D. D. Perovic

1.1k citations

33 papers · 908 indexed · h-index 16

Structural Biology top 1%
- Advanced Electron Microscopy Techniques and Applications 6
Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 10
Atomic and Molecular Physics, and Optics top 5%
- Semiconductor materials and interfaces 12
- Semiconductor Quantum Structures and Devices 9
Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices 10
- Silicon and Solar Cell Technologies 8
- Thin-Film Transistor Technologies 3
Materials Chemistry
- Silicon Nanostructures and Photoluminescence 10

Co-authors: D. C. Houghton A. Howie G. C. Weatherly Martin R. Castell C. J. Rossouw J.‐M. Baribeau C. Lavoie T. Tiedje
Cited by: Structural Biology Surfaces, Coatings and Films Atomic and Molecular Physics, and Optics
Journals: Applied Physics Letters (4 papers)Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties (2 papers)Ultramicroscopy (2 papers)
Partner nations: Canada United Kingdom United States

In The Last Decade

D. D. Perovic

33 papers receiving 881 citations

Peers

Countries citing papers authored by D. D. Perovic

Since Specialization

Citations

This map shows the geographic impact of D. D. Perovic's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. D. Perovic with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. D. Perovic more than expected).

Fields of papers citing papers by D. D. Perovic

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. D. Perovic. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. D. Perovic. The network helps show where D. D. Perovic may publish in the future.

Co-authorship network

The 25 scholars most cited alongside D. D. Perovic, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D. D. Perovic Line = papers co-authored together D. D. Perovic links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Scanning tunneling spectroscopy under pulsed spin injection Applied Physics Letters ·Joseph H. Ngai,Yu‐Chih Tseng,W TJALMA,Vlad Pribiag,J. Y. T. Wei,F. Chen,D. D. Perovic	2004	8
2	Compositional control in molecular beam epitaxy growth of GaNyAs1−y on GaAs (001) using an Ar/N2 RF plasma Journal of Crystal Growth ·J. A. Gupta,Z. R. Wasilewski,A.Y. FINLY,凡斯,G. C. Aers,Robin L. Williams,G. I. Sproule,A. Perovic,D. D. Perovic,Jamila Osman,A. J. SpringThorpe	2002	21
3	Equilibrium shape of CoSi2 hut clusters on Si(100) Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Sywert Brongersma,Martin R. Castell,D. D. Perovic,M. Zinke-Allmang	1998	3
4	Stress-Induced Shape Transition ofCoSi2Clusters on Si(100) Physical Review Letters ·Sywert Brongersma,Martin R. Castell,D. D. Perovic,M. Zinke-Allmang	1998	77
5	Structural characterization of a UHV/CVD-grown SiGe HBT with graded base Thin Solid Films ·M. Dion,D. C. Houghton,N. L. Rowell,D. D. Perovic,G. C. Aers,S. Rolfe,G. I. Sproule,J. Phillips	1998	2
6	Mapping electrically active dopant profiles by field-emission scanning electron microscopy Applied Physics Letters ·Raşit Turan,D. D. Perovic,W. H. Morris‐Jones	1996	43
7	Si_1-xGe_x Critical Thickness for Surface Wave Generation During UHV-CVD Growth at 525°C MRS Proceedings ·H. Lafontaine,D. C. Houghton,Albert Norden,D. D. Perovic,J.‐M. Baribeau	1995	4
8	Topographical, compositional, and dopant contrast from cleavage surfaces of GaAs-AlxGa1-xAs superlattices Oxford University Research Archive (ORA) (University of Oxford) ·Megan A. Hackman,D. D. Perovic,A. Howie,D. A. Ritchie,C. Lavoie,T. Tiedje	1995	3
9	Growth and band gap of strained 〈110〉 Si1−xGex layers on silicon substrates by chemical vapor deposition Applied Physics Letters ·C. W. Liu,James C. Sturm,Y. Lacroix,M. L. W. Thewalt,D. D. Perovic	1994	23
10	Imaging elastic strains in high-angle annular dark field scanning transmission electron microscopy Ultramicroscopy ·D. D. Perovic,C. J. Rossouw,A. Howie	1993	128
11	On the image contrast from dislocations in high-angle annular dark-field scanning transmission electron microscopy Philosophical Magazine Letters ·D. D. Perovic,A. Howie,C. J. Rossouw	1993	17
12	“Barrierless” Misfit Dislocation Nucleation in SiGe/Si Strained Layer Epitaxy MRS Proceedings ·D. D. Perovic,D. C. Houghton	1992	14
13	Microvoid formation in low-temperature molecular-beam-epitaxy-grown silicon Physical review. B, Condensed matter ·D. D. Perovic,G. C. Weatherly,P. J. Simpson,Peter J. Schultz,T. E. Jackman,G. C. Aers,J.-P. Noël,D. C. Houghton	1991	40
14	Electron microscopy study of microvoid generation in molecular-beam epitaxy-grown silicon Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·D. D. Perovic,G. C. Weatherly,J.-P. Noël,D. C. Houghton	1991	16
15	Electrical and Optical Properties of Erbium in MBE Silicon and Si/Ge Alloys MRS Proceedings ·Hasan Efeoğlu,J.H. Evans,Jerzy M. Langer,А. R. Peaker,N. L. Rowell,R. R. Ernst,D. D. Perovic,T. E. Jackman,D. C. Houghton	1991	5
16	Evidence for void formation in MBE-grown silicon AIP conference proceedings ·P. J. Simpson,Peter J. Schultz,T. E. Jackman,G. C. Aers,J.-P. Noël,D. C. Houghton,D. D. Perovic,G. C. Weatherly	1991	3
17	High-angle annular dark-field STEM imaging of doped semiconductor layers Proceedings annual meeting Electron Microscopy Society of America ·D. D. Perovic,Lipika Bardhan	1991	1
18	Photoluminescence from Coherently Strained Si_1−xGe_x Alloys MRS Proceedings ·N. L. Rowell,J.-P. Noël,D. C. Houghton,D. D. Perovic	1990	1
19	Misfit Dislocation Nucleation and Interactions at Ge_xSi_1-x/Si Interfaces MRS Proceedings ·D. D. Perovic,G. C. Weatherly,D. C. Houghton	1989	6
20	Transmission electron microscopy of elastic relaxation effects in Si–Ge strained layer superlattice structures Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·D. D. Perovic,G. C. Weatherly,D. C. Houghton	1988	10

About D. D. Perovic

D. D. Perovic is a scholar working on Structural Biology, Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Fluid Flow and Transfer Processes, having authored 33 papers that have together received 908 indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (12 papers), Electron and X-Ray Spectroscopy Techniques (10 papers), Semiconductor materials and devices (10 papers), Silicon Nanostructures and Photoluminescence (10 papers), Semiconductor Quantum Structures and Devices (9 papers), Silicon and Solar Cell Technologies (8 papers), Advanced Electron Microscopy Techniques and Applications (6 papers) and Thin-Film Transistor Technologies (3 papers). The work is most often cited by research in Structural Biology (173 citations), Surfaces, Coatings and Films (227 citations), Atomic and Molecular Physics, and Optics (387 citations), Electrical and Electronic Engineering (550 citations) and Materials Chemistry (298 citations). D. D. Perovic has collaborated with scholars based in Canada, United Kingdom and United States. Frequent co-authors include D. C. Houghton, A. Howie, G. C. Weatherly, Martin R. Castell, C. J. Rossouw, J.‐M. Baribeau, C. Lavoie, T. Tiedje, Cesare A. Hall and M. Zinke-Allmang. Their work appears in journals such as Applied Physics Letters, Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, Ultramicroscopy, Philosophical Magazine Letters and Thin Solid Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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