K. Graff

1.4k total citations
20 papers, 1.0k citations indexed

About

K. Graff is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, K. Graff has authored 20 papers receiving a total of 1.0k indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 7 papers in Atomic and Molecular Physics, and Optics and 7 papers in Materials Chemistry. Recurrent topics in K. Graff's work include Silicon and Solar Cell Technologies (16 papers), Semiconductor materials and interfaces (7 papers) and Silicon Nanostructures and Photoluminescence (5 papers). K. Graff is often cited by papers focused on Silicon and Solar Cell Technologies (16 papers), Semiconductor materials and interfaces (7 papers) and Silicon Nanostructures and Photoluminescence (5 papers). K. Graff collaborates with scholars based in Germany, United States and Belgium. K. Graff's co-authors include M. Seibt, E. R. Weber, H. Conzelmann, G. Tölg, E. Grallath, Koen Strijckmans, G. M�llenstedt, B. Griepink, R. Murray and B. Pajot and has published in prestigious journals such as Journal of Applied Physics, Journal of The Electrochemical Society and Applied Physics A.

In The Last Decade

K. Graff

20 papers receiving 912 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
K. Graff Germany	11	948	533	218	102	61	20	1.0k
L. C. Kimerling United States	16	1.1k 1.1×	556 1.0×	345 1.6×	114 1.1×	151 2.5×	47	1.2k
J. C. C. Tsai United States	11	647 0.7×	293 0.5×	168 0.8×	221 2.2×	43 0.7×	16	739
M. J. Binns United Kingdom	13	690 0.7×	244 0.5×	376 1.7×	79 0.8×	32 0.5×	26	744
U. G�sele United States	11	791 0.8×	404 0.8×	371 1.7×	59 0.6×	137 2.2×	16	911
H. Ohyama Japan	18	942 1.0×	301 0.6×	220 1.0×	45 0.4×	35 0.6×	143	1.1k
D. Chandler‐Horowitz United States	11	466 0.5×	209 0.4×	232 1.1×	51 0.5×	120 2.0×	28	615
D. J. Vitkavage United States	11	781 0.8×	214 0.4×	199 0.9×	151 1.5×	141 2.3×	27	876
O. K. Wu United States	17	585 0.6×	404 0.8×	151 0.7×	33 0.3×	44 0.7×	58	648
Stephen Kurtin United States	9	491 0.5×	410 0.8×	238 1.1×	75 0.7×	60 1.0×	13	710
C. Dubois France	15	536 0.6×	261 0.5×	251 1.2×	96 0.9×	89 1.5×	57	711

Countries citing papers authored by K. Graff

Since Specialization

Citations

This map shows the geographic impact of K. Graff's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Graff with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Graff more than expected).

Fields of papers citing papers by K. Graff

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Graff. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Graff. The network helps show where K. Graff may publish in the future.

Co-authorship network of co-authors of K. Graff

This figure shows the co-authorship network connecting the top 25 collaborators of K. Graff. A scholar is included among the top collaborators of K. Graff based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. Graff. K. Graff is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Graff, K.. (2000). Metal Impurities in Silicon-Device Fabrication. Springer series in materials science. 123 indexed citations

Graff, K.. (1995). Metal Impurities in Silicon-Device Fabrication. Springer series in materials science. 335 indexed citations

Graff, K., et al.. (1994). Chromium‐Free Etch for Revealing and Distinguishing Metal Contamination Defects in Silicon. Journal of The Electrochemical Society. 141(10). 2821–2825. 2 indexed citations

Murray, R., K. Graff, B. Pajot, et al.. (1992). Interlaboratory Determination of Oxygen in Silicon for Certified Reference Materials. Journal of The Electrochemical Society. 139(12). 3582–3587. 9 indexed citations

Graff, K.. (1989). Transition metals in silicon and their gettering behaviour. Materials Science and Engineering B. 4(1-4). 63–69. 19 indexed citations

Graff, K., et al.. (1989). Correction Factors for the Determination of Oxygen in Silicon by IR Spectrometry. Journal of The Electrochemical Society. 136(7). 2025–2031. 18 indexed citations

Seibt, M. & K. Graff. (1988). Characterization of haze-forming precipitates in silicon. Journal of Applied Physics. 63(9). 4444–4450. 82 indexed citations

Graff, K., et al.. (1988). Monitoring of Internal Gettering during Bipolar Processes. Journal of The Electrochemical Society. 135(4). 952–957. 18 indexed citations

Seibt, M. & K. Graff. (1987). Tem Study of Metal Impurity Precipitates in the Surface Regions of Silicon Wafers. MRS Proceedings. 104. 5 indexed citations

10.

Graff, K., et al.. (1984). Palladium-Test: A Tool to Evaluate Gettering Efficiency. MRS Proceedings. 36. 9 indexed citations

11.

Conzelmann, H., K. Graff, & E. R. Weber. (1983). Chromium and chromium-boron pairs in silicon. Applied Physics A. 30(3). 169–175. 89 indexed citations

12.

Graff, K.. (1983). Precise Evaluation of Oxygen Measurements on CZ‐Silicon Wafers. Journal of The Electrochemical Society. 130(6). 1378–1381. 6 indexed citations

13.

Graff, K., et al.. (1981). The Properties of Iron in Silicon. Journal of The Electrochemical Society. 128(3). 669–674. 167 indexed citations

14.

Graff, K., et al.. (1978). Degradation of carrier lifetime in silicon crystals at room temperature. physica status solidi (a). 49(1). 137–144. 10 indexed citations

15.

Graff, K., et al.. (1975). The carrier lifetime of heat-treated silicon crystals. Journal of Electronic Materials. 4(2). 281–298. 22 indexed citations

16.

Graff, K., et al.. (1975). Carrier lifetime measurements on electron-irradiated silicon crystals. physica status solidi (a). 30(2). 593–599. 9 indexed citations

17.

Graff, K., et al.. (1973). Bestimmung von parts per billion sauerstoff in silizium durch eichung der IR-absorption bei 77°K. Solid-State Electronics. 16(8). 887–893. 78 indexed citations

18.

Graff, K., et al.. (1972). Bestimmung der zusammensetzung von ternären III–V-verbindungshalbleitern aus dem spektrum der oberflächenfotospannung. Solid-State Electronics. 15(7). 831–837. 4 indexed citations

19.

Graff, K., et al.. (1970). Struktur- und Absorptionspotentiale von KCl und NaCl aus Beugungsaufnahmen im konvergenten Elektronenbündel. Zeitschrift für Physik A Hadrons and Nuclei. 232(2). 190–204. 4 indexed citations

20.

M�llenstedt, G., et al.. (1962). Wachstum von Einkristall-Lamellen in dem engen Raum zwischen parallelen Glasfl�chen. The European Physical Journal A. 167(4). 367–374. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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