M. Jaime-Vasquez

400 total citations
30 papers, 320 citations indexed

About

M. Jaime-Vasquez is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, M. Jaime-Vasquez has authored 30 papers receiving a total of 320 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 18 papers in Atomic and Molecular Physics, and Optics and 8 papers in Surfaces, Coatings and Films. Recurrent topics in M. Jaime-Vasquez's work include Advanced Semiconductor Detectors and Materials (27 papers), Semiconductor Quantum Structures and Devices (16 papers) and Chalcogenide Semiconductor Thin Films (13 papers). M. Jaime-Vasquez is often cited by papers focused on Advanced Semiconductor Detectors and Materials (27 papers), Semiconductor Quantum Structures and Devices (16 papers) and Chalcogenide Semiconductor Thin Films (13 papers). M. Jaime-Vasquez collaborates with scholars based in United States. M. Jaime-Vasquez's co-authors include R. N. Jacobs, L. A. Almeida, J. D. Benson, J. K. Markunas, A. J. Stoltz, M. Martinka, Peter J. Smith, M. Groenert, L. O. Bubulac and P. S. Wijewarnasuriya and has published in prestigious journals such as Applied Physics Letters, Journal of Crystal Growth and Journal of Electronic Materials.

In The Last Decade

M. Jaime-Vasquez

29 papers receiving 313 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Jaime-Vasquez United States 11 303 212 88 20 15 30 320
J. K. Markunas United States 12 358 1.2× 253 1.2× 104 1.2× 34 1.7× 22 1.5× 37 386
Y. Chen United States 16 415 1.4× 289 1.4× 119 1.4× 31 1.6× 32 2.1× 26 436
W. Pittroff Germany 13 391 1.3× 198 0.9× 26 0.3× 21 1.1× 6 0.4× 44 416
Giacomo Badano France 13 301 1.0× 198 0.9× 110 1.3× 47 2.4× 35 2.3× 42 336
G. Giroult-Matlakowski France 6 334 1.1× 108 0.5× 96 1.1× 36 1.8× 8 0.5× 12 354
Jorge de Sousa Pires Sweden 7 258 0.9× 334 1.6× 94 1.1× 30 1.5× 6 0.4× 12 351
Y. Nishijima Japan 13 316 1.0× 207 1.0× 166 1.9× 19 0.9× 13 0.9× 36 352
Martin Hafermann Germany 8 261 0.9× 177 0.8× 102 1.2× 50 2.5× 4 0.3× 18 329
Y. Yeh United States 7 132 0.4× 84 0.4× 38 0.4× 12 0.6× 7 0.5× 31 175
P.K. Chiang United States 9 315 1.0× 293 1.4× 69 0.8× 62 3.1× 7 0.5× 17 356

Countries citing papers authored by M. Jaime-Vasquez

Since Specialization
Citations

This map shows the geographic impact of M. Jaime-Vasquez's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Jaime-Vasquez with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Jaime-Vasquez more than expected).

Fields of papers citing papers by M. Jaime-Vasquez

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Jaime-Vasquez. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Jaime-Vasquez. The network helps show where M. Jaime-Vasquez may publish in the future.

Co-authorship network of co-authors of M. Jaime-Vasquez

This figure shows the co-authorship network connecting the top 25 collaborators of M. Jaime-Vasquez. A scholar is included among the top collaborators of M. Jaime-Vasquez based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Jaime-Vasquez. M. Jaime-Vasquez is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Rotter, Thomas J., Tito Busani, Kevin J. Malloy, et al.. (2015). Confocal Raman spectroscopy and AFM for evaluation of sidewalls in type II superlattice FPAs. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9451. 94510R–94510R. 2 indexed citations
2.
Stoltz, A. J., J. D. Benson, M. Jaime-Vasquez, et al.. (2014). A Review of the Characterization Techniques for the Analysis of Etch Processed Surfaces of HgCdTe and Related Compounds. Journal of Electronic Materials. 43(9). 3708–3717. 7 indexed citations
3.
Kim, Jae Jin, et al.. (2013). TEM Characterization of HgCdTe/CdTe Grown on GaAs(211)B Substrates. Journal of Electronic Materials. 42(11). 3142–3147. 8 indexed citations
4.
Benson, J. D., L. O. Bubulac, R. N. Jacobs, et al.. (2013). Impurity Gettering in (112)B HgCdTe/CdTe/Alternate Substrates. Journal of Electronic Materials. 42(11). 3217–3223. 1 indexed citations
5.
Jacobs, R. N., L. A. Almeida, M. Jaime-Vasquez, et al.. (2012). Development of MBE II–VI Epilayers on GaAs(211)B. Journal of Electronic Materials. 41(10). 2707–2713. 20 indexed citations
6.
Bubulac, L. O., J. D. Benson, R. N. Jacobs, et al.. (2011). The Distribution Tail of LWIR HgCdTe-on-Si FPAs: a Hypothetical Physical Mechanism. Journal of Electronic Materials. 40(3). 280–288. 19 indexed citations
7.
Zhao, Wenfeng, R. N. Jacobs, M. Jaime-Vasquez, L. O. Bubulac, & David J. Smith. (2011). Microstructural Characterization of CdTe(211)B/ZnTe/Si(211) Heterostructures Grown by Molecular Beam Epitaxy. Journal of Electronic Materials. 40(8). 1733–1737. 9 indexed citations
8.
Jacobs, R. N., J. K. Markunas, M. Jaime-Vasquez, et al.. (2011). Localized dry-etch substrate thinning for dislocation reduction in heteroepitaxial CdTe/Si(211). Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 29(3). 2 indexed citations
9.
Benson, J. D., L. O. Bubulac, Peter J. Smith, et al.. (2010). Characterization of Dislocations in (112)B HgCdTe/CdTe/Si. Journal of Electronic Materials. 39(7). 1080–1086. 28 indexed citations
10.
Benson, J. D., Peter J. Smith, R. N. Jacobs, et al.. (2009). Topography and Dislocations in (112)B HgCdTe/CdTe/Si. Journal of Electronic Materials. 38(8). 1771–1775. 15 indexed citations
11.
Jaime-Vasquez, M., M. Martinka, A. J. Stoltz, et al.. (2008). Plasma-Cleaned InSb (112)B for Large-Area Epitaxy of HgCdTe Sensors. Journal of Electronic Materials. 37(9). 1247–1254. 10 indexed citations
12.
Benson, J. D., R. N. Jacobs, J. K. Markunas, et al.. (2008). Structural Analysis of CdTe Hetero-epitaxy on (211) Si. Journal of Electronic Materials. 37(9). 1231–1236. 23 indexed citations
13.
Jacobs, R. N., L. A. Almeida, J. K. Markunas, et al.. (2008). Relevance of Thermal Mismatch in Large-Area Composite Substrates for HgCdTe Heteroepitaxy. Journal of Electronic Materials. 37(9). 1480–1487. 17 indexed citations
14.
Jacobs, R. N., J. K. Markunas, J. Pellegrino, et al.. (2008). Role of thermal expansion matching in CdTe heteroepitaxy on highly lattice-mismatched substrates. Journal of Crystal Growth. 310(12). 2960–2965. 34 indexed citations
15.
Martinka, M., M. Jaime-Vasquez, L. A. Almeida, et al.. (2007). Helium-Plasma-Prepared (111)A HgCdTe and (211)B InSb. Journal of Electronic Materials. 37(2). 152–156. 3 indexed citations
16.
Jaime-Vasquez, M., M. Martinka, R. N. Jacobs, & J. D. Benson. (2007). Nucleation of ZnTe on the As-Terminated Si(112) Surface. Journal of Electronic Materials. 36(8). 905–909. 9 indexed citations
17.
Jaime-Vasquez, M., M. Martinka, R. N. Jacobs, & M. Groenert. (2006). In-situ spectroscopic study of the As and Te on the Si (112) surface for high-quality epitaxial layers. Journal of Electronic Materials. 35(6). 1455–1460. 13 indexed citations
18.
Benson, J. D., J. B. Varesi, A. J. Stoltz, et al.. (2006). Surface structure of (111)A HgCdTe. Journal of Electronic Materials. 35(6). 1434–1442. 5 indexed citations
19.
Jaime-Vasquez, M., M. Martinka, M. Groenert, & J. H. Dinan. (2006). Ion scattering and electron spectroscopy of the chemical species at a HF-prepared Si(211) surface. Applied Physics Letters. 88(3). 3 indexed citations
20.
Jacobs, R. N., M. Jaime-Vasquez, A. J. Stoltz, et al.. (2006). Effects of a-Si:H resist vacuum-lithography processing on HgCdTe. Journal of Electronic Materials. 35(6). 1474–1480.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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