Katherine Shu-Min Li
- Electrical and Electronic Engineering
- Hardware and Architecture top 5%
- Industrial and Manufacturing Engineering top 5%
- Biomedical Engineering
- Mechanical Engineering
- Co-authors
- Sying-Jyan WangTsung-Yi HoLiang-Bi ChenWan‐Jung ChangYuwei YangChun‐Lung HsuHongyuan LiYu-Sheng Chen
- Topics
- Integrated Circuits and Semiconductor Failure Analysis (33 papers)VLSI and Analog Circuit Testing (20 papers)Industrial Vision Systems and Defect Detection (16 papers)
- Cited by
- Hardware and ArchitectureIndustrial and Manufacturing EngineeringElectrical and Electronic Engineering
In The Last Decade
Katherine Shu-Min Li
67 papers receiving 425 citations
Peers
Comparison fields: 5 of 56
- Electrical and Electronic Engineering 303
- Hardware and Architecture 132
- Industrial and Manufacturing Engineering 108
- Biomedical Engineering 96
- Mechanical Engineering 57
Countries citing papers authored by Katherine Shu-Min Li
This map shows the geographic impact of Katherine Shu-Min Li's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Katherine Shu-Min Li with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Katherine Shu-Min Li more than expected).
Fields of papers citing papers by Katherine Shu-Min Li
This network shows the impact of papers produced by Katherine Shu-Min Li. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Katherine Shu-Min Li. The network helps show where Katherine Shu-Min Li may publish in the future.
Co-authorship network of co-authors of Katherine Shu-Min Li
This figure shows the co-authorship network connecting the top 25 collaborators of Katherine Shu-Min Li. A scholar is included among the top collaborators of Katherine Shu-Min Li based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Katherine Shu-Min Li. Katherine Shu-Min Li is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 5 | |
| 4 | 6 | |
| 5 | 5 | |
| 6 | 3 | |
| 7 | 2 | |
| 8 | 45 | |
| 9 | 7 | |
| 10 | 8 | |
| 11 | 6 | |
| 12 | 3 | |
| 13 | 5 | |
| 14 | 7 | |
| 15 | 17 | |
| 16 | 15 | |
| 17 | 1 | |
| 18 | 4 | |
| 19 | 7 | |
| 20 | 1 |
About Katherine Shu-Min Li
Katherine Shu-Min Li is a scholar working on Hardware and Architecture, Industrial and Manufacturing Engineering and Electrical and Electronic Engineering, having authored 73 papers that have together received 436 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (33 papers), VLSI and Analog Circuit Testing (20 papers) and Industrial Vision Systems and Defect Detection (16 papers). The work is most often cited by research in Hardware and Architecture (132 citations), Industrial and Manufacturing Engineering (108 citations) and Electrical and Electronic Engineering (303 citations). Katherine Shu-Min Li has collaborated with scholars based in Taiwan, Hong Kong and Germany. Frequent co-authors include Sying-Jyan Wang, Tsung-Yi Ho, Liang-Bi Chen, Wan‐Jung Chang, Yuwei Yang, Chun‐Lung Hsu, Hongyuan Li, Yu-Sheng Chen, Xuhao Jiang and Jiwei Li. Their work appears in journals such as IEEE Access, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Semiconductor Manufacturing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.