Benjamin French

617 total citations
25 papers, 527 citations indexed

About

Benjamin French is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Benjamin French has authored 25 papers receiving a total of 527 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 13 papers in Materials Chemistry and 7 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Benjamin French's work include Semiconductor materials and devices (15 papers), Copper Interconnects and Reliability (6 papers) and Semiconductor materials and interfaces (4 papers). Benjamin French is often cited by papers focused on Semiconductor materials and devices (15 papers), Copper Interconnects and Reliability (6 papers) and Semiconductor materials and interfaces (4 papers). Benjamin French collaborates with scholars based in United States, Japan and Australia. Benjamin French's co-authors include Sean W. King, Markus Kühn, Marc French, Milt Jaehnig, M. Vos, Brian C. Holloway, Mingyao Zhu, Nasir Alimardani, Cheng Tan and John F. Conley and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Chemistry of Materials.

In The Last Decade

Benjamin French

25 papers receiving 519 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Benjamin French United States 15 366 260 181 88 64 25 527
V. G. Polovinkin Russia 7 334 0.9× 261 1.0× 263 1.5× 89 1.0× 110 1.7× 32 568
Jinhee Kwon United States 12 471 1.3× 359 1.4× 107 0.6× 81 0.9× 68 1.1× 24 630
G. Pavia Italy 12 495 1.4× 358 1.4× 89 0.5× 127 1.4× 33 0.5× 46 658
A. Bouabellou Algeria 10 247 0.7× 247 0.9× 98 0.5× 139 1.6× 31 0.5× 58 418
T. P. Smirnova Russia 15 477 1.3× 460 1.8× 65 0.4× 69 0.8× 100 1.6× 54 672
Masahiro Kunisu Japan 9 208 0.6× 390 1.5× 131 0.7× 46 0.5× 36 0.6× 17 523
F. Pierre France 11 214 0.6× 183 0.7× 83 0.5× 151 1.7× 33 0.5× 43 412
A.A. Wronkowska Poland 12 232 0.6× 154 0.6× 72 0.4× 120 1.4× 51 0.8× 38 378
C. W. Pao Taiwan 16 170 0.5× 407 1.6× 107 0.6× 32 0.4× 63 1.0× 31 496

Countries citing papers authored by Benjamin French

Since Specialization
Citations

This map shows the geographic impact of Benjamin French's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Benjamin French with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Benjamin French more than expected).

Fields of papers citing papers by Benjamin French

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Benjamin French. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Benjamin French. The network helps show where Benjamin French may publish in the future.

Co-authorship network of co-authors of Benjamin French

This figure shows the co-authorship network connecting the top 25 collaborators of Benjamin French. A scholar is included among the top collaborators of Benjamin French based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Benjamin French. Benjamin French is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Strand, Christopher L., et al.. (2022). A laser-absorption sensor for in situ detection of biofuel blend vapor in engine intakes. Proceedings of the Combustion Institute. 39(1). 1307–1316. 5 indexed citations
3.
Strand, Christopher L., et al.. (2021). An In Situ Laser-Absorption Sensor for Crank Angle-Resolved Temperature, Pressure, and Humidity in Intake-Runner Flows. SAE International Journal of Engines. 14(4). 551–567. 6 indexed citations
4.
Cochrane, Corey J., Patrick M. Lenahan, Xin Liu, et al.. (2016). Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability. Microelectronics Reliability. 63. 201–213. 18 indexed citations
5.
Vos, M., Sean W. King, & Benjamin French. (2016). Measurement of the band gap by reflection electron energy loss spectroscopy. Journal of Electron Spectroscopy and Related Phenomena. 212. 74–80. 51 indexed citations
6.
DiStefano, Jennifer G., Yu‐Chuan Lin, Joshua A. Robinson, et al.. (2015). Band Alignment at Molybdenum Disulphide/Boron Nitride/Aluminum Oxide Interfaces. Journal of Electronic Materials. 45(2). 983–988. 13 indexed citations
7.
King, Sean W., Michelle M. Paquette, Anthony N. Caruso, et al.. (2014). Valence and conduction band offsets at amorphous hexagonal boron nitride interfaces with silicon network dielectrics. Applied Physics Letters. 104(10). 18 indexed citations
8.
Koh, Donghyi, J. Yum, Sanjay K. Banerjee, et al.. (2014). Investigation of atomic layer deposited beryllium oxide material properties for high-k dielectric applications. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 32(3). 23 indexed citations
9.
Alimardani, Nasir, et al.. (2014). Investigation of the impact of insulator material on the performance of dissimilar electrode metal-insulator-metal diodes. Journal of Applied Physics. 116(2). 74 indexed citations
10.
French, Benjamin & Sean W. King. (2013). Detection of surface electronic defect states in low and high-k dielectrics using reflection electron energy loss spectroscopy. Journal of materials research/Pratt's guide to venture capital sources. 28(20). 2771–2784. 27 indexed citations
11.
King, Sean W., et al.. (2013). Detection of defect states in low-k dielectrics using reflection electron energy loss spectroscopy. Journal of Applied Physics. 113(4). 44 indexed citations
12.
King, Sean W., Marc French, Benjamin French, et al.. (2013). Valence band offset and Schottky barrier at amorphous boron and boron carbide interfaces with silicon and copper. Applied Surface Science. 285. 545–551. 13 indexed citations
13.
King, Sean W., Marc French, Jeff Bielefeld, et al.. (2012). Valence band offset at the amorphous hydrogenated boron nitride-silicon (100) interface. Applied Physics Letters. 101(4). 42903–42903. 15 indexed citations
14.
King, Sean W., Marc French, Milt Jaehnig, Markus Kühn, & Benjamin French. (2011). X-ray photoelectron spectroscopy investigation of the Schottky barrier at low-k a-SiO(C):H/Cu interfaces. Applied Physics Letters. 99(20). 34 indexed citations
15.
King, Sean W., Marc French, Milt Jaehnig, et al.. (2011). X-ray photoelectron spectroscopy measurement of the Schottky barrier at the SiC(N)/Cu interface. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 29(5). 48 indexed citations
16.
French, Benjamin, et al.. (2005). Investigation of the fracture toughness of radio frequency magnetron sputtered Al–Cu–Fe films via white-beam synchrotron radiography/topography. Journal of Physics D Applied Physics. 38(10A). A44–A49. 2 indexed citations
17.
French, Benjamin, et al.. (2005). Structural characterization of carbon nanosheets via x-ray scattering. Journal of Applied Physics. 97(11). 34 indexed citations
18.
French, Benjamin, et al.. (2005). Palladium−Polyimide Nanocomposite Membranes:  Synthesis and Characterization of Reflective and Electrically Conductive Surface-Metallized Films. Chemistry of Materials. 17(8). 2091–2100. 19 indexed citations
19.
French, Benjamin, et al.. (2005). Evolution of structure and morphology during plasma-enhanced chemical vapor deposition of carbon nanosheets. Thin Solid Films. 494(1-2). 105–109. 29 indexed citations
20.
French, Benjamin & J. C. Bilello. (2003). In situ observations of the real-time stress-evolution and delamination of thin Ta films on Si(100). Thin Solid Films. 446(1). 91–98. 16 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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