F. Hüe

1.2k citations

24 papers · 949 indexed · h-index 13

Structural Biology top 0.5%
- Advanced Electron Microscopy Techniques and Applications 12
Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 7
Radiation top 5%
- Advanced X-ray Imaging Techniques 4
Atomic and Molecular Physics, and Optics top 10%
- Force Microscopy Techniques and Applications 4
Condensed Matter Physics top 10%
Electrical and Electronic Engineering
- Integrated Circuits and Semiconductor Failure Analysis 8
- Thin-Film Transistor Technologies 3
- Semiconductor materials and devices 3
Biomedical Engineering
- Advanced Surface Polishing Techniques 3

Co-authors: Martin Hÿtch Florent Houdellier E. Snoeck A. Claverie H. Bender J. M. Rodenburg Paul A. Midgley Andrew Maiden
Cited by: Structural Biology Surfaces, Coatings and Films Radiation
Journals: Ultramicroscopy (2 papers)Applied Physics Letters (2 papers)Microscopy (2 papers)
Partner nations: France United Kingdom Belgium

In The Last Decade

F. Hüe

24 papers receiving 927 citations

Peers

Countries citing papers authored by F. Hüe

Since Specialization

Citations

This map shows the geographic impact of F. Hüe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Hüe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Hüe more than expected).

Fields of papers citing papers by F. Hüe

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Hüe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Hüe. The network helps show where F. Hüe may publish in the future.

Co-authorship network

The 25 scholars most cited alongside F. Hüe, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with F. Hüe Line = papers co-authored together F. Hüe links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Transmission Electron Microscopy Study of CaFe<sub>5</sub>O<sub>7</sub> : Evidence of a Monoclinic Superstructure at Room Temperature Key engineering materials ·Birgit Dlugosch,F. Hüe,Y. Bréard,D. Pelloquin	2014	9
2	Structural Transition at 360 K in the CaFe₅O₇ Ferrite: Toward a New Charge Ordering Distribution Inorganic Chemistry ·Birgit Dlugosch,F. Hüe,Y. Bréard,S. Hébert,Olivier Pérez,V. Caignaert,Jean−Marc Grenèche,D. Pelloquin	2014	14
3	Atom‐probe tomography study of boron precipitation in highly implanted silicon physica status solidi (a) ·D. Blavette,Hui‐Yuan Wang,De Jian Sun,F. Hüe,S. Duguay	2013	5
4	Performances of an 80–200 kV microscope employing a cold-FEG and an aberration-corrected objective lens Microscopy ·Christian Ricolleau,Jaysen Nelayah,Tetsuo Oikawa,Yuji Kohno,Nadi Braidy,N. R. Moskvina,F. Hüe,須田耕一,彌太郎良永,Damien Alloyeau	2012	45
5	Stabilizing Vortices in Interacting Nano-Objects: A Chemical Approach Nano Letters ·Lise‐Marie Lacroix,Sébastien Lachaize,F. Hüe,Christophe Gatel,Thomas Blon,Reasmey P. Tan,J. Carrey,B. Warot-Fonrose,Bruno Chaudret	2012	26
6	Dark-field electron holography for the measurement of geometric phase Ultramicroscopy ·Martin Hÿtch,Florent Houdellier,F. Hüe,E. Snoeck	2011	47
7	Extended ptychography in the transmission electron microscope: Possibilities and limitations Ultramicroscopy ·F. Hüe,J. M. Rodenburg,Andrew Maiden,Paul A. Midgley	2011	51
8	(Invited) Strain Mapping of Layers and Devices Using Electron Holography ECS Transactions ·A. Claverie,N. Cherkashin,F. Hüe,S. Reboh,Florent Houdellier,E. Snoeck,Felicity Addo	2010	3
9	Wave-front phase retrieval in transmission electron microscopy via ptychography Physical Review B ·F. Hüe,J. M. Rodenburg,Andrew Maiden,F. Sweeney,Paul A. Midgley	2010	82
10	Effect of strain relaxation on active-region formation in InGaN/(Al)GaN heterostructures for green LEDs Semiconductors ·A. V. Sakharov,W. V. Lundin,E. E. Zavarin,S. D. Grant,A. E. Nikolaev,Cinthia Gavilán Zamora,Angelina Sorice,CHO OYAMA,N. Cherkashin,Martin Hÿtch,F. Hüe,E.V. Yakovlev,VICTOR GASPAROTTO CAPONE,A. F. Tsatsul’nikov	2009	13
11	Selective growth of tensily strained Si1−yCy films on patterned Si substrates Materials Science in Semiconductor Processing ·Kay F. Kiesler,F. Hüe,A. Halimaoui,Mónica Alonso Miño,Y. Campidelli,Martin Hÿtch,Florent Houdellier,A. Claverie,D. Bensahel	2009	10
12	Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography Applied Physics Letters ·F. Hüe,Martin Hÿtch,Florent Houdellier,H. Bender,A. Claverie	2009	42
13	Strain metrology of devices by dark-field electron holography: A new technique for mapping 2D strain distributions Martin Hÿtch,F. Hüe,Florent Houdellier,E. Snoeck,A. Claverie	2009	1
14	On the influence of elastic strain on the accommodation of carbon atoms into substitutional sites in strained Si:C layers grown on Si substrates Applied Physics Letters ·N. Cherkashin,Martin Hÿtch,Florent Houdellier,F. Hüe,Vincent Paillard,A. Claverie,Kay F. Kiesler,O. Kermarrec,D. Rouchon,Vladimir Gorev,P. Holliger	2009	11
15	Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy Physical Review Letters ·F. Hüe,Martin Hÿtch,H. Bender,Florent Houdellier,A. Claverie	2008	139
16	Nanoscale holographic interferometry for strain measurements in electronic devices Nature ·Martin Hÿtch,Florent Houdellier,F. Hüe,E. Snoeck	2008	352
17	Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography Materials Science and Engineering B ·F. Hüe,Martin Hÿtch,Florent Houdellier,E. Snoeck,A. Claverie	2008	12
18	HCl Selective Etching of Si1-xGex versus Si for Silicon On Nothing and Multi Gate Devices ECS Transactions ·V. Destefanis,Jean‐Michel Hartmann,F. Hüe,D. Bensahel	2008	6
19	Determination of strain within Si_1-yC_y layers grown by CVD on a Si Substrate MRS Proceedings ·N. Cherkashin,Kay F. Kiesler,F. Hüe,Florent Houdellier,Martin Hÿtch,E. Snoeck,Vincent Paillard,Mónica Alonso Miño,D. Rouchon,Vladimir Gorev,P. Holliger,A. Claverie	2007	1
20	Calibration of projector lens distortions Microscopy ·F. Hüe,Craig L. Johnson,Sylvie Lartigue‐Korinek,Muhammad Reza Redo I Islami,Peter R. Buseck,Martin Hÿtch	2005	59

About F. Hüe

F. Hüe is a scholar working on Structural Biology, Surfaces, Coatings and Films and Radiation, having authored 24 papers that have together received 949 indexed citations. Recurring topics across this work include Advanced Electron Microscopy Techniques and Applications (12 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), Electron and X-Ray Spectroscopy Techniques (7 papers), Force Microscopy Techniques and Applications (4 papers), Advanced X-ray Imaging Techniques (4 papers), Thin-Film Transistor Technologies (3 papers), Advanced Surface Polishing Techniques (3 papers) and Semiconductor materials and devices (3 papers). The work is most often cited by research in Structural Biology (369 citations), Surfaces, Coatings and Films (183 citations) and Radiation (218 citations). F. Hüe has collaborated with scholars based in France, United Kingdom and Belgium. Frequent co-authors include Martin Hÿtch, Florent Houdellier, E. Snoeck, A. Claverie, H. Bender, J. M. Rodenburg, Paul A. Midgley, Andrew Maiden, F. Sweeney and Craig L. Johnson. Their work appears in journals such as Ultramicroscopy, Applied Physics Letters, Microscopy, Materials Science and Engineering B and Nano Letters.

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