Kazuo Kajiwara

587 total citations
45 papers, 470 citations indexed

About

Kazuo Kajiwara is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, Kazuo Kajiwara has authored 45 papers receiving a total of 470 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Electrical and Electronic Engineering, 19 papers in Materials Chemistry and 18 papers in Computational Mechanics. Recurrent topics in Kazuo Kajiwara's work include Ion-surface interactions and analysis (17 papers), Semiconductor materials and devices (13 papers) and Advanced Materials Characterization Techniques (9 papers). Kazuo Kajiwara is often cited by papers focused on Ion-surface interactions and analysis (17 papers), Semiconductor materials and devices (13 papers) and Advanced Materials Characterization Techniques (9 papers). Kazuo Kajiwara collaborates with scholars based in Japan, Taiwan and United States. Kazuo Kajiwara's co-authors include Yoshinori Hayafuji, H. Kawai, S. Usui, K. Kaneko, N. Watanabe, Κ. Yoshihara, Koichi Hata, Toshishige Yamada, J. Kasahara and S. Hofmann and has published in prestigious journals such as Journal of Applied Physics, Journal of The Electrochemical Society and Applied Surface Science.

In The Last Decade

Kazuo Kajiwara

39 papers receiving 438 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Kazuo Kajiwara Japan 13 307 171 148 106 96 45 470
Hideo Sunami Japan 12 452 1.5× 190 1.1× 51 0.3× 137 1.3× 86 0.9× 40 566
Nicole Herbots United States 16 467 1.5× 240 1.4× 258 1.7× 138 1.3× 55 0.6× 55 606
M. El Bouanani Australia 12 230 0.7× 215 1.3× 123 0.8× 84 0.8× 45 0.5× 50 470
Russell B. Goodman United States 13 386 1.3× 126 0.7× 66 0.4× 59 0.6× 237 2.5× 31 532
E. Garfunkel United States 7 403 1.3× 244 1.4× 62 0.4× 94 0.9× 33 0.3× 8 466
P. M. Zagwijn Netherlands 14 375 1.2× 241 1.4× 136 0.9× 247 2.3× 65 0.7× 32 591
G. F. Doughty United Kingdom 6 260 0.8× 166 1.0× 223 1.5× 81 0.8× 72 0.8× 15 451
D. Bahnck United States 10 309 1.0× 128 0.7× 64 0.4× 213 2.0× 67 0.7× 21 423
M. S. Ameen United States 10 199 0.6× 181 1.1× 61 0.4× 77 0.7× 69 0.7× 31 331
A. H. Reader Netherlands 13 383 1.2× 197 1.2× 62 0.4× 390 3.7× 73 0.8× 32 594

Countries citing papers authored by Kazuo Kajiwara

Since Specialization
Citations

This map shows the geographic impact of Kazuo Kajiwara's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kazuo Kajiwara with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kazuo Kajiwara more than expected).

Fields of papers citing papers by Kazuo Kajiwara

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Kazuo Kajiwara. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kazuo Kajiwara. The network helps show where Kazuo Kajiwara may publish in the future.

Co-authorship network of co-authors of Kazuo Kajiwara

This figure shows the co-authorship network connecting the top 25 collaborators of Kazuo Kajiwara. A scholar is included among the top collaborators of Kazuo Kajiwara based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kazuo Kajiwara. Kazuo Kajiwara is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kajiwara, Kazuo, et al.. (2016). Spin polarization of electrons field-emitted from Cr thin film deposited on W<001> tips. 1–2. 1 indexed citations
2.
Kajiwara, Kazuo, et al.. (2016). Effect of height and atomic arrangement of the super‐tip of a gas field ion emitter on helium ion beam current. Surface and Interface Analysis. 48(11). 1132–1135. 1 indexed citations
3.
Kajiwara, Kazuo, et al.. (2014). Investigation of stability and charge state of Ne and Ar gas field ion source by time-of-flight mass spectrometry. Japanese Journal of Applied Physics. 53(5). 58004–58004. 14 indexed citations
4.
5.
Sugiura, Yasushi, Huarong Liu, Kazuo Kajiwara, et al.. (2011). Fabrication of Gas Field Ion Emitter by Field Induced Oxygen Etching Method. e-Journal of Surface Science and Nanotechnology. 9. 344–347. 8 indexed citations
6.
Kobayashi, Yusuke, et al.. (2010). Experimental evaluation of the influence of shank shape of field ion emitter on the angular current density. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 28(2). C2A90–C2A93. 5 indexed citations
7.
Kobayashi, Yuichi, et al.. (2009). Influence of shank shape of field ion emitter on gas molecule capture area. 215–216. 2 indexed citations
8.
Sato, Hideki, et al.. (2008). Growth control of carbon nanotubes by plasma enhanced chemical vapor deposition. Vacuum. 83(3). 515–517. 11 indexed citations
9.
Sato, Hideki, Koichi Hata, Kazuo Kajiwara, & Yahachi Saito. (2007). Fabrication of field emitter by direct growth of carbon nanotube onto tungsten tip by chemical vapor deposition. 189–190.
10.
11.
Kajiwara, Kazuo, et al.. (2002). 4.1: Blue‐emitting ZnS: Ag, Al Phosphor with Longer Lifetime and Saturationless Performance for Projection CRTs. SID Symposium Digest of Technical Papers. 33(1). 6–7. 1 indexed citations
12.
Kajiwara, Kazuo. (2001). Cross-sectional transmission electron microscopy investigation of the dead layer of ZnS:Ag,Al phosphors in field emission displays. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 19(4). 1083–1089. 14 indexed citations
13.
Taniguchi, Hitoshi, Kazuo Kajiwara, Katsuhiko Nomoto, et al.. (1997). Amorphous silicon solar cell on textured tempered glass substrate prepared by sandblast process. Solar Energy Materials and Solar Cells. 49(1-4). 101–106. 11 indexed citations
14.
Kajiwara, Kazuo. (1994). Crystalline effects on depth resolution in AES depth profiling. Surface and Interface Analysis. 22(1-12). 22–26. 4 indexed citations
15.
Kajiwara, Kazuo, et al.. (1990). Analysis of metal-ferrite interface layers in metal-in-gap heads. IEEE Transactions on Magnetics. 26(6). 2978–2982. 7 indexed citations
16.
Kajiwara, Kazuo. (1987). Compositional analysis of surface and interface. Depth profiling analysis using ion sputtering.. Nihon Kessho Gakkaishi. 29(2). 87–92.
17.
Imanaga, Syunji, H. Kawai, Kazuo Kajiwara, K. Kaneko, & N. Watanabe. (1987). Excimer-laser annealed ohmic contacts to n-GaAs substrates through an ultrathin reacted layer. Journal of Applied Physics. 62(6). 2381–2386. 13 indexed citations
18.
Hayafuji, Yoshinori, Kazuo Kajiwara, & S. Usui. (1982). Shrinkage and growth of oxidation stacking faults during thermal nitridation of silicon and oxidized silicon. Journal of Applied Physics. 53(12). 8639–8646. 35 indexed citations
19.
Kasahara, J., Kazuo Kajiwara, & Toshishige Yamada. (1977). GaAs whiskers grown by a thermal decomposition method. Journal of Crystal Growth. 38(1). 23–28. 21 indexed citations
20.
Satô, Noboru, et al.. (1973). Oxygen precipitation at the oxidation-induced defects in silicon. physica status solidi (a). 16(1). K63–K65. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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