Sying-Jyan Wang

1.4k total citations
105 papers, 1.0k citations indexed

About

Sying-Jyan Wang is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Biomedical Engineering. According to data from OpenAlex, Sying-Jyan Wang has authored 105 papers receiving a total of 1.0k indexed citations (citations by other indexed papers that have themselves been cited), including 91 papers in Electrical and Electronic Engineering, 60 papers in Hardware and Architecture and 23 papers in Biomedical Engineering. Recurrent topics in Sying-Jyan Wang's work include Integrated Circuits and Semiconductor Failure Analysis (52 papers), VLSI and Analog Circuit Testing (48 papers) and Industrial Vision Systems and Defect Detection (16 papers). Sying-Jyan Wang is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (52 papers), VLSI and Analog Circuit Testing (48 papers) and Industrial Vision Systems and Defect Detection (16 papers). Sying-Jyan Wang collaborates with scholars based in Taiwan, United States and Hong Kong. Sying-Jyan Wang's co-authors include Niraj K. Jha, Katherine Shu-Min Li, Tsung-Yi Ho, V. Kumar, Harvey J. Murff, Tapan Kumar Gandhi, Eric G. Poon, David W. Bates, Meiping Zhao and David G. Fairchild and has published in prestigious journals such as Information Sciences, TrAC Trends in Analytical Chemistry and IEEE Transactions on Computers.

In The Last Decade

Sying-Jyan Wang

96 papers receiving 991 citations

Peers

Countries citing papers authored by Sying-Jyan Wang

Since Specialization

Citations

This map shows the geographic impact of Sying-Jyan Wang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Sying-Jyan Wang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Sying-Jyan Wang more than expected).

Fields of papers citing papers by Sying-Jyan Wang

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Sying-Jyan Wang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Sying-Jyan Wang. The network helps show where Sying-Jyan Wang may publish in the future.

Co-authorship network of co-authors of Sying-Jyan Wang

This figure shows the co-authorship network connecting the top 25 collaborators of Sying-Jyan Wang. A scholar is included among the top collaborators of Sying-Jyan Wang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Sying-Jyan Wang. Sying-Jyan Wang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Machine-Learning Driven Sensor Data Analytics for Yield Enhancement of Wafer Probing 2023 ·(unknown), Katherine Shu-Min Li, Sying-Jyan Wang, (unknown), (unknown)	0
2	Wafer Scratch Pattern Reconstruction for High Diagnosis Accuracy and Yield Optimization 2022 ·IEEE Transactions on Semiconductor Manufacturing ·Katherine Shu-Min Li, (unknown), (unknown), Sying-Jyan Wang, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown)	5
3	TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning 2022 ·IEEE Transactions on Semiconductor Manufacturing ·Katherine Shu-Min Li, (unknown), (unknown), (unknown), Sying-Jyan Wang, (unknown), (unknown), (unknown), (unknown)	6
4	Wafer Defect Pattern Classification with Explainable-Decision Tree Technique 2022 ·(unknown), Katherine Shu-Min Li, Sying-Jyan Wang, (unknown), (unknown), (unknown), (unknown), (unknown)	3
5	Machine Learning-Based Detection Method for Wafer Test Induced Defects 2021 ·IEEE Transactions on Semiconductor Manufacturing ·(unknown), (unknown), Jiwei Li, Katherine Shu-Min Li, (unknown), Sying-Jyan Wang, (unknown), (unknown), (unknown), (unknown), (unknown), Chun‐Lung Hsu	45
6	Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis 2020 ·(unknown), Katherine Shu-Min Li, (unknown), Jiwei Li, (unknown), (unknown), Sying-Jyan Wang, (unknown), (unknown), (unknown), (unknown), (unknown)	7
7	TestDNA: Novel Wafer Defect Signature for Diagnosis and Pattern Recognition 2020 ·IEEE Transactions on Semiconductor Manufacturing ·Katherine Shu-Min Li, (unknown), (unknown), Xuhao Jiang, (unknown), Sying-Jyan Wang, (unknown), (unknown), (unknown)	8
8	A layout-aware test methodology for silicon interposer in 3D System-in-a-Package 2013 ·(unknown), (unknown), (unknown), Yingchieh Ho, Liang-Bi Chen, (unknown), (unknown), (unknown), Sying-Jyan Wang, (unknown)	3
9	Low peak power ATPG for n-detection test 2009 ·Sying-Jyan Wang, (unknown), Katherine Shu-Min Li	7
10	Electroosmotic pumps for microflow analysis 2008 ·TrAC Trends in Analytical Chemistry ·(unknown), Sying-Jyan Wang, (unknown), Chun Cheng, Chang Kyu Byun, (unknown), Meiping Zhao, (unknown)	65
11	High-level test synthesis for delay fault testability 2007 ·Design, Automation, and Test in Europe ·Sying-Jyan Wang, (unknown)	1
12	Test data compression for minimum test application time 2007 ·Journal of information science and engineering ·(unknown), Sying-Jyan Wang, Ching-Hung Lin, (unknown)	4
13	Multi-Mode Segmented Scan Architecture with Layout-Aware Scan Chain Routing for Test Data and Test Time Reduction 2006 ·(unknown), Sying-Jyan Wang	5
14	Layout-Aware Scan Chain Reorder for Skewed-Load Transition Test Coverage 2006 ·Sying-Jyan Wang, (unknown), (unknown)	3
15	Low Power BIST with Smoother and Scan-Chain Reorder 2005 ·(unknown), Sying-Jyan Wang, (unknown)	6
16	Reaching fault diagnosis agreement on an unreliable general network 2004 ·Information Sciences ·Ke Yan, Sying-Jyan Wang	13
17	Primary care physician attitudes concerning follow-up of abnormal test results and ambulatory decision support systems 2003 ·International Journal of Medical Informatics ·Harvey J. Murff, Tapan Kumar Gandhi, (unknown), Elizabeth Mort, Eric G. Poon, Sying-Jyan Wang, David G. Fairchild, David W. Bates	67
18	Testability improvement by branch point control for conditional statements with multiple branches 2000 ·Journal of information science and engineering ·Sying-Jyan Wang, (unknown), (unknown)	1
19	Test and diagnosis of faulty logic blocks in FPGAs 1997 ·International Conference on Computer Aided Design ·Sying-Jyan Wang, (unknown)	25
20	Branch-skipped pipelined microprocessor 1994 ·Electronics Letters ·Sying-Jyan Wang, (unknown)	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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