Marc French

599 total citations
16 papers, 522 citations indexed

About

Marc French is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Marc French has authored 16 papers receiving a total of 522 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 8 papers in Electronic, Optical and Magnetic Materials and 6 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Marc French's work include Semiconductor materials and devices (15 papers), Copper Interconnects and Reliability (7 papers) and Semiconductor materials and interfaces (6 papers). Marc French is often cited by papers focused on Semiconductor materials and devices (15 papers), Copper Interconnects and Reliability (7 papers) and Semiconductor materials and interfaces (6 papers). Marc French collaborates with scholars based in United States. Marc French's co-authors include Sean W. King, Jeff Bielefeld, W. A. Lanford, Markus Kühn, Benjamin French, Milt Jaehnig, Patrick Henry, B. I. Boyanov, Sanjay K. Banerjee and Anthony N. Caruso and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

Marc French

16 papers receiving 520 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Marc French United States	13	400	257	198	97	95	16	522
L.G. Gosset France	12	445 1.1×	209 0.8×	187 0.9×	63 0.6×	65 0.7×	37	508
Syun‐Ming Jang Taiwan	15	374 0.9×	127 0.5×	176 0.9×	111 1.1×	108 1.1×	23	434
F. Fillot France	13	613 1.5×	510 2.0×	129 0.7×	65 0.7×	65 0.7×	38	738
N. Lustig United States	12	419 1.0×	193 0.8×	146 0.7×	48 0.5×	104 1.1×	28	529
M. C. Hugon France	13	420 1.1×	305 1.2×	89 0.4×	232 2.4×	74 0.8×	52	537
H. Shinriki Japan	10	587 1.5×	253 1.0×	244 1.2×	132 1.4×	68 0.7×	27	628
Sebastião Gomes dos Santos Filho Brazil	10	312 0.8×	162 0.6×	53 0.3×	45 0.5×	61 0.6×	62	424
Mao‐Chieh Chen Taiwan	17	608 1.5×	164 0.6×	413 2.1×	221 2.3×	177 1.9×	61	717
Wook Bahng South Korea	15	732 1.8×	183 0.7×	159 0.8×	25 0.3×	147 1.5×	96	790
K. A. Ellis United States	10	263 0.7×	143 0.6×	141 0.7×	45 0.5×	137 1.4×	18	415

Countries citing papers authored by Marc French

Since Specialization

Citations

This map shows the geographic impact of Marc French's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Marc French with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Marc French more than expected).

Fields of papers citing papers by Marc French

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Marc French. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Marc French. The network helps show where Marc French may publish in the future.

Co-authorship network of co-authors of Marc French

This figure shows the co-authorship network connecting the top 25 collaborators of Marc French. A scholar is included among the top collaborators of Marc French based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Marc French. Marc French is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

16 of 16 papers shown

Gaskins, John T., Patrick E. Hopkins, Devin R. Merrill, et al.. (2017). Review—Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High-kDielectrics: Beryllium Oxide, Aluminum Oxide, Hafnium Oxide, and Aluminum Nitride. ECS Journal of Solid State Science and Technology. 6(10). N189–N208. 92 indexed citations

Cochrane, Corey J., Patrick M. Lenahan, Xin Liu, et al.. (2016). Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability. Microelectronics Reliability. 63. 201–213. 18 indexed citations

King, Sean W., Michelle M. Paquette, Anthony N. Caruso, et al.. (2014). Valence and conduction band offsets at amorphous hexagonal boron nitride interfaces with silicon network dielectrics. Applied Physics Letters. 104(10). 18 indexed citations

Koh, Donghyi, J. Yum, Sanjay K. Banerjee, et al.. (2014). Investigation of atomic layer deposited beryllium oxide material properties for high-k dielectric applications. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 32(3). 23 indexed citations

Prakash, Adithya, et al.. (2014). Investigation of the Dielectric and Mechanical Properties for Magnetron Sputtered BCN Thin Films. ECS Journal of Solid State Science and Technology. 4(1). N3122–N3126. 24 indexed citations

King, Sean W., Justin Brockman, Marc French, et al.. (2014). Valence and conduction band offsets at low-k a-SiOxCy:H/a-SiCxNy:H interfaces. Journal of Applied Physics. 116(11). 10 indexed citations

King, Sean W., Marc French, Benjamin French, et al.. (2013). Valence band offset and Schottky barrier at amorphous boron and boron carbide interfaces with silicon and copper. Applied Surface Science. 285. 545–551. 13 indexed citations

King, Sean W., Marc French, Jeff Bielefeld, et al.. (2012). Valence band offset at the amorphous hydrogenated boron nitride-silicon (100) interface. Applied Physics Letters. 101(4). 42903–42903. 15 indexed citations

King, Sean W., John V. Kelly, Marc French, et al.. (2012). Film Property Requirements for Hermetic Low-k a-SiO_xC_yN_z:H Dielectric Barriers. ECS Journal of Solid State Science and Technology. 1(6). N115–N122. 56 indexed citations

10.

King, Sean W., Marc French, Milt Jaehnig, Markus Kühn, & Guofeng Xu. (2012). Valence Band Offset at a-B:H and a-BP:H/Si Interfaces. ECS Journal of Solid State Science and Technology. 1(5). P250–P253. 8 indexed citations

11.

King, Sean W., Marc French, Milt Jaehnig, Markus Kühn, & Benjamin French. (2011). X-ray photoelectron spectroscopy investigation of the Schottky barrier at low-k a-SiO(C):H/Cu interfaces. Applied Physics Letters. 99(20). 34 indexed citations

12.

King, Sean W., Marc French, Jeff Bielefeld, & W. A. Lanford. (2011). Fourier transform infrared spectroscopy investigation of chemical bonding in low-k a-SiC:H thin films. Journal of Non-Crystalline Solids. 357(15). 2970–2983. 90 indexed citations

13.

King, Sean W., Marc French, Milt Jaehnig, et al.. (2011). X-ray photoelectron spectroscopy measurement of the Schottky barrier at the SiC(N)/Cu interface. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 29(5). 48 indexed citations

14.

King, Sean W., Jeff Bielefeld, Marc French, & W. A. Lanford. (2011). Mass and bond density measurements for PECVD a-SiCx:H thin films using Fourier transform-infrared spectroscopy. Journal of Non-Crystalline Solids. 357(21). 3602–3615. 50 indexed citations

15.

King, Sean W., Marc French, Jeff Bielefeld, et al.. (2011). X-ray Photoelectron Spectroscopy Investigation of the Schottky Barrier at a-BN:H∕Cu Interfaces. Electrochemical and Solid-State Letters. 14(12). H478–H478. 22 indexed citations

16.

French, Marc, et al.. (2004). Application of TXRF for ion implanter dose matching experiments. Applied Surface Science. 231-232. 734–737. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact