D. C. Flanders

2.2k total citations
55 papers, 1.6k citations indexed

About

D. C. Flanders is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, D. C. Flanders has authored 55 papers receiving a total of 1.6k indexed citations (citations by other indexed papers that have themselves been cited), including 46 papers in Electrical and Electronic Engineering, 19 papers in Atomic and Molecular Physics, and Optics and 16 papers in Surfaces, Coatings and Films. Recurrent topics in D. C. Flanders's work include Photonic and Optical Devices (18 papers), Advancements in Photolithography Techniques (13 papers) and Optical Coatings and Gratings (11 papers). D. C. Flanders is often cited by papers focused on Photonic and Optical Devices (18 papers), Advancements in Photolithography Techniques (13 papers) and Optical Coatings and Gratings (11 papers). D. C. Flanders collaborates with scholars based in United States. D. C. Flanders's co-authors include Henry I. Smith, M. W. Geis, R. V. Schmidt, C. V. Shank, David C. Shaver, H. Kogelnik, N. N. Efremow, N. P. Economou, Alice E. White and Walid Atia and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

D. C. Flanders

53 papers receiving 1.5k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
D. C. Flanders United States	22	1.1k	713	476	371	358	55	1.6k
David F. Kyser United States	17	1.3k 1.2×	435 0.6×	304 0.6×	229 0.6×	541 1.5×	36	1.7k
A. N. Broers United States	26	1.1k 1.0×	612 0.9×	629 1.3×	401 1.1×	478 1.3×	89	2.0k
G.A. Haas United States	22	671 0.6×	600 0.8×	164 0.3×	608 1.6×	279 0.8×	77	1.5k
T. E. Everhart United States	21	1.3k 1.2×	595 0.8×	221 0.5×	420 1.1×	1.1k 3.1×	50	2.2k
Robert G. Hunsperger United States	23	1.7k 1.6×	1.2k 1.7×	298 0.6×	251 0.7×	135 0.4×	74	2.1k
O. L. Alerhand United States	15	928 0.9×	1.5k 2.2×	270 0.6×	442 1.2×	300 0.8×	22	1.9k
R. J. Warmack United States	24	824 0.8×	971 1.4×	1.1k 2.2×	342 0.9×	215 0.6×	58	1.8k
El-Hang Lee South Korea	20	1.2k 1.1×	857 1.2×	437 0.9×	284 0.8×	135 0.4×	216	1.7k
E. van der Drift Netherlands	25	1.3k 1.2×	692 1.0×	541 1.1×	475 1.3×	195 0.5×	112	2.1k
Ee Jin Teo Singapore	22	1.0k 0.9×	566 0.8×	559 1.2×	596 1.6×	184 0.5×	84	1.7k

Countries citing papers authored by D. C. Flanders

Since Specialization

Citations

This map shows the geographic impact of D. C. Flanders's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. C. Flanders with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. C. Flanders more than expected).

Fields of papers citing papers by D. C. Flanders

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. C. Flanders. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. C. Flanders. The network helps show where D. C. Flanders may publish in the future.

Co-authorship network of co-authors of D. C. Flanders

This figure shows the co-authorship network connecting the top 25 collaborators of D. C. Flanders. A scholar is included among the top collaborators of D. C. Flanders based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. C. Flanders. D. C. Flanders is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Johnson, Bart, et al.. (2018). Long-to-short wavelength swept source. Optics Express. 26(26). 34909–34909. 5 indexed citations

Johnson, Bart, et al.. (2017). Coherence properties of short cavity swept lasers. Biomedical Optics Express. 8(2). 1045–1045. 9 indexed citations

Crocombe, Richard A., D. C. Flanders, & Walid Atia. (2004). Micro-optical instrumentation for process spectroscopy. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5591. 11–11. 14 indexed citations

Liau, Z. L., et al.. (1985). A novel GaInAsP/InP distributed feedback laser. Applied Physics Letters. 46(3). 221–223. 26 indexed citations

Rathman, D.D., B. A. Vojak, D. C. Flanders, & N. P. Economou. (1984). Silicon Permeable Base Transistors. 1 indexed citations

Vojak, B. A., R.W. McClelland, G. A. Lincoln, et al.. (1984). A self-aligned dual-grating GaAs permeable base transistor. IEEE Electron Device Letters. 5(7). 270–272. 4 indexed citations

Flanders, D. C. & T. M. Lyszczarz. (1983). A precision wide-range optical gap measurement technique. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 1(4). 1196–1199. 9 indexed citations

Randall, John N., et al.. (1983). Silicon nitride stencil masks for high resolution ion lithography proximity printing. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 1(4). 1152–1155. 17 indexed citations

Randall, John N., et al.. (1983). High resolution ion beam lithography at large gaps using stencil masks. Applied Physics Letters. 42(5). 457–459. 26 indexed citations

10.

Flanders, D. C. & N. N. Efremow. (1983). Generation of <50 nm period gratings using edge defined techniques. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 1(4). 1105–1108. 47 indexed citations

11.

Lyszczarz, T. M., et al.. (1981). Experimental evaluation of interferometric alignment techniques for multiple mask registration. Journal of Vacuum Science and Technology. 19(4). 1214–1218. 12 indexed citations

12.

Economou, N. P., D. C. Flanders, & J.P. Donnelly. (1981). Summary Abstract: High resolution ion beam lithography. Journal of Vacuum Science and Technology. 19(4). 1172–1175. 9 indexed citations

13.

Smith, Henry I. & D. C. Flanders. (1980). X-ray lithography — A review and assessment of future applications. Journal of Vacuum Science and Technology. 17(1). 533–535. 13 indexed citations

14.

Geis, M. W., D. C. Flanders, D.A. Antoniadis, & Henry I. Smith. (1979). Crystalline silicon on insulators by graphoepitaxy. 210–212. 13 indexed citations

15.

Geis, M. W., D. C. Flanders, & Henry I. Smith. (1979). Crystallographic orientation of silicon on an amorphous substrate using an artificial surface-relief grating and laser crystallization. Applied Physics Letters. 35(1). 71–74. 182 indexed citations

16.

Flanders, D. C.. (1979). X-ray lithography at ∠100 Å linewidths using x-ray masks fabricated by shadowing techniques. Journal of Vacuum Science and Technology. 16(6). 1615–1619. 22 indexed citations

17.

Flanders, D. C. & Henry I. Smith. (1978). Polyimide membrane x-ray lithography masks—Fabrication and distortion measurements. Journal of Vacuum Science and Technology. 15(3). 995–997. 16 indexed citations

18.

Flanders, D. C. & Henry I. Smith. (1978). Surface relief gratings of 3200-Å-period fabrication techniques and influence on thin-film growth. Journal of Vacuum Science and Technology. 15(3). 1001–1003. 10 indexed citations

19.

Smith, Henry I. & D. C. Flanders. (1977). Invited: X-Ray Lithography. Japanese Journal of Applied Physics. 16(S1). 61–61. 3 indexed citations

20.

Williamson, R.C., et al.. (1974). On the Performance and Limitations of the Surface-Wave Resonator Using Grooved Reflectors. 257–262. 32 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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