Kun Young Chung

402 total citations
11 papers, 300 citations indexed

About

Kun Young Chung is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Information Systems and Management. According to data from OpenAlex, Kun Young Chung has authored 11 papers receiving a total of 300 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Hardware and Architecture, 8 papers in Electrical and Electronic Engineering and 2 papers in Information Systems and Management. Recurrent topics in Kun Young Chung's work include VLSI and Analog Circuit Testing (8 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Low-power high-performance VLSI design (4 papers). Kun Young Chung is often cited by papers focused on VLSI and Analog Circuit Testing (8 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Low-power high-performance VLSI design (4 papers). Kun Young Chung collaborates with scholars based in United States, South Korea and Finland. Kun Young Chung's co-authors include John W. Eichenseher, Mohamed M. Ahmed, Sandeep K. Gupta, Andrew B. Kahng, Wei-Ting Jonas Chan, Siddhartha Nath, Janusz Rajski, Yu Huang, Jihye Kim and Wu-Tung Cheng and has published in prestigious journals such as Journal of Business Ethics and Journal of Accounting and Public Policy.

In The Last Decade

Kun Young Chung

10 papers receiving 285 citations

Peers

Kun Young Chung

ISM

CN

OBHRM

SPS

EEE

Thomas W. Vance United States

Almerinda Forte United States

Hyun Hee Park South Korea

Stan Williamson United States

Juan Shan China

M. Kemal Öktem Türkiye

D. Paul Scarbrough Canada

Yanyan Chen China

Patricia J. Carlson United States

David R. L. Gabhart United States

Thomas W. Vance United States

Kun Young Chung

34 ×0.2

ISM

10 ×0.2

CN

69 ×1.2

OBHRM

34 ×0.6

SPS

9 ×0.2

EEE

Citations per year, relative to Kun Young Chung Kun Young Chung (= 1×) peers Thomas W. Vance

Countries citing papers authored by Kun Young Chung

Since Specialization

Citations

This map shows the geographic impact of Kun Young Chung's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kun Young Chung with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kun Young Chung more than expected).

Fields of papers citing papers by Kun Young Chung

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Kun Young Chung. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kun Young Chung. The network helps show where Kun Young Chung may publish in the future.

Co-authorship network of co-authors of Kun Young Chung

This figure shows the co-authorship network connecting the top 25 collaborators of Kun Young Chung. A scholar is included among the top collaborators of Kun Young Chung based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kun Young Chung. Kun Young Chung is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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11 of 11 papers shown

1.

Chung, Kun Young, et al.. (2022). Industry Evaluation of Reversible Scan Chain Diagnosis. 420–426. 3 indexed citations

2.

Chung, Kun Young, et al.. (2016). Comprehensive optimization of scan chain timing during late-stage IC implementation. 1–6.

3.

Chan, Wei-Ting Jonas, et al.. (2016). Learning-based prediction of embedded memory timing failures during initial floorplan design. 178–185. 33 indexed citations

4.

Huang, Yu, Mark Kassab, Janusz Rajski, et al.. (2014). Test Compression Improvement with EDT Channel Sharing in SoC Designs. 22–31. 6 indexed citations

5.

Chung, Kun Young & Sandeep K. Gupta. (2010). Design and test of latch-based circuits to maximize performance, yield, and delay test quality. 1–10. 3 indexed citations

6.

Chung, Kun Young & Sandeep K. Gupta. (2009). Efficient Scheduling of Path Delay Tests for Latch-Based Circuits. 103–110. 1 indexed citations

7.

Chung, Kun Young, et al.. (2007). Ethical Perceptions of Business Students: Differences Between East Asia and the USA and Among “Confucian” Cultures. Journal of Business Ethics. 79(1-2). 121–132. 71 indexed citations

8.

Chung, Kun Young & Sandeep K. Gupta. (2006). Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time Borrowing. 8–15. 4 indexed citations

9.

Chung, Kun Young & Sandeep K. Gupta. (2004). Structural delay testing of latch-based high-speed pipelines with time borrowing. 1. 1089–1097. 11 indexed citations

10.

Ahmed, Mohamed M., Kun Young Chung, & John W. Eichenseher. (2003). Business Students' Perception of Ethics and Moral Judgment: A Cross-Cultural Study. Journal of Business Ethics. 43(1-2). 89–102. 167 indexed citations

11.

Chung, Kun Young, et al.. (1996). Differential market reactions to accounting changes away from versus towards common accounting practices. Journal of Accounting and Public Policy. 15(1). 29–53. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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