Milt Jaehnig

743 total citations · 1 hit paper
9 papers, 675 citations indexed

About

Milt Jaehnig is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Milt Jaehnig has authored 9 papers receiving a total of 675 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Electrical and Electronic Engineering, 5 papers in Materials Chemistry and 4 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Milt Jaehnig's work include Semiconductor materials and devices (8 papers), Semiconductor materials and interfaces (4 papers) and Copper Interconnects and Reliability (3 papers). Milt Jaehnig is often cited by papers focused on Semiconductor materials and devices (8 papers), Semiconductor materials and interfaces (4 papers) and Copper Interconnects and Reliability (3 papers). Milt Jaehnig collaborates with scholars based in United States and Germany. Milt Jaehnig's co-authors include Katherine M. Phillips, G. Rocker, J. Schäfer, W. Göpel, Daniel Frankel, J. Anderson, Markus Kühn, Sean W. King, Marc French and Benjamin French and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

Milt Jaehnig

9 papers receiving 658 citations

Hit Papers

1 papers align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Surface defects of TiO2(110): A combined XPS, XAES AND ELS study

1984 524 citations W. Göpel, J. Anderson et al. Surface Science profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Milt Jaehnig United States	8	474	300	192	97	80	9	675
Rongguang Zeng China	14	542 1.1×	558 1.9×	209 1.1×	70 0.7×	141 1.8×	43	920
Aleksei S. Konashuk Russia	11	379 0.8×	370 1.2×	82 0.4×	113 1.2×	39 0.5×	30	668
Guo‐zhen Zhu Canada	13	470 1.0×	274 0.9×	141 0.7×	135 1.4×	35 0.4×	60	924
Paul W. Wang United States	15	447 0.9×	263 0.9×	62 0.3×	134 1.4×	42 0.5×	41	702
Nataliya Nabatova-Gabain Japan	8	361 0.8×	236 0.8×	236 1.2×	60 0.6×	26 0.3×	16	556
M. R. Mohammadizadeh Iran	22	616 1.3×	244 0.8×	330 1.7×	263 2.7×	92 1.1×	74	1.2k
G.G. Tepehan Türkiye	14	350 0.7×	318 1.1×	124 0.6×	77 0.8×	53 0.7×	39	602
C. Ottermann Germany	14	451 1.0×	438 1.5×	131 0.7×	106 1.1×	56 0.7×	33	784
J. A. Kelber United States	16	368 0.8×	385 1.3×	71 0.4×	150 1.5×	48 0.6×	36	636
L. Imhoff France	17	527 1.1×	344 1.1×	187 1.0×	79 0.8×	31 0.4×	55	775

Countries citing papers authored by Milt Jaehnig

Since Specialization

Citations

This map shows the geographic impact of Milt Jaehnig's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Milt Jaehnig with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Milt Jaehnig more than expected).

Fields of papers citing papers by Milt Jaehnig

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Milt Jaehnig. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Milt Jaehnig. The network helps show where Milt Jaehnig may publish in the future.

Co-authorship network of co-authors of Milt Jaehnig

This figure shows the co-authorship network connecting the top 25 collaborators of Milt Jaehnig. A scholar is included among the top collaborators of Milt Jaehnig based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Milt Jaehnig. Milt Jaehnig is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

9 of 9 papers shown

1.

King, Sean W., Justin Brockman, Marc French, et al.. (2014). Valence and conduction band offsets at low-k a-SiOxCy:H/a-SiCxNy:H interfaces. Journal of Applied Physics. 116(11). 10 indexed citations

2.

King, Sean W., Marc French, Benjamin French, et al.. (2013). Valence band offset and Schottky barrier at amorphous boron and boron carbide interfaces with silicon and copper. Applied Surface Science. 285. 545–551. 13 indexed citations

3.

King, Sean W., Marc French, Jeff Bielefeld, et al.. (2012). Valence band offset at the amorphous hydrogenated boron nitride-silicon (100) interface. Applied Physics Letters. 101(4). 42903–42903. 15 indexed citations

4.

King, Sean W., Marc French, Milt Jaehnig, Markus Kühn, & Guofeng Xu. (2012). Valence Band Offset at a-B:H and a-BP:H/Si Interfaces. ECS Journal of Solid State Science and Technology. 1(5). P250–P253. 8 indexed citations

5.

King, Sean W., Marc French, Milt Jaehnig, Markus Kühn, & Benjamin French. (2011). X-ray photoelectron spectroscopy investigation of the Schottky barrier at low-k a-SiO(C):H/Cu interfaces. Applied Physics Letters. 99(20). 34 indexed citations

6.

King, Sean W., Marc French, Milt Jaehnig, et al.. (2011). X-ray photoelectron spectroscopy measurement of the Schottky barrier at the SiC(N)/Cu interface. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 29(5). 48 indexed citations

7.

King, Sean W., Marc French, Jeff Bielefeld, et al.. (2011). X-ray Photoelectron Spectroscopy Investigation of the Schottky Barrier at a-BN:H∕Cu Interfaces. Electrochemical and Solid-State Letters. 14(12). H478–H478. 22 indexed citations

8.

Göpel, W., J. Anderson, Daniel Frankel, et al.. (1984). Surface deffects of TiO2(110): a combined XPS, XAES and ELS study. Surface Science Letters. 139(2-3). A129–A129. 1 indexed citations

9.

Göpel, W., J. Anderson, Daniel Frankel, et al.. (1984). Surface defects of TiO2(110): A combined XPS, XAES AND ELS study. Surface Science. 139(2-3). 333–346. 524 indexed citations breakdown →

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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