Yoosuf N. Picard
- Structural Biology top 2%
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 11
- Materials Chemistry top 10%
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- Silicon Carbide Semiconductor Technologies 15
- Integrated Circuits and Semiconductor Failure Analysis 14
- Semiconductor materials and devices 14
- Advanced Memory and Neural Computing 9
- Thin-Film Transistor Technologies 7
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- Laser Material Processing Techniques 9
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- GaN-based semiconductor devices and materials 8
Yoosuf N. Picard
85 papers receiving 1.6k citations
Peers
Comparison fields: 5 of 66
- Structural Biology 87
- Surfaces, Coatings and Films 131
- Materials Chemistry 703
- Electronic, Optical and Magnetic Materials 278
- Electrical and Electronic Engineering 816
Countries citing papers authored by Yoosuf N. Picard
This map shows the geographic impact of Yoosuf N. Picard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yoosuf N. Picard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yoosuf N. Picard more than expected).
Fields of papers citing papers by Yoosuf N. Picard
This network shows the impact of papers produced by Yoosuf N. Picard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yoosuf N. Picard. The network helps show where Yoosuf N. Picard may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Yoosuf N. Picard, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 9 | |
| 2 | 2024 | 13 | |
| 3 | 2021 | 1 | |
| 4 | 2020 | 17 | |
| 5 | 2017 | 59 | |
| 6 | 2015 | 15 | |
| 7 | 2015 | 83 | |
| 8 | 2015 | 4 | |
| 9 | 2014 | 45 | |
| 10 | 2014 | 38 | |
| 11 | 2014 | 4 | |
| 12 | 2013 | 8 | |
| 13 | 2011 | 15 | |
| 14 | 2011 | 44 | |
| 15 | 2010 | 6 | |
| 16 | 2006 | 71 | |
| 17 | 2005 | 13 | |
| 18 | Effects of wavelength and doping concentration on silicon damage threshold | 2004 | 1 |
| 19 | 2002 | 5 | |
| 20 | 2002 | 76 |
About Yoosuf N. Picard
Yoosuf N. Picard is a scholar working on Structural Biology, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 85 papers that have together received 1.6k indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (15 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Semiconductor materials and devices (14 papers), Electron and X-Ray Spectroscopy Techniques (11 papers), Advanced Memory and Neural Computing (9 papers), Laser Material Processing Techniques (9 papers), GaN-based semiconductor devices and materials (8 papers) and Thin-Film Transistor Technologies (7 papers). The work is most often cited by research in Structural Biology (87 citations), Surfaces, Coatings and Films (131 citations) and Materials Chemistry (703 citations). Yoosuf N. Picard has collaborated with scholars based in United States, Belgium and Czechia. Frequent co-authors include S. M. Yalisove, Marek Skowroński, M. E. Twigg, S. M. Prokes, Lena Mazeina, James A. Bain, Charles R. Eddy, Tresa M. Pollock, Joshua D. Caldwell and Abhishek A. Sharma. Their work appears in journals such as Nano Letters, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.