Eugene Delenia

444 total citations
13 papers, 248 citations indexed

About

Eugene Delenia is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Eugene Delenia has authored 13 papers receiving a total of 248 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Electrical and Electronic Engineering, 5 papers in Materials Chemistry and 4 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Eugene Delenia's work include Copper Interconnects and Reliability (4 papers), Semiconductor materials and devices (4 papers) and Magnetic properties of thin films (3 papers). Eugene Delenia is often cited by papers focused on Copper Interconnects and Reliability (4 papers), Semiconductor materials and devices (4 papers) and Magnetic properties of thin films (3 papers). Eugene Delenia collaborates with scholars based in United States, Australia and Taiwan. Eugene Delenia's co-authors include Philip M. Rice, S. Parkin, Teya Topuria, P. M. Braganca, Yu Zhu, Eric Joseph, Ho‐Cheol Kim, Anthony Annunziata, W. J. Gallagher and D. C. Ralph and has published in prestigious journals such as Applied Physics Letters, ACS Applied Materials & Interfaces and IEEE Transactions on Magnetics.

In The Last Decade

Eugene Delenia

12 papers receiving 241 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Eugene Delenia United States 9 157 98 81 32 31 13 248
Slimane Oussalah Algeria 11 264 1.7× 53 0.5× 124 1.5× 27 0.8× 46 1.5× 57 327
Tomoyuki Suwa Japan 12 434 2.8× 44 0.4× 97 1.2× 44 1.4× 56 1.8× 86 488
E. Dentoni Litta Belgium 12 414 2.6× 53 0.5× 106 1.3× 30 0.9× 50 1.6× 69 469
Shuu’ichirou Yamamoto Japan 10 307 2.0× 126 1.3× 65 0.8× 29 0.9× 36 1.2× 40 381
Yuichi Yamazaki Japan 11 185 1.2× 150 1.5× 199 2.5× 43 1.3× 28 0.9× 40 335
Jeff J. Peterson United States 16 629 4.0× 42 0.4× 145 1.8× 34 1.1× 18 0.6× 35 660
K. Schuegraf United States 8 280 1.8× 33 0.3× 88 1.1× 34 1.1× 52 1.7× 20 335
Johannes Sturm Austria 11 443 2.8× 68 0.7× 69 0.9× 47 1.5× 101 3.3× 60 495
T. Eimori Japan 11 447 2.8× 41 0.4× 40 0.5× 19 0.6× 43 1.4× 54 478
D. Gogl Germany 9 268 1.7× 152 1.6× 48 0.6× 41 1.3× 31 1.0× 13 328

Countries citing papers authored by Eugene Delenia

Since Specialization
Citations

This map shows the geographic impact of Eugene Delenia's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eugene Delenia with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eugene Delenia more than expected).

Fields of papers citing papers by Eugene Delenia

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Eugene Delenia. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eugene Delenia. The network helps show where Eugene Delenia may publish in the future.

Co-authorship network of co-authors of Eugene Delenia

This figure shows the co-authorship network connecting the top 25 collaborators of Eugene Delenia. A scholar is included among the top collaborators of Eugene Delenia based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Eugene Delenia. Eugene Delenia is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

13 of 13 papers shown
1.
Arellano, Noel, Charles Rettner, Philip M. Rice, et al.. (2025). Plasma-enhanced atomic layer deposition of elemental niobium thin films. Applied Physics Letters. 127(15).
2.
Ogunfowora, Lawal Adewale, Ishwar Singh, Noel Arellano, et al.. (2024). Reactive Vapor-Phase Inhibitors for Area-Selective Depositions at Tunable Critical Dimensions. ACS Applied Materials & Interfaces. 16(4). 5268–5277. 7 indexed citations
3.
Wojtecki, Rudy J., Isvar A. Cordova, Noel Arellano, et al.. (2021). Additive Lithography–Organic Monolayer Patterning Coupled with an Area-Selective Deposition. ACS Applied Materials & Interfaces. 13(7). 9081–9090. 19 indexed citations
4.
Virwani, Kumar, S. E. Harrison, Aakash Pushp, et al.. (2014). Controlled removal of amorphous Se capping layer from a topological insulator. Applied Physics Letters. 105(24). 17 indexed citations
5.
Jubert, Pierre‐Olivier, H. Rothuizen, Eugene Delenia, Jane Frommer, & Mark A. Lantz. (2012). A Stepped-Pole Writer to Minimize Side Erasure on Barium Ferrite Tape. IEEE Transactions on Magnetics. 48(11). 3543–3546. 4 indexed citations
6.
Annunziata, Anthony, M. C. Gaidis, Thomas Hauet, et al.. (2011). Racetrack memory cell array with integrated magnetic tunnel junction readout. 24.3.1–24.3.4. 71 indexed citations
7.
Braganca, P. M., J. A. Katine, N. C. Emley, et al.. (2008). A Three-Terminal Approach to Developing Spin-Torque Written Magnetic Random Access Memory Cells. IEEE Transactions on Nanotechnology. 8(2). 190–195. 47 indexed citations
8.
Krupp, Leslie, Eugene Delenia, Charles Rettner, et al.. (2006). Patterning ∼20nm half-pitch lines on silicon using a self-assembled organosilicate etch mask. Applied Physics Letters. 88(24). 27 indexed citations
9.
Thompson, Leslie E., Philip M. Rice, Eugene Delenia, et al.. (2005). Imaging Thin Films of Nanoporous Low-k Dielectrics: Comparison between Ultramicrotomy and Focused Ion Beam Preparations for Transmission Electron Microscopy. Microscopy and Microanalysis. 12(2). 156–159. 12 indexed citations
10.
Thiruvengadathan, Rajagopalan, Bashar Lahlouh, Jorge Lubguban, et al.. (2003). Supercritical carbon dioxide extraction of porogens for the preparation of ultralow-dielectric-constant films. Applied Physics Letters. 82(24). 4328–4330. 20 indexed citations
11.
12.
Delenia, Eugene, et al.. (2001). Ultra-Thinning of C4 Integrated Circuits for Backside Analysis during First Silicon Debug. Microelectronics Reliability. 41(9-10). 1545–1549. 2 indexed citations
13.
Khan, Muhib, et al.. (1988). Effect of High Thermal Stability Mold Material on the Gold-Aluminum Bond Reliability in Epoxy Encapsulated VLSI Devices. Reliability physics. 40–49. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Slimane Oussalah Breakdown of academic impact, for papers by Tomoyuki Suwa Breakdown of academic impact, for papers by E. Dentoni Litta Breakdown of academic impact, for papers by Shuu’ichirou Yamamoto Breakdown of academic impact, for papers by Yuichi Yamazaki Breakdown of academic impact, for papers by Jeff J. Peterson Breakdown of academic impact, for papers by K. Schuegraf Breakdown of academic impact, for papers by Johannes Sturm Breakdown of academic impact, for papers by T. Eimori Breakdown of academic impact, for papers by D. Gogl
Rankless by CCL
2026