T. E. Everhart
- Surfaces, Coatings and Films top 0.2%
- Electron and X-Ray Spectroscopy Techniques 30
- Structural Biology top 1%
- Advanced Electron Microscopy Techniques and Applications 5
- Radiation top 2%
- X-ray Spectroscopy and Fluorescence Analysis 4
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- Semiconductor materials and devices 15
- Advancements in Photolithography Techniques 10
- Integrated Circuits and Semiconductor Failure Analysis 7
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- Gyrotron and Vacuum Electronics Research 5
- Surface and Thin Film Phenomena 4
T. E. Everhart
48 papers receiving 1.9k citations
Hit Papers
Peers
Comparison fields: 5 of 124
- Surfaces, Coatings and Films 1.1k
- Structural Biology 216
- Nuclear Energy and Engineering 21
- Radiation 358
- Electrical and Electronic Engineering 1.3k
Countries citing papers authored by T. E. Everhart
This map shows the geographic impact of T. E. Everhart's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. E. Everhart with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. E. Everhart more than expected).
Fields of papers citing papers by T. E. Everhart
This network shows the impact of papers produced by T. E. Everhart. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. E. Everhart. The network helps show where T. E. Everhart may publish in the future.
Co-authorship network
The 25 scholars most cited alongside T. E. Everhart, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 8 | |
| 2 | 1996 | 5 | |
| 3 | 1981 | 8 | |
| 4 | 1979 | 14 | |
| 5 | 1978 | 23 | |
| 6 | 1978 | 10 | |
| 7 | 1978 | 27 | |
| 8 | 1977 | 110 | |
| 9 | 1976 | 38 | |
| 10 | 1975 | 43 | |
| 11 | 1974 | 7 | |
| 12 | 1974 | 209 | |
| 13 | 1969 | 2 | |
| 14 | 1969 | 2 | |
| 15 | Microwave Communications | 1968 | 15 |
| 16 | 1966 | 17 | |
| 17 | 1964 | 38 | |
| 18 | 1960 | 214 | |
| 19 | 1956 | 12 | |
| 20 | 1956 | 23 |
About T. E. Everhart
T. E. Everhart is a scholar working on Surfaces, Coatings and Films, Structural Biology, Radiation, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics, having authored 50 papers that have together received 2.2k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (30 papers), Semiconductor materials and devices (15 papers), Advancements in Photolithography Techniques (10 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Gyrotron and Vacuum Electronics Research (5 papers), Advanced Electron Microscopy Techniques and Applications (5 papers), X-ray Spectroscopy and Fluorescence Analysis (4 papers) and Surface and Thin Film Phenomena (4 papers). The work is most often cited by research in Surfaces, Coatings and Films (1.1k citations), Structural Biology (216 citations), Nuclear Energy and Engineering (21 citations), Radiation (358 citations) and Electrical and Electronic Engineering (1.3k citations). T. E. Everhart has collaborated with scholars based in United States, United Kingdom and Japan. Frequent co-authors include M. S. Chung, R. Thornley, Ryōsuke Shimizu, Oliver C. Wells, Nick MacDonald, Thomas Hayes, I. Adesida, Ryuichi Shimizu, C.K. Birdsall and Takashi Ikuta. Their work appears in journals such as Journal of Applied Physics, Applied Physics Letters, Proceedings of the IEEE, IEEE Transactions on Electron Devices and Japanese Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.