F. Pio
- Ceramics and Composites top 10%
- Glass properties and applications 4
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- Semiconductor materials and devices 25
- Advancements in Semiconductor Devices and Circuit Design 15
- Integrated Circuits and Semiconductor Failure Analysis 11
- Advanced Memory and Neural Computing 4
- Silicon and Solar Cell Technologies 4
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- Luminescence Properties of Advanced Materials 4
- Quantum Dots Synthesis And Properties 3
- Journals
- Microelectronics Reliability (3 papers)IEEE Transactions on Electron Devices (2 papers)Microelectronic Engineering (2 papers)
- Partner nations
- ItalySwitzerlandFrance
In The Last Decade
F. Pio
31 papers receiving 321 citations
Peers
Comparison fields: 5 of 32
- Ceramics and Composites 83
- Electrical and Electronic Engineering 253
- Materials Chemistry 193
- Electronic, Optical and Magnetic Materials 30
- Surfaces, Coatings and Films 11
Countries citing papers authored by F. Pio
This map shows the geographic impact of F. Pio's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Pio with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Pio more than expected).
Fields of papers citing papers by F. Pio
This network shows the impact of papers produced by F. Pio. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Pio. The network helps show where F. Pio may publish in the future.
Co-authorship network
The 25 scholars most cited alongside F. Pio, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 4 | |
| 2 | 2002 | 2 | |
| 3 | 2001 | 11 | |
| 4 | 2000 | 6 | |
| 5 | Double-Poly EEPROM Cell for High Density Memories using Positive and Negative Voltage Programming | 1996 | 4 |
| 6 | 1996 | 56 | |
| 7 | 1996 | 14 | |
| 8 | On the Charge Build-Up Mechanisms in Very Thin Insulator Layers | 1994 | 7 |
| 9 | 1994 | 32 | |
| 10 | 1993 | 4 | |
| 11 | 1993 | 5 | |
| 12 | 1993 | 1 | |
| 13 | 1993 | 8 | |
| 14 | 1993 | 4 | |
| 15 | 1993 | 2 | |
| 16 | 1991 | 3 | |
| 17 | 1990 | 37 | |
| 18 | 1987 | 37 | |
| 19 | 1985 | 1 | |
| 20 | 1984 | 6 |
About F. Pio
F. Pio is a scholar working on Ceramics and Composites, Electrical and Electronic Engineering and Hardware and Architecture, having authored 32 papers that have together received 349 indexed citations. Recurring topics across this work include Semiconductor materials and devices (25 papers), Advancements in Semiconductor Devices and Circuit Design (15 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Glass properties and applications (4 papers), Luminescence Properties of Advanced Materials (4 papers), Advanced Memory and Neural Computing (4 papers), Silicon and Solar Cell Technologies (4 papers) and Quantum Dots Synthesis And Properties (3 papers). The work is most often cited by research in Ceramics and Composites (83 citations), Electrical and Electronic Engineering (253 citations) and Materials Chemistry (193 citations). F. Pio has collaborated with scholars based in Italy, Switzerland and France. Frequent co-authors include M. Guzzi, M. Martini, Carlo Riva, G. Spinolo, C. Papadas, G. Ghibaudo, E. Grilli, C. Coluzza, D. Bouvet and G. Pananakakis. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Electron Devices, Microelectronic Engineering, Solid-State Electronics and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.