Xi–Wei Lin

1.6k total citations
84 papers, 1.2k citations indexed

About

Xi–Wei Lin is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Xi–Wei Lin has authored 84 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 67 papers in Electrical and Electronic Engineering, 30 papers in Atomic and Molecular Physics, and Optics and 18 papers in Materials Chemistry. Recurrent topics in Xi–Wei Lin's work include Semiconductor materials and devices (33 papers), Semiconductor materials and interfaces (27 papers) and Integrated Circuits and Semiconductor Failure Analysis (20 papers). Xi–Wei Lin is often cited by papers focused on Semiconductor materials and devices (33 papers), Semiconductor materials and interfaces (27 papers) and Integrated Circuits and Semiconductor Failure Analysis (20 papers). Xi–Wei Lin collaborates with scholars based in United States, Switzerland and China. Xi–Wei Lin's co-authors include J. Washburn, Vinayak P. Dravid, J. B. Ketterson, R. P. H. Chang, Z. Liliental‐Weber, M. Behar, H. Bernas, J. Desimoni, Victor Moroz and W. J. Schaff and has published in prestigious journals such as Science, SHILAP Revista de lepidopterología and Physical review. B, Condensed matter.

In The Last Decade

Xi–Wei Lin

78 papers receiving 1.2k citations

Peers

Xi–Wei Lin

EEE

AMPO

Shinichi Saito Japan

E. Keßler Germany

M. Hatzakis United States

Chul Kang South Korea

Dimitrios Kazazis Switzerland

G. Zeltzer United States

D. E. Lucchetta Italy

Yu‐ichiro Matsushita Japan

B. А. Belyaev Russia

Makoto Okano Japan

Shinichi Saito Japan

Xi–Wei Lin

1.3k ×2.0

EEE

534 ×1.0

625 ×1.4

AMPO

68 ×0.5

337 ×2.5

Citations per year, relative to Xi–Wei Lin Xi–Wei Lin (= 1×) peers Shinichi Saito

Countries citing papers authored by Xi–Wei Lin

Since Specialization

Citations

This map shows the geographic impact of Xi–Wei Lin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Xi–Wei Lin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Xi–Wei Lin more than expected).

Fields of papers citing papers by Xi–Wei Lin

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Xi–Wei Lin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Xi–Wei Lin. The network helps show where Xi–Wei Lin may publish in the future.

Co-authorship network of co-authors of Xi–Wei Lin

This figure shows the co-authorship network connecting the top 25 collaborators of Xi–Wei Lin. A scholar is included among the top collaborators of Xi–Wei Lin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Xi–Wei Lin. Xi–Wei Lin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Hu, Zheng, Yaohong Xiao, Changzheng Fan, et al.. (2025). Study of the Oxidative Behavior of WC-6wt.%Co Cemented Carbide at Different Temperatures. Journal of Materials Engineering and Performance. 34(22). 26932–26943.

Burton, Oliver J., Suman Chakraborty, Peter J. Christopher, et al.. (2025). High‐Throughput Ellipsometric Contrast Microscopy of Lateral 2D Heterostructures for Optoelectronics. Small Methods. 10(2). e2500437–e2500437.

Malavena, Gerardo, Salvatore Amoroso, Andrew R. Brown, et al.. (2024). Discrete-Trap Effects on 3-D NAND Variability – Part I: Threshold Voltage. IEEE Journal of the Electron Devices Society. 12. 651–657. 1 indexed citations

Moroz, Victor, et al.. (2024). 3DIC System-Technology Co-Optimization with a Focus on the Interplay of Thermal, Power, Timing, and Stress Effects. 1–2. 3 indexed citations

Malavena, Gerardo, Salvatore Amoroso, Andrew R. Brown, et al.. (2024). Discrete-Trap Effects on 3-D NAND Variability – Part II: Random Telegraph Noise. IEEE Journal of the Electron Devices Society. 12. 658–661. 2 indexed citations

Lee, Jaehyun, Reto Rhyner, Salvatore Amoroso, et al.. (2024). Design Technology Co-Optimization for the DRAM Cell Structure With Contact Resistance Variation. IEEE Transactions on Electron Devices. 71(3). 1893–1899. 7 indexed citations

Chen, Wei-Chen, Hang-Ting Lue, Ming-Hung Wu, et al.. (2024). A Multi-WL Approach to Suppress Gate-Induced Drain Leakage, Floating Body Effect, and Row Hammer Effect in Array Transistor of 4F2 DRAM and 3D Stackable DRAM. 1–4.

Liu, Leitao, et al.. (2024). Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology. 7B.5–1. 1 indexed citations

Zhang, Qi‐Jun, et al.. (2023). Accuracy of Non-Destructive Estimation of Length of Soil Nails. Buildings. 13(7). 1699–1699. 1 indexed citations

10.

Amoroso, Salvatore, Gerardo Malavena, A. R. Brown, et al.. (2023). Understanding the impact of polysilicon percolative conduction on 3D NAND variability. Virtual Community of Pathological Anatomy (University of Castilla La Mancha). 97–100. 2 indexed citations

11.

Bazizi, El Mehdi, et al.. (2021). Extending materials to systems co-optimizationTM (MSCOTM) modeling to memory array simulation. 14–14. 2 indexed citations

12.

Amoroso, Salvatore, Jaehyun Lee, Yao‐Hua Tan, et al.. (2020). Enabling Variability-Aware Design-Technology Co-Optimization for Advanced Memory Technologies. SHILAP Revista de lepidopterología. 3(4). 1–8. 1 indexed citations

13.

Chen, Wei-Chen, Hang-Ting Lue, Yi‐Hsuan Hsiao, et al.. (2015). Charge storage efficiency (CSE) effect in modeling the incremental step pulse programming (ISPP) in charge-trapping 3D NAND flash devices. 5.5.1–5.5.4. 20 indexed citations

14.

Moroz, Victor, Lee Smith, Munkang Choi, et al.. (2014). Modeling and optimization of group IV and III–V FinFETs and nano-wires. 7.4.1–7.4.4. 21 indexed citations

15.

Karmarkar, Aditya P., et al.. (2007). Impact of Fabrication Process, Layout Variation and Packaging Process on Cu/Low-k Interconnect Reliability. MRS Proceedings. 990.

16.

Lin, Xi–Wei, et al.. (2006). Bringing Manufacturing into Design via Process-Dependent SPICE Models. 2. 801–806. 8 indexed citations

17.

Duxstad, K. J., E. E. Häller, K. M. Yu, et al.. (1995). Solid-state reaction in Pd/ZnSe thin film contacts. Applied Physics Letters. 67(7). 947–949. 10 indexed citations

18.

Lin, Xi–Wei, J. Desimoni, H. Bernas, Z. Liliental‐Weber, & J. Washburn. (1993). Comparison Between Ion-Beam and Thermal-Annealing Induced Solid Phase Epitaxy in Fe-Implanted Si. MRS Proceedings. 320. 5 indexed citations

19.

Lin, Xi–Wei, et al.. (1993). Growth and characterization of buckybundles. Applied Physics Letters. 62(16). 1881–1883. 54 indexed citations

20.

Desimoni, J., M. Behar, H. Bernas, et al.. (1993). Ion-beam-induced simultaneous epitaxial growth of α- and cubic FeSi2 in Si (100) at 320°C. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 80-81. 755–758. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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