J.S. Yuan
- Hardware and Architecture top 2%
-
- Semiconductor materials and devices 121
- Advancements in Semiconductor Devices and Circuit Design 114
- Radio Frequency Integrated Circuit Design 54
- Silicon Carbide Semiconductor Technologies 42
- Low-power high-performance VLSI design 36
- Integrated Circuits and Semiconductor Failure Analysis 25
- Electrostatic Discharge in Electronics 24
- Health Informatics top 10%
- Condensed Matter Physics top 10%
- GaN-based semiconductor devices and materials 24
- Co-authors
- Milad SalemJie LinAminollah KhormaliHong YangArash Keshavarzi ArshadiJuin J. LiouYier JinRonald F. DeMara
- Journals
- Solid-State Electronics (26 papers)IEEE Transactions on Electron Devices (22 papers)IEEE Transactions on Device and Materials Reliability (20 papers)
- Partner nations
- United StatesTaiwanIraq
In The Last Decade
J.S. Yuan
224 papers receiving 2.5k citations
Peers
Comparison fields: 5 of 131
- Hardware and Architecture 309
- Electrical and Electronic Engineering 1.9k
- Health Informatics 21
- Condensed Matter Physics 165
- Computational Theory and Mathematics 165
Countries citing papers authored by J.S. Yuan
This map shows the geographic impact of J.S. Yuan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.S. Yuan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.S. Yuan more than expected).
Fields of papers citing papers by J.S. Yuan
This network shows the impact of papers produced by J.S. Yuan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.S. Yuan. The network helps show where J.S. Yuan may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J.S. Yuan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2025 | 1 | |
| 3 | 2024 | 2 | |
| 4 | 2024 | 3 | |
| 5 | 2024 | 3 | |
| 6 | 2022 | 47 | |
| 7 | 2022 | 21 | |
| 8 | 2021 | 3 | |
| 9 | 2020 | 11 | |
| 10 | 2020 | 144 | |
| 11 | 2019 | 5 | |
| 12 | 2019 | 11 | |
| 13 | 2019 | 5 | |
| 14 | 2018 | 10 | |
| 15 | 2018 | 21 | |
| 16 | 2017 | 7 | |
| 17 | 2017 | 22 | |
| 18 | 2017 | 2 | |
| 19 | Hot Electron Effect on FinFET RF Circuit Reliability | 2014 | 1 |
| 20 | 2000 | 9 |
About J.S. Yuan
J.S. Yuan is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Condensed Matter Physics, Computational Theory and Mathematics and Atomic and Molecular Physics, and Optics, having authored 240 papers that have together received 2.6k indexed citations. Recurring topics across this work include Semiconductor materials and devices (121 papers), Advancements in Semiconductor Devices and Circuit Design (114 papers), Radio Frequency Integrated Circuit Design (54 papers), Silicon Carbide Semiconductor Technologies (42 papers), Low-power high-performance VLSI design (36 papers), Integrated Circuits and Semiconductor Failure Analysis (25 papers), Electrostatic Discharge in Electronics (24 papers) and GaN-based semiconductor devices and materials (24 papers). The work is most often cited by research in Hardware and Architecture (309 citations), Electrical and Electronic Engineering (1.9k citations), Health Informatics (21 citations), Condensed Matter Physics (165 citations) and Computational Theory and Mathematics (165 citations). J.S. Yuan has collaborated with scholars based in United States, Taiwan and Iraq. Frequent co-authors include Milad Salem, Jie Lin, Aminollah Khormali, Hong Yang, Arash Keshavarzi Arshadi, Juin J. Liou, Yier Jin, Ronald F. DeMara, Chulin Yu and Yu Bi. Their work appears in journals such as Solid-State Electronics, IEEE Transactions on Electron Devices, IEEE Transactions on Device and Materials Reliability, Microelectronics Reliability and Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.