Benjamin French
- Electrical and Electronic Engineering top 10%
- Materials Chemistry
- Electronic, Optical and Magnetic Materials top 10%
- Atomic and Molecular Physics, and Optics
- Mechanics of Materials
- Co-authors
- Sean W. KingMarkus KühnMarc FrenchMilt JaehnigM. VosBrian C. HollowayMingyao ZhuJohn F. Conley
- Topics
- Semiconductor materials and devices (15 papers)Copper Interconnects and Reliability (6 papers)Semiconductor materials and interfaces (4 papers)
- Cited by
- Electronic, Optical and Magnetic MaterialsElectrical and Electronic EngineeringMaterials Chemistry
- Partner nations
- United StatesJapanAustralia
In The Last Decade
Benjamin French
25 papers receiving 519 citations
Peers
Comparison fields: 5 of 38
- Electrical and Electronic Engineering 366
- Materials Chemistry 260
- Electronic, Optical and Magnetic Materials 181
- Atomic and Molecular Physics, and Optics 88
- Mechanics of Materials 64
Countries citing papers authored by Benjamin French
This map shows the geographic impact of Benjamin French's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Benjamin French with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Benjamin French more than expected).
Fields of papers citing papers by Benjamin French
This network shows the impact of papers produced by Benjamin French. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Benjamin French. The network helps show where Benjamin French may publish in the future.
Co-authorship network of co-authors of Benjamin French
This figure shows the co-authorship network connecting the top 25 collaborators of Benjamin French. A scholar is included among the top collaborators of Benjamin French based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Benjamin French. Benjamin French is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 5 | |
| 3 | 6 | |
| 4 | 18 | |
| 5 | 51 | |
| 6 | 13 | |
| 7 | 18 | |
| 8 | 23 | |
| 9 | 74 | |
| 10 | 10 | |
| 11 | 27 | |
| 12 | 44 | |
| 13 | 13 | |
| 14 | 15 | |
| 15 | 34 | |
| 16 | 22 | |
| 17 | 2 | |
| 18 | 29 | |
| 19 | 34 | |
| 20 | 16 |
About Benjamin French
Benjamin French is a scholar working on Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials and Electrical and Electronic Engineering, having authored 25 papers that have together received 527 indexed citations. Recurring topics across this work include Semiconductor materials and devices (15 papers), Copper Interconnects and Reliability (6 papers) and Semiconductor materials and interfaces (4 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (181 citations), Electrical and Electronic Engineering (366 citations) and Materials Chemistry (260 citations). Benjamin French has collaborated with scholars based in United States, Japan and Australia. Frequent co-authors include Sean W. King, Markus Kühn, Marc French, Milt Jaehnig, M. Vos, Brian C. Holloway, Mingyao Zhu, John F. Conley, Nasir Alimardani and Cheng Tan. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Chemistry of Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.