N. Zamani
- Electrical and Electronic Engineering top 10%
- Materials Chemistry
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
- Surfaces, Coatings and Films
- Co-authors
- J. MaserjianR. P. VasquezF. J. GrunthanerM. H. HechtK. LehovecM. BuehlerMietek BakowskiKenneth A. Hicks
- Topics
- Semiconductor materials and devices (7 papers)Semiconductor materials and interfaces (2 papers)Electronic Packaging and Soldering Technologies (2 papers)
- Cited by
- Electrical and Electronic EngineeringMaterials ChemistryAtomic and Molecular Physics, and Optics
- Partner nations
- United StatesIranSweden
In The Last Decade
N. Zamani
9 papers receiving 375 citations
Peers
Comparison fields: 5 of 30
- Electrical and Electronic Engineering 364
- Materials Chemistry 127
- Atomic and Molecular Physics, and Optics 72
- Electronic, Optical and Magnetic Materials 17
- Surfaces, Coatings and Films 16
Countries citing papers authored by N. Zamani
This map shows the geographic impact of N. Zamani's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Zamani with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Zamani more than expected).
Fields of papers citing papers by N. Zamani
This network shows the impact of papers produced by N. Zamani. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Zamani. The network helps show where N. Zamani may publish in the future.
Co-authorship network of co-authors of N. Zamani
This figure shows the co-authorship network connecting the top 25 collaborators of N. Zamani. A scholar is included among the top collaborators of N. Zamani based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. Zamani. N. Zamani is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 1 | |
| 5 | 1 | |
| 6 | Design and qualification of the SEU/TD Radiation Monitor chip | 3 |
| 7 | 4 | |
| 8 | 30 | |
| 9 | 92 | |
| 10 | 245 | |
| 11 | 10 | |
| 12 | 5 |
About N. Zamani
N. Zamani is a scholar working on Surfaces, Coatings and Films, Statistics, Probability and Uncertainty and Electrical and Electronic Engineering, having authored 12 papers that have together received 391 indexed citations. Recurring topics across this work include Semiconductor materials and devices (7 papers), Semiconductor materials and interfaces (2 papers) and Electronic Packaging and Soldering Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (364 citations), Materials Chemistry (127 citations) and Atomic and Molecular Physics, and Optics (72 citations). N. Zamani has collaborated with scholars based in United States, Iran and Sweden. Frequent co-authors include J. Maserjian, R. P. Vasquez, F. J. Grunthaner, M. H. Hecht, K. Lehovec, M. Buehler, Mietek Bakowski, Kenneth A. Hicks, Stephanie Brown and Esmaeel Sharifi. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Nuclear Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.