Tomoyuki Suwa

589 total citations
86 papers, 488 citations indexed

About

Tomoyuki Suwa is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Materials Chemistry. According to data from OpenAlex, Tomoyuki Suwa has authored 86 papers receiving a total of 488 indexed citations (citations by other indexed papers that have themselves been cited), including 77 papers in Electrical and Electronic Engineering, 16 papers in Electronic, Optical and Magnetic Materials and 16 papers in Materials Chemistry. Recurrent topics in Tomoyuki Suwa's work include Semiconductor materials and devices (60 papers), Advancements in Semiconductor Devices and Circuit Design (38 papers) and Integrated Circuits and Semiconductor Failure Analysis (21 papers). Tomoyuki Suwa is often cited by papers focused on Semiconductor materials and devices (60 papers), Advancements in Semiconductor Devices and Circuit Design (38 papers) and Integrated Circuits and Semiconductor Failure Analysis (21 papers). Tomoyuki Suwa collaborates with scholars based in Japan, Canada and United States. Tomoyuki Suwa's co-authors include Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi, Rihito Kuroda, Yuki Kumagai, Takeo Hattori, Xiang Li, Tetsuya Goto, Kenichi Abe and T. Ohmi and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

Tomoyuki Suwa

83 papers receiving 481 citations

Peers

Tomoyuki Suwa

EEE

AMPO

EOMM

Johannes Sturm Austria

Michael Belyansky United States

A. Chou United States

Eugene Delenia United States

Jeff J. Peterson United States

Chung Len Lee Taiwan

Pyung Moon South Korea

Sudha Gupta India

Wen‐Chien Miao Taiwan

C. D’Emic United States

Johannes Sturm Austria

Tomoyuki Suwa

443 ×1.0

EEE

69 ×0.7

101 ×1.8

68 ×1.5

AMPO

47 ×1.1

EOMM

Citations per year, relative to Tomoyuki Suwa Tomoyuki Suwa (= 1×) peers Johannes Sturm

Countries citing papers authored by Tomoyuki Suwa

Since Specialization

Citations

This map shows the geographic impact of Tomoyuki Suwa's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tomoyuki Suwa with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tomoyuki Suwa more than expected).

Fields of papers citing papers by Tomoyuki Suwa

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Tomoyuki Suwa. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tomoyuki Suwa. The network helps show where Tomoyuki Suwa may publish in the future.

Co-authorship network of co-authors of Tomoyuki Suwa

This figure shows the co-authorship network connecting the top 25 collaborators of Tomoyuki Suwa. A scholar is included among the top collaborators of Tomoyuki Suwa based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Tomoyuki Suwa. Tomoyuki Suwa is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Goto, Tetsuya, et al.. (2023). Measuring Temporal Variation of Concentration of ALD Precursor TEMAZ in Process Chamber Using UV Absorption Method. ECS Transactions. 111(1). 3–10. 2 indexed citations

Suzuki, Hayato, et al.. (2021). A high-precision current measurement platform applied for statistical measurement of discharge current transient spectroscopy of traps in SiN dielectrics. Japanese Journal of Applied Physics. 60(8). 86501–86501. 1 indexed citations

Kuroda, Rihito, et al.. (2020). A high-precision 1 Ω–10 MΩ range resistance measurement platform for statistical evaluation of emerging memory materials. Japanese Journal of Applied Physics. 59(SG). SGGL03–SGGL03. 1 indexed citations

Kuroda, Rihito, et al.. (2020). Effect of Drain-to-Source Voltage on Random Telegraph Noise Based on Statistical Analysis of MOSFETs with Various Gate Shapes. 1. 1–6. 5 indexed citations

Teramoto, Akinobu, et al.. (2020). High reliability CoFeB/MgO/CoFeB magnetic tunnel junction fabrication using low-damage ion beam etching. Japanese Journal of Applied Physics. 59(SG). SGGB05–SGGB05. 3 indexed citations

Mori, Keiichiro, et al.. (2020). Influence of silicon wafer surface roughness on semiconductor device characteristics. Japanese Journal of Applied Physics. 59(SM). SMMB06–SMMB06. 22 indexed citations

Kuroda, Rihito, et al.. (2020). Resistance Measurement Platform for Statistical Analysis of Emerging Memory Materials. IEEE Transactions on Semiconductor Manufacturing. 33(2). 232–239. 4 indexed citations

Fukuhara, Mikio, Fumihiko Hasegawa, Masayoshi Takahashi, et al.. (2019). Effects of temperatures and carbon dioxide nanobubbles on superior electric storage for anodically oxidized films of AlY10 amorphous alloy. AIP Advances. 9(9). 6 indexed citations

Teramoto, Akinobu, et al.. (2018). Reliability of MgO in magnetic tunnel junctions formed by MgO sputtering and Mg oxidation. P–GD.4.

10.

Teramoto, Akinobu, et al.. (2018). Effect of drain current on appearance probability and amplitude of random telegraph noise in low-noise CMOS image sensors. Japanese Journal of Applied Physics. 57(4S). 04FF08–04FF08. 5 indexed citations

11.

Suwa, Tomoyuki, et al.. (2016). Oxidizing Species Dependence of the Interface Reaction during Atomic-Layer-Deposition Process and Post-Deposition-Anneal. ECS Transactions. 75(5). 207–214. 1 indexed citations

12.

Teramoto, Akinobu, et al.. (2016). Proposal of tunneling- and diffusion-current hybrid MOSFET: A device simulation study. Japanese Journal of Applied Physics. 55(4S). 04ED12–04ED12. 1 indexed citations

13.

Teramoto, Akinobu, Hiroki Tanaka, Tomoyuki Suwa, et al.. (2016). Evaluating Work-Function and Composition of ErSi_xon Various Surface Orientation of Silicon. ECS Journal of Solid State Science and Technology. 5(10). P608–P613. 1 indexed citations

14.

Suwa, Tomoyuki, Rihito Kuroda, Tetsuya Goto, et al.. (2015). Effect of Process Temperature of Al₂O₃ Atomic Layer Deposition Using Accurate Process Gasses Supply System. ECS Transactions. 66(4). 305–314. 1 indexed citations

15.

Goto, Tetsuya, Rihito Kuroda, Tomoyuki Suwa, et al.. (2015). Introduction of Atomically Flattening of Si Surface to Large-Scale Integration Process Employing Shallow Trench Isolation. ECS Journal of Solid State Science and Technology. 5(2). P67–P72. 6 indexed citations

16.

Kumagai, Yoshinao, Rihito Kuroda, Akinobu Teramoto, et al.. (2012). A test circuit for extremely low gate leakage current measurement of 10 aA for 80,000 MOSFETs in 80 s. 131–136. 7 indexed citations

17.

Ohmi, Tadahiro, Hiroki Tanaka, Tomoyuki Suwa, Xiang Li, & Rihito Kuroda. (2011). Science Based New Silicon Technologies Exhibiting Super High Performance due to Radical-reaction-based Semiconductor Manufacturing. Journal of the Korean Physical Society. 59(2(1)). 391–401. 1 indexed citations

18.

Suwa, Tomoyuki, et al.. (2010). Depth Profile of Nitrogen Atoms in Silicon Oxynitride Films Formed by Low-Electron-Temperature Microwave Plasma Nitridation. Japanese Journal of Applied Physics. 49(9R). 91301–91301. 6 indexed citations

19.

Teramoto, Akinobu, et al.. (2008). The data analysis technique of the atomic force microscopy for the atomically flat silicon surface. 108(122). 265–269. 2 indexed citations

20.

Teramoto, Akinobu, et al.. (2008). The data analysis technique of the atomic force microscopy for the atomically flat silicon surface(Session9A: Silicon Devices IV). 108(121). 265–269. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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