M. W. Geis

7.9k total citations
152 papers, 5.8k citations indexed

About

M. W. Geis is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, M. W. Geis has authored 152 papers receiving a total of 5.8k indexed citations (citations by other indexed papers that have themselves been cited), including 115 papers in Electrical and Electronic Engineering, 80 papers in Materials Chemistry and 34 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in M. W. Geis's work include Diamond and Carbon-based Materials Research (42 papers), Semiconductor materials and devices (40 papers) and Thin-Film Transistor Technologies (38 papers). M. W. Geis is often cited by papers focused on Diamond and Carbon-based Materials Research (42 papers), Semiconductor materials and devices (40 papers) and Thin-Film Transistor Technologies (38 papers). M. W. Geis collaborates with scholars based in United States, Germany and Israel. M. W. Geis's co-authors include T. M. Lyszczarz, Henry I. Smith, J.C. Twichell, N. N. Efremow, John C. C. Fan, B-Y. Tsaur, R. W. Mountain, D. C. Flanders, K. E. Krohn and S. J. Spector and has published in prestigious journals such as Nature, The Journal of Chemical Physics and Journal of Geophysical Research Atmospheres.

In The Last Decade

M. W. Geis

145 papers receiving 5.5k citations

Peers

M. W. Geis
Comparison fields: 5 of 82
  • Electrical and Electronic Engineering 3.8k
  • Materials Chemistry 3.3k
  • Atomic and Molecular Physics, and Optics 1.6k
  • Biomedical Engineering 951
  • Mechanics of Materials 938
Replace B.S. Meyerson with:
B.S. Meyerson United States
R. G. Elliman Australia
J. C. Bourgoin France
M. H. Brodsky United States
S. D. Brorson United States
A. G. Cullis United Kingdom
D. K. Biegelsen United States
J. Perrin France
J. Melngailis United States
L. W. Swanson United States
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Citations per field, relative to M. W. Geis
M. W. Geis · 1×
Citations per year, relative to M. W. Geis
M. W. Geis · 1×

Countries citing papers authored by M. W. Geis

Since Specialization
Citations

This map shows the geographic impact of M. W. Geis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. W. Geis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. W. Geis more than expected).

Fields of papers citing papers by M. W. Geis

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. W. Geis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. W. Geis. The network helps show where M. W. Geis may publish in the future.

Co-authorship network of co-authors of M. W. Geis

This figure shows the co-authorship network connecting the top 25 collaborators of M. W. Geis. A scholar is included among the top collaborators of M. W. Geis based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. W. Geis. M. W. Geis is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
# Work Indexed citations
1 0
2 4
3 9
4 22
5 32
6 106
7 52
8 44
9 1
10
Initial Plasma Tests of the IPROSEC Cathode Device
1
11 41
12 117
13 43
14 12
15 173
16
Materials Research Society Symposia Proceedings. Volume 53. Semiconductor-on-Insulator and Thin Film Transistor Technology Held in Boston, Massachusetts on 3-6 December 1985,
4
17 57
18 7
19 4
20
Measurement of Electron Loss Cross Sections for 0.25-5 keV Hydrogen Atoms in Atmospheric Gases
1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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