Kazuhiro Hamamoto
- Electrical and Electronic Engineering
- Surfaces, Coatings and Films top 2%
- Radiation top 10%
- Biomedical Engineering
- Computer Vision and Pattern Recognition
- Co-authors
- Hiroo KinoshitaTakeo WatanabeTsutomu ShokiHideo HadaNoriyuki SakayaHarushige TsubakinoShintaro TakadaTsuneyuki Haga
- Topics
- Advancements in Photolithography Techniques (33 papers)Electron and X-Ray Spectroscopy Techniques (21 papers)Integrated Circuits and Semiconductor Failure Analysis (16 papers)
- Journals
- Japanese Journal of Applied PhysicsMicroelectronic EngineeringJournal of Micro/Nanolithography MEMS and MOEMS
- Partner nations
- JapanUnited StatesIreland
In The Last Decade
Kazuhiro Hamamoto
34 papers receiving 353 citations
Peers
Comparison fields: 5 of 39
- Electrical and Electronic Engineering 308
- Surfaces, Coatings and Films 210
- Radiation 80
- Biomedical Engineering 54
- Computer Vision and Pattern Recognition 39
Countries citing papers authored by Kazuhiro Hamamoto
This map shows the geographic impact of Kazuhiro Hamamoto's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kazuhiro Hamamoto with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kazuhiro Hamamoto more than expected).
Fields of papers citing papers by Kazuhiro Hamamoto
This network shows the impact of papers produced by Kazuhiro Hamamoto. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kazuhiro Hamamoto. The network helps show where Kazuhiro Hamamoto may publish in the future.
Co-authorship network of co-authors of Kazuhiro Hamamoto
This figure shows the co-authorship network connecting the top 25 collaborators of Kazuhiro Hamamoto. A scholar is included among the top collaborators of Kazuhiro Hamamoto based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kazuhiro Hamamoto. Kazuhiro Hamamoto is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 6 | |
| 2 | 1 | |
| 3 | 11 | |
| 4 | 5 | |
| 5 | 25 | |
| 6 | 10 | |
| 7 | 7 | |
| 8 | 25 | |
| 9 | 30 | |
| 10 | 2 | |
| 11 | 8 | |
| 12 | 12 | |
| 13 | 21 | |
| 14 | 15 | |
| 15 | 14 | |
| 16 | 13 | |
| 17 | 11 | |
| 18 | 28 | |
| 19 | 9 | |
| 20 | 12 |
About Kazuhiro Hamamoto
Kazuhiro Hamamoto is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Radiation, having authored 35 papers that have together received 360 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (33 papers), Electron and X-Ray Spectroscopy Techniques (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (16 papers). The work is most often cited by research in Surfaces, Coatings and Films (210 citations), Radiation (80 citations) and Electrical and Electronic Engineering (308 citations). Kazuhiro Hamamoto has collaborated with scholars based in Japan, United States and Ireland. Frequent co-authors include Hiroo Kinoshita, Takeo Watanabe, Tsutomu Shoki, Hideo Hada, Noriyuki Sakaya, Harushige Tsubakino, Shintaro Takada, Tsuneyuki Haga, Shinji Okazaki and Seung Yoon Lee. Their work appears in journals such as Japanese Journal of Applied Physics, Microelectronic Engineering and Journal of Micro/Nanolithography MEMS and MOEMS.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.