Kenneth P. Parker
- Electrical and Electronic Engineering top 5%
- Hardware and Architecture top 0.5%
- Control and Systems Engineering top 5%
- Computational Theory and Mathematics top 5%
- Software top 5%
- Co-authors
- T.W. WilliamsE.J. McCluskeyKathryn HirdBill EklowStephen SunterC. BarnhartYoung KimJeff Rearick
- Topics
- VLSI and Analog Circuit Testing (34 papers)Integrated Circuits and Semiconductor Failure Analysis (28 papers)Engineering and Test Systems (13 papers)
- Partner nations
- United StatesJapanChina
In The Last Decade
Kenneth P. Parker
39 papers receiving 985 citations
Peers
Comparison fields: 5 of 59
- Electrical and Electronic Engineering 906
- Hardware and Architecture 799
- Control and Systems Engineering 189
- Computational Theory and Mathematics 94
- Software 58
Countries citing papers authored by Kenneth P. Parker
This map shows the geographic impact of Kenneth P. Parker's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kenneth P. Parker with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kenneth P. Parker more than expected).
Fields of papers citing papers by Kenneth P. Parker
This network shows the impact of papers produced by Kenneth P. Parker. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kenneth P. Parker. The network helps show where Kenneth P. Parker may publish in the future.
Co-authorship network of co-authors of Kenneth P. Parker
This figure shows the co-authorship network connecting the top 25 collaborators of Kenneth P. Parker. A scholar is included among the top collaborators of Kenneth P. Parker based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kenneth P. Parker. Kenneth P. Parker is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 2 | |
| 3 | 1 | |
| 4 | 1 | |
| 5 | 7 | |
| 6 | 3 | |
| 7 | 1 | |
| 8 | 8 | |
| 9 | 5 | |
| 10 | 0 | |
| 11 | 31 | |
| 12 | Testing for what | 1 |
| 13 | 7 | |
| 14 | A New Process for Measuring and Displaying Board Test Coverage | 2 |
| 15 | 9 | |
| 16 | 34 | |
| 17 | 6 | |
| 18 | 2 | |
| 19 | 2 | |
| 20 | 267 |
About Kenneth P. Parker
Kenneth P. Parker is a scholar working on Hardware and Architecture, Control and Systems Engineering and Electrical and Electronic Engineering, having authored 42 papers that have together received 1.1k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (34 papers), Integrated Circuits and Semiconductor Failure Analysis (28 papers) and Engineering and Test Systems (13 papers). The work is most often cited by research in Hardware and Architecture (799 citations), Electrical and Electronic Engineering (906 citations) and Software (58 citations). Kenneth P. Parker has collaborated with scholars based in United States, Japan and China. Frequent co-authors include T.W. Williams, E.J. McCluskey, Kathryn Hird, Bill Eklow, Stephen Sunter, C. Barnhart, Young Kim, Jeff Rearick, Xin He and Yashwant K. Malaiya. Their work appears in journals such as Proceedings of the IEEE, IEEE Transactions on Computers and Journal of Electronic Testing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.