E. Scheid
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- Semiconductor materials and devices 52
- Silicon and Solar Cell Technologies 40
- Thin-Film Transistor Technologies 39
- Advancements in Semiconductor Devices and Circuit Design 9
- Silicon Carbide Semiconductor Technologies 9
- Materials Chemistry top 10%
- Silicon Nanostructures and Photoluminescence 37
- Bioengineering top 5%
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- Semiconductor materials and interfaces 11
- Surfaces, Coatings and Films top 10%
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- Ion-surface interactions and analysis 12
E. Scheid
109 papers receiving 1.3k citations
Peers
Comparison fields: 5 of 63
- Electrical and Electronic Engineering 1.1k
- Materials Chemistry 572
- Bioengineering 63
- Atomic and Molecular Physics, and Optics 295
- Surfaces, Coatings and Films 52
Countries citing papers authored by E. Scheid
This map shows the geographic impact of E. Scheid's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Scheid with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Scheid more than expected).
Fields of papers citing papers by E. Scheid
This network shows the impact of papers produced by E. Scheid. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Scheid. The network helps show where E. Scheid may publish in the future.
Co-authorship network
The 25 scholars most cited alongside E. Scheid, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 3 | |
| 2 | 2021 | 5 | |
| 3 | 2019 | 9 | |
| 4 | 2018 | 5 | |
| 5 | 2015 | 7 | |
| 6 | Influence of the annealing condition on the BN bonds intensity detected by FTIR characterization | 2011 | 3 |
| 7 | 2010 | 1 | |
| 8 | 2009 | 11 | |
| 9 | 2008 | 3 | |
| 10 | 2007 | 8 | |
| 11 | 2007 | 23 | |
| 12 | 2004 | 2 | |
| 13 | 2002 | 3 | |
| 14 | 1999 | 3 | |
| 15 | 1999 | 3 | |
| 16 | 1997 | 15 | |
| 17 | 1996 | 4 | |
| 18 | Polysilicon Thin Film Transistor : a Study of some Techniques of Realisation of the Channel Region and of the Gate | 1993 | 1 |
| 19 | 1993 | 7 | |
| 20 | 1990 | 1 |
About E. Scheid
E. Scheid is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Ceramics and Composites, having authored 110 papers that have together received 1.3k indexed citations. Recurring topics across this work include Semiconductor materials and devices (52 papers), Silicon and Solar Cell Technologies (40 papers), Thin-Film Transistor Technologies (39 papers), Silicon Nanostructures and Photoluminescence (37 papers), Ion-surface interactions and analysis (12 papers), Semiconductor materials and interfaces (11 papers), Advancements in Semiconductor Devices and Circuit Design (9 papers) and Silicon Carbide Semiconductor Technologies (9 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.1k citations), Materials Chemistry (572 citations) and Bioengineering (63 citations). E. Scheid has collaborated with scholars based in France, Spain and Algeria. Frequent co-authors include P. Temple‐Boyer, Carole Rossi, Brigitte Caussat, Hugues Vergnes, J.L. Regolini, D. Bensahel, J. Mercier, F. Cristiano, Constantin Vahlas and Georgios P. Gakis. Their work appears in journals such as Thin Solid Films, Applied Surface Science, Japanese Journal of Applied Physics, Microelectronics Reliability and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.