David C. Joy
- Structural Biology top 0.02%
- Advanced Electron Microscopy Techniques and Applications 84
- Surfaces, Coatings and Films top 0.02%
- Electron and X-Ray Spectroscopy Techniques 211
- Molecular Medicine top 0.2%
- Radiation top 0.2%
- X-ray Spectroscopy and Fluorescence Analysis 39
- Materials Chemistry top 1%
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- Advancements in Photolithography Techniques 80
- Integrated Circuits and Semiconductor Failure Analysis 30
- Semiconductor materials and devices 27
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- Advanced Materials Characterization Techniques 22
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- Ion-surface interactions and analysis 20
- Co-authors
- Joseph I. GoldsteinDale E. NewburyPatrick EchlinJoseph R. MichaelEric LifshinJ. J. HrenCharles E. FioriP. Srinivas
- Journals
- Microscopy and Microanalysis (28 papers)Journal of Microscopy (17 papers)Ultramicroscopy (12 papers)
- Partner nations
- United StatesUnited KingdomAustralia
In The Last Decade
David C. Joy
275 papers receiving 13.5k citations
Hit Papers
Peers
Comparison fields: 5 of 196
- Structural Biology 1.8k
- Surfaces, Coatings and Films 4.6k
- Molecular Medicine 969
- Radiation 1.5k
- Materials Chemistry 4.0k
Countries citing papers authored by David C. Joy
This map shows the geographic impact of David C. Joy's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David C. Joy with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David C. Joy more than expected).
Fields of papers citing papers by David C. Joy
This network shows the impact of papers produced by David C. Joy. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David C. Joy. The network helps show where David C. Joy may publish in the future.
Co-authorship network
The 25 scholars most cited alongside David C. Joy, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2024 | 1 | |
| 3 | 2015 | 1 | |
| 4 | Miniature Scanning Electron Microscope for In-Situ Planetary Studies: Electron Gun Development | 2009 | 4 |
| 5 | 2009 | 102 | |
| 6 | Fluorescence yields: a new parameterization | 2007 | 4 |
| 7 | 2007 | 15 | |
| 8 | Low Voltage Electron Beam Lithography in PMMA | 2004 | 2 |
| 9 | 2004 | 2 | |
| 10 | 2004 | 43 | |
| 11 | 2003 | 11 | |
| 12 | 2002 | 80 | |
| 13 | 1998 | 14 | |
| 14 | Experimental Measurements of Electron Stopping Power at Low Energies | 1996 | 23 |
| 15 | 1994 | 2 | |
| 16 | Optimization of Electron Optics for Low Voltage Scanning Electron Microscopy | 1992 | 2 |
| 17 | Calibration of Atomic Force Microscope Tips Using Biomolecules | 1992 | 24 |
| 18 | An introduction to Monte Carlo simulations | 1991 | 66 |
| 19 | Image Simulation for Secondary Electron Micrographs in the Scanning Electron Microscope | 1987 | 1 |
| 20 | Microelectronics Dimensional Metrology in the Scanning Electron Microscope, Part II | 1986 | 3 |
About David C. Joy
David C. Joy is a scholar working on Structural Biology, Surfaces, Coatings and Films and Radiation, having authored 293 papers that have together received 14.2k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (211 papers), Advanced Electron Microscopy Techniques and Applications (84 papers), Advancements in Photolithography Techniques (80 papers), X-ray Spectroscopy and Fluorescence Analysis (39 papers), Integrated Circuits and Semiconductor Failure Analysis (30 papers), Semiconductor materials and devices (27 papers), Advanced Materials Characterization Techniques (22 papers) and Ion-surface interactions and analysis (20 papers). The work is most often cited by research in Structural Biology (1.8k citations), Surfaces, Coatings and Films (4.6k citations) and Molecular Medicine (969 citations). David C. Joy has collaborated with scholars based in United States, United Kingdom and Australia. Frequent co-authors include Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, Joseph R. Michael, Eric Lifshin, J. J. Hren, Charles E. Fiori, P. Srinivas, R. Rajendran and Muhammed Majeed. Their work appears in journals such as Microscopy and Microanalysis, Journal of Microscopy, Ultramicroscopy, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.