F. Beaudoin

1.9k total citations
89 papers, 1.3k citations indexed

About

F. Beaudoin is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, F. Beaudoin has authored 89 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 72 papers in Electrical and Electronic Engineering, 34 papers in Atomic and Molecular Physics, and Optics and 23 papers in Biomedical Engineering. Recurrent topics in F. Beaudoin's work include Integrated Circuits and Semiconductor Failure Analysis (54 papers), Semiconductor materials and devices (16 papers) and Quantum and electron transport phenomena (14 papers). F. Beaudoin is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (54 papers), Semiconductor materials and devices (16 papers) and Quantum and electron transport phenomena (14 papers). F. Beaudoin collaborates with scholars based in France, Canada and United States. F. Beaudoin's co-authors include Alexandre Blais, Jay Gambetta, P. Perdu, Jérôme Bourassa, W. A. Coish, D. Lewis, Leigh Norris, Lorenza Viola, Blake Johnson and Matthew Ware and has published in prestigious journals such as Physical Review Letters, Nature Communications and Applied Physics Letters.

In The Last Decade

F. Beaudoin

84 papers receiving 1.2k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F. Beaudoin France 15 850 651 502 152 91 89 1.3k
Mary Beth Rothwell United States 12 1.2k 1.4× 1.3k 2.0× 322 0.6× 66 0.4× 16 0.2× 20 1.8k
Enrico Prati Italy 21 620 0.7× 416 0.6× 655 1.3× 134 0.9× 7 0.1× 112 1.1k
Mihail Nedjalkov Austria 16 579 0.7× 136 0.2× 620 1.2× 62 0.4× 10 0.1× 97 933
Sébastien Loranger Canada 18 580 0.7× 146 0.2× 837 1.7× 153 1.0× 7 0.1× 61 1.1k
Sudip Shekhar Canada 30 446 0.5× 488 0.7× 3.1k 6.1× 586 3.9× 59 0.6× 136 3.2k
Lars Zimmermann Germany 28 1.2k 1.4× 235 0.4× 3.0k 5.9× 298 2.0× 9 0.1× 264 3.1k
Cristian Bonato United Kingdom 19 1.0k 1.2× 798 1.2× 595 1.2× 142 0.9× 3 0.0× 39 1.7k
H. Avramopoulos Greece 31 1.3k 1.5× 287 0.4× 3.4k 6.8× 297 2.0× 16 0.2× 368 3.6k
F. J. Leonberger United States 22 1.1k 1.3× 57 0.1× 1.9k 3.8× 204 1.3× 13 0.1× 70 2.1k
Ivan Shubin United States 27 1.1k 1.3× 340 0.5× 2.4k 4.7× 217 1.4× 11 0.1× 106 2.6k

Countries citing papers authored by F. Beaudoin

Since Specialization
Citations

This map shows the geographic impact of F. Beaudoin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Beaudoin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Beaudoin more than expected).

Fields of papers citing papers by F. Beaudoin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Beaudoin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Beaudoin. The network helps show where F. Beaudoin may publish in the future.

Co-authorship network of co-authors of F. Beaudoin

This figure shows the co-authorship network connecting the top 25 collaborators of F. Beaudoin. A scholar is included among the top collaborators of F. Beaudoin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Beaudoin. F. Beaudoin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Beaudoin, F., et al.. (2024). Analysis and 3D TCAD simulations of single-qubit control in an industrially-compatible FD-SOI device. Solid-State Electronics. 215. 108883–108883. 1 indexed citations
2.
Beaudoin, F., et al.. (2024). Atomistic first-principles modeling of single donor spin-qubit. Applied Physics Letters. 125(18). 1 indexed citations
3.
Beaudoin, F., Chenyi Zhou, Julien Camirand Lemyre, et al.. (2023). Understanding conditions for the single electron regime in 28 nm FD-SOI quantum dots: Interpretation of experimental data with 3D quantum TCAD simulations. Solid-State Electronics. 204. 108626–108626. 4 indexed citations
4.
Beaudoin, F., et al.. (2022). Robust technology computer-aided design of gated quantum dots at cryogenic temperature. Applied Physics Letters. 120(26). 10 indexed citations
5.
Norris, Leigh, et al.. (2022). Frequency estimation under non-Markovian spatially correlated quantum noise. New Journal of Physics. 24(10). 103011–103011. 9 indexed citations
6.
Lüpke, Uwe von, F. Beaudoin, Leigh Norris, et al.. (2020). Two-Qubit Spectroscopy of Spatiotemporally Correlated Quantum Noise in Superconducting Qubits. PRX Quantum. 1(1). 58 indexed citations
7.
Sung, Youngkyu, F. Beaudoin, Leigh Norris, et al.. (2019). Non-Gaussian noise spectroscopy with a superconducting qubit sensor. Nature Communications. 10(1). 3715–3715. 61 indexed citations
8.
Paz-Silva, Gerardo A., Leigh Norris, F. Beaudoin, & Lorenza Viola. (2019). Extending comb-based spectral estimation to multiaxis quantum noise. Physical review. A. 100(4). 11 indexed citations
9.
Beaudoin, F., Dany Lachance-Quirion, W. A. Coish, & Michel Pioro-Ladrière. (2016). Coupling a single electron spin to a microwave resonator: controlling transverse and longitudinal couplings. Nanotechnology. 27(46). 464003–464003. 39 indexed citations
10.
Beaudoin, F., et al.. (2011). Challenges and Benefits of Product-Like SRAM in Technology Development. Proceedings - International Symposium for Testing and Failure Analysis. 38268. 362–366. 1 indexed citations
11.
Sabooni, Mahmood, F. Beaudoin, Andreas Walther, et al.. (2010). Storage and Recall of Weak Coherent Optical Pulses with an Efficiency of 25%. Physical Review Letters. 105(6). 60501–60501. 38 indexed citations
12.
Beaudoin, F., et al.. (2008). Electroluminescence microspectroscopy of silicon nanocrystals obtained by Si+ion implantation in SiO2. Nanotechnology. 19(46). 465702–465702. 6 indexed citations
13.
Beaudoin, F., et al.. (2008). A fully integrated tri-band, MIMO transceiver RFIC for 802.16e. 113–116. 10 indexed citations
14.
Beaudoin, F., et al.. (2005). Dynamic Laser Stimulation Case Studies. Microelectronics Reliability. 45(9-11). 1538–1543. 5 indexed citations
15.
16.
Lewis, D., et al.. (2003). Backside SC-OBIC using a pulsed NIR-laser and its application to fault location. 41. 193–195. 1 indexed citations
17.
Beaudoin, F., et al.. (2002). Backside Hot Spot Detection. Proceedings - International Symposium for Testing and Failure Analysis. 30774. 147–153. 1 indexed citations
18.
Beaudoin, F., et al.. (2002). IR confocal laser microscopy for MEMS Technological Evaluation. Microelectronics Reliability. 42(9-11). 1815–1817. 11 indexed citations
19.
Beaudoin, F., et al.. (2001). Modeling Thermal Laser Stimulation. Microelectronics Reliability. 41(9-10). 1477–1482. 12 indexed citations
20.
Meunier, Michel, Xiaoguang Wu, F. Beaudoin, E. Sacher, & M. Simard‐Normandin. (1999). <title>Excimer laser cleaning for microelectronics: modeling, applications, and challenges</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3618. 290–301. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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