R.J. Chater

605 total citations
36 papers, 494 citations indexed

About

R.J. Chater is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Materials Chemistry. According to data from OpenAlex, R.J. Chater has authored 36 papers receiving a total of 494 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 22 papers in Computational Mechanics and 14 papers in Materials Chemistry. Recurrent topics in R.J. Chater's work include Semiconductor materials and devices (25 papers), Ion-surface interactions and analysis (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). R.J. Chater is often cited by papers focused on Semiconductor materials and devices (25 papers), Ion-surface interactions and analysis (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). R.J. Chater collaborates with scholars based in United Kingdom, United States and Greece. R.J. Chater's co-authors include John A. Kilner, Roger A. De Souza, G. R. Booker, P.L.F. Hemment, P.L.F. Hemment, K.J. Reeson, Christopher Marsh, R. F. Peart, J.R. Davis and G. K. Celler and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

R.J. Chater

36 papers receiving 474 citations

Peers

Countries citing papers authored by R.J. Chater

Since Specialization

Citations

This map shows the geographic impact of R.J. Chater's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.J. Chater with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.J. Chater more than expected).

Fields of papers citing papers by R.J. Chater

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R.J. Chater. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.J. Chater. The network helps show where R.J. Chater may publish in the future.

Co-authorship network of co-authors of R.J. Chater

This figure shows the co-authorship network connecting the top 25 collaborators of R.J. Chater. A scholar is included among the top collaborators of R.J. Chater based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R.J. Chater. R.J. Chater is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Thermal etching of silver: Influence of rolling defects 2016 ·Materials Characterization ·M. Ollivier, Robert M. Harker, R.J. Chater, C.M. Gourlay	5
2	Environmentally assisted fatigue crack nucleation in Ti–6Al–2Sn–4Zr–6Mo 2015 ·Corrosion Science ·(unknown), R.J. Chater, (unknown), (unknown), T.C. Lindley, David Dye	16
3	Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering 2012 ·Applied Physics Letters ·Helena Téllez, R.J. Chater, Sarah Fearn, (unknown), Hidde H. Brongersma, John A. Kilner	11
4	Oxygen permeation in bismuth-based materials. Part II: Characterisation of oxygen transfer in bismuth erbium oxide and bismuth calcium oxide ceramic 2006 ·Solid State Ionics ·Edouard Capoen, G. Nowogrocki, R.J. Chater, Stephen J. Skinner, John A. Kilner, M. Małys, J.C. Boivin, G. Mairesse, Rose‐Noëlle Vannier	14
5	Microstructural characterization of transparent silicon oxide permeation barrier coatings on PET 1998 ·Oxford University Research Archive (ORA) (University of Oxford) ·(unknown), Anthony P. Roberts, (unknown), A. P. Sutton, (unknown), Yasunori Tsukahara, M. Yanaka, (unknown), R.J. Chater	1
6	Reentrant metal–insulator-type transition induced by high fluence chromium ion implantation of La0.7Ca0.3MnO3 thin films 1998 ·Applied Physics Letters ·L. F. Cohen, (unknown), (unknown), A. K. M. Akther Hossain, (unknown), R.J. Chater, (unknown), T. Tate, N. D. Mathur, M. G. Blamire, J. E. Evetts	6
7	SIMOX: processing, layer parameters design, and defects control 1995 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·(unknown), Christopher Marsh, A. Nejim, R.J. Chater, John A. Kilner, P.L.F. Hemment	5
8	An investigation of the role of the time averaged ion beam current density upon the defect densities in thin film SIMOX 1994 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·A. Nejim, Christopher Marsh, (unknown), P.L.F. Hemment, Y. Li, R.J. Chater, John A. Kilner, G. R. Booker	4
9	Investigation of buried AlN layers formed by nitrogen implantation into Al 1993 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·(unknown), John A. Kilner, R.J. Chater, (unknown), A. Nejim, (unknown), P.L.F. Hemment	11
10	Direct formation of device worthy thin film SIMOX structures by low energy oxygen implantation 1993 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·A. Nejim, Yuanwei Li, Christopher Marsh, P.L.F. Hemment, R.J. Chater, John A. Kilner, G. R. Booker	6
11	Control of the buried SiO2 layer thickness and Si defect density in SIMOX substrates — structural investigation and process optimisation 1993 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·Christopher Marsh, A. Nejim, Y. Li, G. R. Booker, P.L.F. Hemment, R.J. Chater, John A. Kilner	5
12	Low energy, oxygen dose optimization for thin film separation by implanted oxygen 1992 ·Materials Science and Engineering B ·(unknown), Yuanwei Li, Christopher Marsh, R.J. Chater, P.L.F. Hemment, John A. Kilner, G. R. Booker	13
13	A transmission electron microscope investigation of the dose dependence of the microstructure of silicon-on-insulator structures formed by nitrogen implantation of silicon 1991 ·Journal of Applied Physics ·(unknown), G. R. Booker, K.J. Reeson, P.L.F. Hemment, R. F. Peart, R.J. Chater, John A. Kilner, J.R. Davis	23
14	Nitrogen-15 isotope tracer studies of buried nitride layer formation by high dose implantation 1989 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·John A. Kilner, R.J. Chater, K.J. Reeson, P.L.F. Hemment, J.R. Davis	5
15	Modelling of 18O tracer studies of the oxygen redistribution during formation of SiO2 layers by high dose implantation 1988 ·Thin Solid Films ·H.U. Jäger, John A. Kilner, R.J. Chater, P.L.F. Hemment, R. F. Peart, K.J. Reeson	13
16	Total Dielectric Isolation (TDI) of Device Islands Using SIMOX/SOI Technology 1987 ·MRS Proceedings ·P.L.F. Hemment, (unknown), K.J. Reeson, J.R. Davis, (unknown), R.J. Chater, J. Stoëmenos	4
17	Optical and compositional studies of buried oxide layers in silicon formed by high dose implantation 1987 ·Applied Surface Science ·R.J. Chater, John A. Kilner, E. Scheid, (unknown), P.L.F. Hemment, K.J. Reeson	8
18	SIMS analysis of buried silicon nitride layers formed by high dose implantation of 14N and 15N 1986 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·John A. Kilner, R.J. Chater, P.L.F. Hemment, R. F. Peart, K.J. Reeson, (unknown), J.R. Davis	22
19	Microstructure of silicon-on-insulator structures produced by high dose nitrogen implantation of silicon 1986 ·Vacuum ·(unknown), G. R. Booker, (unknown), P.L.F. Hemment, R.J. Chater, John A. Kilner, (unknown)	9
20	Ion beam synthesis of thin buried layers of SiO2 in silicon 1986 ·Vacuum ·P.L.F. Hemment, (unknown), John A. Kilner, R.J. Chater, Christopher Marsh, G. R. Booker, G. K. Celler, J. Stoëmenos	51

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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