Róbert Binder

491 total citations
27 papers, 362 citations indexed

About

Róbert Binder is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Mechanics of Materials. According to data from OpenAlex, Róbert Binder has authored 27 papers receiving a total of 362 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 11 papers in Atomic and Molecular Physics, and Optics and 4 papers in Mechanics of Materials. Recurrent topics in Róbert Binder's work include Semiconductor materials and devices (13 papers), Radio Frequency Integrated Circuit Design (6 papers) and Ferroelectric and Negative Capacitance Devices (6 papers). Róbert Binder is often cited by papers focused on Semiconductor materials and devices (13 papers), Radio Frequency Integrated Circuit Design (6 papers) and Ferroelectric and Negative Capacitance Devices (6 papers). Róbert Binder collaborates with scholars based in Germany, United States and Belgium. Róbert Binder's co-authors include André Anders, J. Schein, N. Qi, John Ziemer, James E. Polk, M. Krishnan, Fred Schindler, Raik Hoffmann, Johannes Müller and W. Struble and has published in prestigious journals such as SHILAP Revista de lepidopterología, Journal of Applied Physics and IEEE Transactions on Electron Devices.

In The Last Decade

Róbert Binder

26 papers receiving 336 citations

Peers

Róbert Binder
A. A. Goncharov Ukraine
Yasushi Yamano Japan
Wilkin Tang United States
W. Claeys France
Toshiyuki Uchii Japan
Luís Nuño Fernández Spain
A. V. Vizir Russia
G. Sandolache France
Véronique Quintard France
A. M. Kuzmitski Belarus
A. A. Goncharov Ukraine
Róbert Binder
Citations per year, relative to Róbert Binder Róbert Binder (= 1×) peers A. A. Goncharov

Countries citing papers authored by Róbert Binder

Since Specialization
Citations

This map shows the geographic impact of Róbert Binder's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Róbert Binder with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Róbert Binder more than expected).

Fields of papers citing papers by Róbert Binder

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Róbert Binder. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Róbert Binder. The network helps show where Róbert Binder may publish in the future.

Co-authorship network of co-authors of Róbert Binder

This figure shows the co-authorship network connecting the top 25 collaborators of Róbert Binder. A scholar is included among the top collaborators of Róbert Binder based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Róbert Binder. Róbert Binder is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ali, Tarek, David Lehninger, Maximilian Lederer, et al.. (2022). Tuning Hyrbrid Ferroelectric and Antiferroelectric Stacks for Low Power FeFET and FeRAM Applications by Using Laminated HSO and HZO films. Advanced Electronic Materials. 8(5). 19 indexed citations
2.
Sessi, V., Maik Simon, Stefan Slesazeck, et al.. (2021). S2–2 Back-Bias Reconfigurable Field Effect Transistor: A Flexible Add-On Functionality for 22 nm FDSOI. 1–2. 1 indexed citations
3.
Ali, Tarek, Kati Kühnel, Ricardo Olivo, et al.. (2021). Impact of the Ferroelectric Stack Lamination in Si Doped Hafnium Oxide (HSO) and Hafnium Zirconium Oxide (HZO) Based FeFETs: Toward High-Density Multi-Level Cell and Synaptic Storage. SHILAP Revista de lepidopterología. 2(3). 344–369. 13 indexed citations
4.
Ali, Tarek, Konstantin Mertens, Ricardo Olivo, et al.. (2021). Impact of the Nonlinear Dielectric Hysteresis Properties of a Charge Trap Layer in a Novel Hybrid High-Speed and Low-Power Ferroelectric or Antiferroelectric HSO/HZO Boosted Charge Trap Memory. IEEE Transactions on Electron Devices. 68(4). 2098–2106. 8 indexed citations
5.
Ali, Tarek, Kati Kühnel, M. Czernohorsky, et al.. (2020). A Study on the Temperature-Dependent Operation of Fluorite-Structure-Based Ferroelectric HfO2 Memory FeFET: A Temperature-Modulated Operation. IEEE Transactions on Electron Devices. 67(7). 2793–2799. 20 indexed citations
6.
Ali, Tarek, Kati Kühnel, M. Czernohorsky, et al.. (2020). A Study on the Temperature-Dependent Operation of Fluorite-Structure-Based Ferroelectric HfO2 Memory FeFET: Pyroelectricity and Reliability. IEEE Transactions on Electron Devices. 67(7). 2981–2987. 18 indexed citations
7.
Triyoso, Dina H., et al.. (2017). The application of low energy ion scattering spectroscopy (LEIS) in sub 28‐nm CMOS technology. Surface and Interface Analysis. 49(12). 1175–1186. 8 indexed citations
8.
Pagès, Xavier Llimona i, et al.. (2017). The effect of the second annealing step on the Ni1-xPtx:Si film thermal stability. Microelectronic Engineering. 171. 44–52. 2 indexed citations
9.
Müller, Johannes, P. Polakowski, Jan Paul, et al.. (2015). (Invited) Integration Challenges of Ferroelectric Hafnium Oxide Based Embedded Memory. ECS Transactions. 69(3). 85–95. 23 indexed citations
10.
Hempel, Klaus, et al.. (2013). Impact of both metal composition and oxygen/nitrogen profiles on p-channel metal-oxide semiconductor transistor threshold voltage for gate last high-k metal gate. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 31(2). 1 indexed citations
11.
Erben, Elke, K. Hempel, Dina H. Triyoso, et al.. (2012). Impact of process parameters of TiN cap formation on threshold voltage and gate leakage in HKMG last integration. 173–174. 1 indexed citations
12.
Mileham, Jeffrey, Thang Van Le, Yun Wang, et al.. (2010). Impact of dual beam laser spike annealing parameters on nickel silicide formation characteristics. 4 indexed citations
13.
14.
Huang, Jong‐Chin, Anthony Bertrand, Fred Schindler, et al.. (2003). High linearity monolithic broadband pseudomorphic spike-doped MESFET amplifiers. 211–214. 6 indexed citations
15.
Schindler, Fred, et al.. (2002). A compact wideband balanced mixer. 135–138. 10 indexed citations
16.
Schein, J., et al.. (2002). Microvacuum Arc Thruster Design for a Cubesat Class Satellite. Digital Commons - USU (Utah State University). 20 indexed citations
17.
Qi, N., et al.. (2002). Compact vacuum arc thruster for small satellite systems. IEEE Conference Record - Abstracts. PPPS-2001 Pulsed Power Plasma Science 2001. 28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference (Cat. No.01CH37255). 588–588. 4 indexed citations
18.
Schein, J., N. Qi, Róbert Binder, et al.. (2002). Inductive energy storage driven vacuum arc thruster. Review of Scientific Instruments. 73(2). 925–927. 69 indexed citations
19.
Fitzgerald, D.J., et al.. (2002). A MMIC 2.4 GHz transmitter and 5.78 GHz receiver for wireless LAN applications. 21–25. 2 indexed citations
20.
Anders, André, et al.. (2001). Correlation between cathode properties, burning voltage, and plasma parameters of vacuum arcs. Journal of Applied Physics. 89(12). 7764–7771. 75 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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