M. W. Geis
- Electrical and Electronic Engineering top 1%
- Materials Chemistry top 1%
- Atomic and Molecular Physics, and Optics top 1%
- Biomedical Engineering top 5%
- Mechanics of Materials top 1%
- Co-authors
- T. M. LyszczarzHenry I. SmithJ.C. TwichellN. N. EfremowJohn C. C. FanB-Y. TsaurR. W. MountainD. C. Flanders
- Topics
- Diamond and Carbon-based Materials Research (42 papers)Semiconductor materials and devices (40 papers)Thin-Film Transistor Technologies (38 papers)
- Cited by
- Materials ChemistryElectrical and Electronic EngineeringAtomic and Molecular Physics, and Optics
- Partner nations
- United StatesGermanyIsrael
In The Last Decade
M. W. Geis
145 papers receiving 5.5k citations
Peers
Comparison fields: 5 of 82
- Electrical and Electronic Engineering 3.8k
- Materials Chemistry 3.3k
- Atomic and Molecular Physics, and Optics 1.6k
- Biomedical Engineering 951
- Mechanics of Materials 938
Countries citing papers authored by M. W. Geis
This map shows the geographic impact of M. W. Geis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. W. Geis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. W. Geis more than expected).
Fields of papers citing papers by M. W. Geis
This network shows the impact of papers produced by M. W. Geis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. W. Geis. The network helps show where M. W. Geis may publish in the future.
Co-authorship network of co-authors of M. W. Geis
This figure shows the co-authorship network connecting the top 25 collaborators of M. W. Geis. A scholar is included among the top collaborators of M. W. Geis based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. W. Geis. M. W. Geis is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 4 | |
| 3 | 9 | |
| 4 | 22 | |
| 5 | 32 | |
| 6 | 106 | |
| 7 | 52 | |
| 8 | 44 | |
| 9 | 1 | |
| 10 | Initial Plasma Tests of the IPROSEC Cathode Device | 1 |
| 11 | 41 | |
| 12 | 117 | |
| 13 | 43 | |
| 14 | 12 | |
| 15 | 173 | |
| 16 | Materials Research Society Symposia Proceedings. Volume 53. Semiconductor-on-Insulator and Thin Film Transistor Technology Held in Boston, Massachusetts on 3-6 December 1985, | 4 |
| 17 | 57 | |
| 18 | 7 | |
| 19 | 4 | |
| 20 | Measurement of Electron Loss Cross Sections for 0.25-5 keV Hydrogen Atoms in Atmospheric Gases | 1 |
About M. W. Geis
M. W. Geis is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 152 papers that have together received 5.8k indexed citations. Recurring topics across this work include Diamond and Carbon-based Materials Research (42 papers), Semiconductor materials and devices (40 papers) and Thin-Film Transistor Technologies (38 papers). The work is most often cited by research in Materials Chemistry (3.3k citations), Electrical and Electronic Engineering (3.8k citations) and Atomic and Molecular Physics, and Optics (1.6k citations). M. W. Geis has collaborated with scholars based in United States, Germany and Israel. Frequent co-authors include T. M. Lyszczarz, Henry I. Smith, J.C. Twichell, N. N. Efremow, John C. C. Fan, B-Y. Tsaur, R. W. Mountain, D. C. Flanders, K. E. Krohn and S. J. Spector. Their work appears in journals such as Nature, The Journal of Chemical Physics and Journal of Geophysical Research Atmospheres.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.