.3× 63 1.1× 47 1.1× 42 1.0× 7 0.5× 31 263
R. Schreutelkamp Belgium 10 257 1.5× 41 0.7× 51 1.2× 39 0.9× 6 0.4× 31 276
S. Baudot France 8 134 0.8× 30 0.5× 42 1.0× 35 0.8× 7 0.5× 24 160
C. Kerner Belgium 11 347 2.1× 26 0.4× 40 0.9× 63 1.5× 5 0.4× 33 360
A. Naem Canada 9 272 1.6× 62 1.0× 40 0.9× 105 2.5× 7 0.5× 28 311
А. М. Орлов Russia 7 113 0.7× 63 1.1× 21 0.5× 39 0.9× 14 1.0× 49 156
J.D. Hayden United States 9 318 1.9× 35 0.6× 19 0.4× 29 0.7× 17 1.2× 34 326
C. Arvet France 10 223 1.3× 44 0.7× 61 1.4× 23 0.5× 16 1.1× 28 230

Countries citing papers authored by C. Bowen

Since Specialization
Citations

This map shows the geographic impact of C. Bowen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Bowen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Bowen more than expected).

Fields of papers citing papers by C. Bowen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Bowen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Bowen. The network helps show where C. Bowen may publish in the future.

Co-authorship network of co-authors of C. Bowen

This figure shows the co-authorship network connecting the top 25 collaborators of C. Bowen. A scholar is included among the top collaborators of C. Bowen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. Bowen. C. Bowen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

14 of 14 papers shown
1.
Nicollian, Paul E., et al.. (2006). The roles of hydrogen and holes in trap generation and breakdown in ultra-thin SiON dielectrics. 713. 392–395. 14 indexed citations
2.
Chidambaram, P.R., C. Bowen, S. Chakravarthi, C. Machala, & R. Wise. (2006). Fundamentals of silicon material properties for successful exploitation of strain engineering in modern CMOS manufacturing. IEEE Transactions on Electron Devices. 53(5). 944–964. 141 indexed citations
3.
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5.
Bowen, C., et al.. (2003). Consideration of photoresist outgassing for MeV ion implantation and cryopump selection. 1. 614–617. 1 indexed citations
6.
7.
Bowen, C., et al.. (2003). On implant-based multiple gate oxide schemes for system-on-chip integration. IEEE Transactions on Electron Devices. 50(3). 589–600. 8 indexed citations
8.
Chang, Meng‐Chou, et al.. (2002). Analysis of gate tunneling current in ultra-thin oxide MOSFET's. 14–15. 4 indexed citations
9.
Bowen, C., Gerhard Klimeck, Amitava Chatterjee, et al.. (2002). Physical oxide thickness extraction and verification using quantum mechanical simulation. 869–872. 24 indexed citations
10.
Bowen, C., et al.. (2002). The beam performance of the Genus Tandetron 1520 MeV implanter. 36. 443–446. 1 indexed citations
11.
Schauer, S. N., et al.. (2002). Fluorine induced formation of intermetal dielectric defects. 303–307. 1 indexed citations
12.
Machala, C., et al.. (2002). The effects of thermal processing on CMOS device performance. 62–67. 1 indexed citations
13.
Liu, W., C. Bowen, & Mi-Chang Chang. (2002). A CAD-compatible non-quasi-static MOSFET model. 151–154. 7 indexed citations
14.
Klimeck, Gerhard, Roger K. Lake, D. K. Blanks, et al.. (1997). The Effects of Electron Screening Length and Emitter Quasi-Bound States on the Polar-Optical Phonon Scattering in Resonant Tunneling Diodes. physica status solidi (b). 204(1). 408–411. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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