Yoosuf N. Picard
- Electrical and Electronic Engineering top 5%
- Materials Chemistry top 10%
- Mechanical Engineering top 10%
- Electronic, Optical and Magnetic Materials top 10%
- Biomedical Engineering top 10%
- Co-authors
- S. M. YalisoveMarek SkowrońskiM. E. TwiggS. M. ProkesLena MazeinaJames A. BainCharles R. EddyTresa M. Pollock
- Topics
- Silicon Carbide Semiconductor Technologies (15 papers)Integrated Circuits and Semiconductor Failure Analysis (14 papers)Semiconductor materials and devices (14 papers)
- Partner nations
- United StatesBelgiumCzechia
In The Last Decade
Yoosuf N. Picard
85 papers receiving 1.6k citations
Peers
Comparison fields: 5 of 66
- Electrical and Electronic Engineering 816
- Materials Chemistry 703
- Mechanical Engineering 283
- Electronic, Optical and Magnetic Materials 278
- Biomedical Engineering 278
Countries citing papers authored by Yoosuf N. Picard
This map shows the geographic impact of Yoosuf N. Picard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yoosuf N. Picard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yoosuf N. Picard more than expected).
Fields of papers citing papers by Yoosuf N. Picard
This network shows the impact of papers produced by Yoosuf N. Picard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yoosuf N. Picard. The network helps show where Yoosuf N. Picard may publish in the future.
Co-authorship network of co-authors of Yoosuf N. Picard
This figure shows the co-authorship network connecting the top 25 collaborators of Yoosuf N. Picard. A scholar is included among the top collaborators of Yoosuf N. Picard based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yoosuf N. Picard. Yoosuf N. Picard is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 9 | |
| 2 | 13 | |
| 3 | 1 | |
| 4 | 17 | |
| 5 | 59 | |
| 6 | 15 | |
| 7 | 83 | |
| 8 | 4 | |
| 9 | 45 | |
| 10 | 38 | |
| 11 | 4 | |
| 12 | 8 | |
| 13 | 15 | |
| 14 | 44 | |
| 15 | 6 | |
| 16 | 71 | |
| 17 | 13 | |
| 18 | Effects of wavelength and doping concentration on silicon damage threshold | 1 |
| 19 | 5 | |
| 20 | 76 |
About Yoosuf N. Picard
Yoosuf N. Picard is a scholar working on Structural Biology, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 85 papers that have together received 1.6k indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (15 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers) and Semiconductor materials and devices (14 papers). The work is most often cited by research in Structural Biology (87 citations), Surfaces, Coatings and Films (131 citations) and Materials Chemistry (703 citations). Yoosuf N. Picard has collaborated with scholars based in United States, Belgium and Czechia. Frequent co-authors include S. M. Yalisove, Marek Skowroński, M. E. Twigg, S. M. Prokes, Lena Mazeina, James A. Bain, Charles R. Eddy, Tresa M. Pollock, Joshua D. Caldwell and Abhishek A. Sharma. Their work appears in journals such as Nano Letters, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.