M. Seibt
- Structural Biology top 2%
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- Semiconductor materials and interfaces 77
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- Silicon and Solar Cell Technologies 78
- Integrated Circuits and Semiconductor Failure Analysis 29
- Semiconductor materials and devices 25
- Thin-Film Transistor Technologies 24
- Materials Chemistry top 2%
- Silicon Nanostructures and Photoluminescence 28
- Condensed Matter Physics top 5%
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- Electron and X-Ray Spectroscopy Techniques 22
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- Ion-surface interactions and analysis 18
M. Seibt
194 papers receiving 3.8k citations
Peers
Comparison fields: 5 of 91
- Structural Biology 78
- Atomic and Molecular Physics, and Optics 1.6k
- Electrical and Electronic Engineering 2.5k
- Materials Chemistry 1.8k
- Condensed Matter Physics 320
Countries citing papers authored by M. Seibt
This map shows the geographic impact of M. Seibt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Seibt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Seibt more than expected).
Fields of papers citing papers by M. Seibt
This network shows the impact of papers produced by M. Seibt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Seibt. The network helps show where M. Seibt may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M. Seibt, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2024 | 1 | |
| 3 | 2024 | 0 | |
| 4 | 2023 | 4 | |
| 5 | 2022 | 0 | |
| 6 | 2022 | 17 | |
| 7 | 2021 | 2 | |
| 8 | 2021 | 2 | |
| 9 | 2021 | 10 | |
| 10 | 2021 | 0 | |
| 11 | 2020 | 2 | |
| 12 | 2020 | 8 | |
| 13 | 2019 | 1 | |
| 14 | 2019 | 3 | |
| 15 | 2018 | 5 | |
| 16 | 2018 | 24 | |
| 17 | 2015 | 34 | |
| 18 | 2010 | 11 | |
| 19 | 2006 | 1 | |
| 20 | 1997 | 1 |
About M. Seibt
M. Seibt is a scholar working on Structural Biology, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electrical and Electronic Engineering and Condensed Matter Physics, having authored 203 papers that have together received 3.9k indexed citations. Recurring topics across this work include Silicon and Solar Cell Technologies (78 papers), Semiconductor materials and interfaces (77 papers), Integrated Circuits and Semiconductor Failure Analysis (29 papers), Silicon Nanostructures and Photoluminescence (28 papers), Semiconductor materials and devices (25 papers), Thin-Film Transistor Technologies (24 papers), Electron and X-Ray Spectroscopy Techniques (22 papers) and Ion-surface interactions and analysis (18 papers). The work is most often cited by research in Structural Biology (78 citations), Atomic and Molecular Physics, and Optics (1.6k citations), Electrical and Electronic Engineering (2.5k citations), Materials Chemistry (1.8k citations) and Condensed Matter Physics (320 citations). M. Seibt has collaborated with scholars based in Germany, Russia and United States. Frequent co-authors include W. Schröter, V. V. Kveder, S. M. Myers, Carsten Ronning, A. Sattler, Frank Riedel, K. Graff, H. Hofsäß, Rolf Brendel and H. Hedemann. Their work appears in journals such as Journal of Applied Physics, Applied Physics Letters, physica status solidi (a), Materials Science and Engineering B and Ultramicroscopy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.