D. C. Flanders

2.2k citations

55 papers · 1.6k indexed · h-index 22

Surfaces, Coatings and Films top 1%
- Optical Coatings and Gratings 11
- Electron and X-Ray Spectroscopy Techniques 5
Atomic and Molecular Physics, and Optics top 5%
- Semiconductor Quantum Structures and Devices 7
Electrical and Electronic Engineering top 5%
- Photonic and Optical Devices 18
- Advancements in Photolithography Techniques 13
- Semiconductor Lasers and Optical Devices 9
- Advanced Fiber Optic Sensors 5
Structural Biology top 10%
Biomedical Engineering top 10%
Mechanics of Materials
- Metal and Thin Film Mechanics 6

Co-authors: Henry I. Smith M. W. Geis R. V. Schmidt C. V. Shank David C. Shaver H. Kogelnik N. N. Efremow N. P. Economou
Cited by: Surfaces, Coatings and Films Atomic and Molecular Physics, and Optics Electrical and Electronic Engineering
Journals: Physical Review Letters (1 paper)Applied Physics Letters (12 papers)Journal of Applied Physics (1 paper)
Partner nations: United States

In The Last Decade

D. C. Flanders

53 papers receiving 1.5k citations

Peers

Countries citing papers authored by D. C. Flanders

Since Specialization

Citations

This map shows the geographic impact of D. C. Flanders's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. C. Flanders with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. C. Flanders more than expected).

Fields of papers citing papers by D. C. Flanders

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. C. Flanders. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. C. Flanders. The network helps show where D. C. Flanders may publish in the future.

Co-authorship network

The 25 scholars most cited alongside D. C. Flanders, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D. C. Flanders Line = papers co-authored together D. C. Flanders links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Long-to-short wavelength swept source Optics Express ·Bart Johnson,Walid Atia,M. Kuznetsov,Brian D. Goldberg,Peter Whitney,D. C. Flanders	2018	5
2	Coherence properties of short cavity swept lasers Biomedical Optics Express ·Bart Johnson,Walid Atia,M. Kuznetsov,Brian D. Goldberg,Peter Whitney,D. C. Flanders	2017	9
3	Micro-optical instrumentation for process spectroscopy Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Richard A. Crocombe,D. C. Flanders,Walid Atia	2004	14
4	A novel GaInAsP/InP distributed feedback laser Applied Physics Letters ·Z. L. Liau,D. C. Flanders,J. N. Walpole,N. L. DeMeo	1985	26
5	Silicon Permeable Base Transistors D.D. Rathman,B. A. Vojak,D. C. Flanders,N. P. Economou	1984	1
6	A self-aligned dual-grating GaAs permeable base transistor IEEE Electron Device Letters ·B. A. Vojak,R.W. McClelland,G. A. Lincoln,A. R. Calawa,D. C. Flanders,M. W. Geis	1984	4
7	A precision wide-range optical gap measurement technique Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ·D. C. Flanders,T. M. Lyszczarz	1983	9
8	Silicon nitride stencil masks for high resolution ion lithography proximity printing Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ·John N. Randall,D. C. Flanders,N. P. Economou,J.P. Donnelly,E. I. Bromley	1983	17
9	High resolution ion beam lithography at large gaps using stencil masks Applied Physics Letters ·John N. Randall,D. C. Flanders,N. P. Economou,J.P. Donnelly,E. I. Bromley	1983	26
10	Generation of <50 nm period gratings using edge defined techniques Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ·D. C. Flanders,N. N. Efremow	1983	47
11	Experimental evaluation of interferometric alignment techniques for multiple mask registration Journal of Vacuum Science and Technology ·T. M. Lyszczarz,D. C. Flanders,N. P. Economou,P. D. DeGraff	1981	12
12	Summary Abstract: High resolution ion beam lithography Journal of Vacuum Science and Technology ·N. P. Economou,D. C. Flanders,J.P. Donnelly	1981	9
13	X-ray lithography — A review and assessment of future applications Journal of Vacuum Science and Technology ·Henry I. Smith,D. C. Flanders	1980	13
14	Crystalline silicon on insulators by graphoepitaxy M. W. Geis,D. C. Flanders,D.A. Antoniadis,Henry I. Smith	1979	13
15	Crystallographic orientation of silicon on an amorphous substrate using an artificial surface-relief grating and laser crystallization Applied Physics Letters ·M. W. Geis,D. C. Flanders,Henry I. Smith	1979	182
16	X-ray lithography at ∠100 Å linewidths using x-ray masks fabricated by shadowing techniques Journal of Vacuum Science and Technology ·D. C. Flanders	1979	22
17	Polyimide membrane x-ray lithography masks—Fabrication and distortion measurements Journal of Vacuum Science and Technology ·D. C. Flanders,Henry I. Smith	1978	16
18	Surface relief gratings of 3200-Å-period fabrication techniques and influence on thin-film growth Journal of Vacuum Science and Technology ·D. C. Flanders,Henry I. Smith	1978	10
19	Invited: X-Ray Lithography Japanese Journal of Applied Physics ·Henry I. Smith,D. C. Flanders	1977	3
20	On the Performance and Limitations of the Surface-Wave Resonator Using Grooved Reflectors R.C.M. Li,R.C. Williamson,D. C. Flanders,J.A. Alusow	1974	32

About D. C. Flanders

D. C. Flanders is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics, having authored 55 papers that have together received 1.6k indexed citations. Recurring topics across this work include Photonic and Optical Devices (18 papers), Advancements in Photolithography Techniques (13 papers), Optical Coatings and Gratings (11 papers), Semiconductor Lasers and Optical Devices (9 papers), Semiconductor Quantum Structures and Devices (7 papers), Metal and Thin Film Mechanics (6 papers), Electron and X-Ray Spectroscopy Techniques (5 papers) and Advanced Fiber Optic Sensors (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (358 citations), Atomic and Molecular Physics, and Optics (713 citations) and Electrical and Electronic Engineering (1.1k citations). D. C. Flanders has collaborated with scholars based in United States. Frequent co-authors include Henry I. Smith, M. W. Geis, R. V. Schmidt, C. V. Shank, David C. Shaver, H. Kogelnik, N. N. Efremow, N. P. Economou, Alice E. White and Walid Atia. Their work appears in journals such as Physical Review Letters, Applied Physics Letters and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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