R. Höpler

1.6k total citations · 2 hit papers
7 papers, 1.4k citations indexed

About

R. Höpler is a scholar working on Condensed Matter Physics, Materials Chemistry and Mechanics of Materials. According to data from OpenAlex, R. Höpler has authored 7 papers receiving a total of 1.4k indexed citations (citations by other indexed papers that have themselves been cited), including 7 papers in Condensed Matter Physics, 5 papers in Materials Chemistry and 4 papers in Mechanics of Materials. Recurrent topics in R. Höpler's work include GaN-based semiconductor devices and materials (6 papers), ZnO doping and properties (4 papers) and Metal and Thin Film Mechanics (4 papers). R. Höpler is often cited by papers focused on GaN-based semiconductor devices and materials (6 papers), ZnO doping and properties (4 papers) and Metal and Thin Film Mechanics (4 papers). R. Höpler collaborates with scholars based in Germany. R. Höpler's co-authors include O. Ambacher, M. Stutzmann, H. Angerer, Daniel Brunner, E. Born, R. Dimitrov, E. Bustarret, T. Metzger, H. Göbel and M. Schuster and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Solid State Communications.

In The Last Decade

R. Höpler

6 papers receiving 1.3k citations

Hit Papers

Optical constants of epitaxial AlGaN films and their temp... 1997 2026 2006 2016 1997 1998 100 200 300 400 500
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Optical constants of epitaxial AlGaN films and their temperature dependence
    1997 512 citations Daniel Brunner, H. Angerer et al. Journal of Applied Physics profile →
  2. Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry
    1998 483 citations T. Metzger, R. Höpler et al. Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R. Höpler Germany 6 1.2k 642 584 413 348 7 1.4k
F. Omnès France 19 979 0.8× 752 1.2× 526 0.9× 540 1.3× 287 0.8× 27 1.3k
J. Off Germany 18 1.4k 1.2× 611 1.0× 599 1.0× 412 1.0× 802 2.3× 55 1.6k
Jeffrey J. Figiel United States 25 1.4k 1.2× 720 1.1× 729 1.2× 820 2.0× 659 1.9× 52 2.0k
Thomas Hempel Germany 20 1.0k 0.8× 579 0.9× 688 1.2× 562 1.4× 272 0.8× 60 1.4k
G. Nataf France 15 810 0.7× 445 0.7× 571 1.0× 402 1.0× 363 1.0× 31 1.1k
Xu‐Qiang Shen Japan 23 1.1k 0.9× 614 1.0× 668 1.1× 539 1.3× 537 1.5× 98 1.6k
R. Dwiliński Poland 16 1.0k 0.8× 499 0.8× 541 0.9× 409 1.0× 280 0.8× 31 1.2k
H. Marchand United States 17 1.6k 1.3× 818 1.3× 803 1.4× 798 1.9× 621 1.8× 37 1.9k
R. Doradziński Poland 17 1.2k 1.0× 635 1.0× 662 1.1× 397 1.0× 314 0.9× 30 1.3k
H. P. Strunk Germany 15 738 0.6× 380 0.6× 483 0.8× 456 1.1× 302 0.9× 44 1.1k

Countries citing papers authored by R. Höpler

Since Specialization
Citations

This map shows the geographic impact of R. Höpler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Höpler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Höpler more than expected).

Fields of papers citing papers by R. Höpler

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Höpler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Höpler. The network helps show where R. Höpler may publish in the future.

Co-authorship network of co-authors of R. Höpler

This figure shows the co-authorship network connecting the top 25 collaborators of R. Höpler. A scholar is included among the top collaborators of R. Höpler based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Höpler. R. Höpler is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

7 of 7 papers shown
1.
Höpler, R., et al.. (1999). X-RAY OPTICAL CONSIDERATIONS ON PARABOLIC GRADED MULTILAYERS ON THE DIFFRACTED BEAM SIDE IN X-RAY DIFFRACTION. 1 indexed citations
2.
Metzger, T., R. Höpler, E. Born, et al.. (1998). Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry. Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties. 77(4). 1013–1025. 483 indexed citations breakdown →
3.
Stutzmann, M., O. Ambacher, Martin S. Brandt, et al.. (1997). Properties and applications of MBE grown AlGaN. Materials Science and Engineering B. 50(1-3). 212–218. 47 indexed citations
4.
Cros, A., H. Angerer, O. Ambacher, et al.. (1997). Raman study of the optical phonons in AlxGa1−xN alloys. Solid State Communications. 104(1). 35–39. 54 indexed citations
5.
Metzger, T., R. Höpler, E. Born, et al.. (1997). Coherent X-Ray Scattering Phenomenon in Highly Disordered Epitaxial AlN Films. physica status solidi (a). 162(2). 529–535. 17 indexed citations
6.
Brunner, Daniel, H. Angerer, E. Bustarret, et al.. (1997). Optical constants of epitaxial AlGaN films and their temperature dependence. Journal of Applied Physics. 82(10). 5090–5096. 512 indexed citations breakdown →
7.
Angerer, H., Daniel Brunner, O. Ambacher, et al.. (1997). Determination of the Al mole fraction and the band gap bowing of epitaxial AlxGa1−xN films. Applied Physics Letters. 71(11). 1504–1506. 267 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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