A. J. Stoltz

732 citations
51 papers · 571 · h-index 14

Impact in

Papers in

A. J. Stoltz

50 papers receiving 561 citations

Peers

A. J. Stoltz
Comparison fields: 5 of 28
  • Electrical and Electronic Engineering 552
  • Atomic and Molecular Physics, and Optics 289
  • Surfaces, Coatings and Films 35
  • Aerospace Engineering 87
  • Materials Chemistry 130
Replace L. A. Almeida with:
L. A. Almeida United States
O. K. Wu United States
M. Martinka United States
T. J. de Lyon United States
P. W. Norton United States
D. T. Cheung United States
E. A. DeCuir United States
D. M. Jamba United States
F. Aqariden United States
J. L. Johnson United States
A. J. Stoltz relative to L. A. Almeida United States L. A. Almeida's profile →
Citations per field
00.5×1.5×
L. A. Almeida · 1×
Citations per year

Countries citing papers authored by A. J. Stoltz

Since Specialization
Citations

This map shows the geographic impact of A. J. Stoltz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. J. Stoltz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. J. Stoltz more than expected).

Fields of papers citing papers by A. J. Stoltz

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. J. Stoltz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. J. Stoltz. The network helps show where A. J. Stoltz may publish in the future.

Co-authors

The 25 scholars most cited alongside A. J. Stoltz, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with A. J. Stoltz Line = papers co-authored together A. J. Stoltz links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 51 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200147
2 200636
3 201230
4 200329
5 201028
6 201228
7 200222
8 200521
9 201120
10 201119
11 200219
12 200817
13 200915
14 200214
15 200313
16 201112
17 200612
18 200112
19 200612
20 200411

About A. J. Stoltz

A. J. Stoltz is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Aerospace Engineering and Surfaces, Coatings and Films, having authored 51 papers that have together received 571 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (44 papers), Chalcogenide Semiconductor Thin Films (18 papers), Semiconductor Quantum Structures and Devices (17 papers), Electron and X-Ray Spectroscopy Techniques (7 papers), Infrared Target Detection Methodologies (7 papers), Plasma Diagnostics and Applications (6 papers), Electronic and Structural Properties of Oxides (5 papers) and Quantum Dots Synthesis And Properties (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (552 citations), Atomic and Molecular Physics, and Optics (289 citations), Surfaces, Coatings and Films (35 citations), Aerospace Engineering (87 citations) and Materials Chemistry (130 citations). A. J. Stoltz has collaborated with scholars based in United States and Australia. Frequent co-authors include J. D. Benson, J. H. Dinan, L. A. Almeida, R. N. Jacobs, J. B. Varesi, M. Martinka, P. R. Boyd, M. Jaime-Vasquez, S. M. Johnson and Peter J. Smith. Their work appears in journals such as Journal of Electronic Materials, Journal of Crystal Growth, Applied Physics Letters, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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