F. Pio

430 total citations
32 papers, 349 citations indexed

About

F. Pio is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, F. Pio has authored 32 papers receiving a total of 349 indexed citations (citations by other indexed papers that have themselves been cited), including 28 papers in Electrical and Electronic Engineering, 11 papers in Materials Chemistry and 5 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in F. Pio's work include Semiconductor materials and devices (25 papers), Advancements in Semiconductor Devices and Circuit Design (15 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). F. Pio is often cited by papers focused on Semiconductor materials and devices (25 papers), Advancements in Semiconductor Devices and Circuit Design (15 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). F. Pio collaborates with scholars based in Italy, Switzerland and France. F. Pio's co-authors include M. Guzzi, M. Martini, Carlo Riva, G. Spinolo, C. Papadas, G. Ghibaudo, E. Grilli, J. Almeida, G. Margaritondo and G. Pananakakis and has published in prestigious journals such as Physical review. B, Condensed matter, Journal of Applied Physics and Journal of Physics Condensed Matter.

In The Last Decade

F. Pio

31 papers receiving 321 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
F. Pio Italy	11	253	193	83	48	30	32	349
B. Bourdon France	10	344 1.4×	273 1.4×	28 0.3×	55 1.1×	9 0.3×	25	381
P. E. R. Nordquist United States	7	261 1.0×	67 0.3×	18 0.2×	130 2.7×	37 1.2×	21	301
V. J. Silvestri United States	11	185 0.7×	114 0.6×	31 0.4×	93 1.9×	22 0.7×	28	287
T. Shioda Japan	9	344 1.4×	223 1.2×	31 0.4×	143 3.0×	36 1.2×	17	430
N. Duhamel France	12	292 1.2×	142 0.7×	36 0.4×	185 3.9×	7 0.2×	39	353
Shigeo Nakajima United States	13	326 1.3×	188 1.0×	31 0.4×	94 2.0×	62 2.1×	21	386
G. Weidner Germany	10	281 1.1×	171 0.9×	12 0.1×	72 1.5×	37 1.2×	37	315
J.L. Leray France	12	407 1.6×	108 0.6×	16 0.2×	15 0.3×	40 1.3×	28	441
K.S. Krisch United States	12	675 2.7×	171 0.9×	10 0.1×	66 1.4×	46 1.5×	23	694
K. Reid United States	8	320 1.3×	168 0.9×	10 0.1×	91 1.9×	37 1.2×	22	381

Countries citing papers authored by F. Pio

Since Specialization

Citations

This map shows the geographic impact of F. Pio's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Pio with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Pio more than expected).

Fields of papers citing papers by F. Pio

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Pio. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Pio. The network helps show where F. Pio may publish in the future.

Co-authorship network of co-authors of F. Pio

This figure shows the co-authorship network connecting the top 25 collaborators of F. Pio. A scholar is included among the top collaborators of F. Pio based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Pio. F. Pio is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Pio, F., et al.. (2002). Select transistor modulated cell array structure test for EEPROM reliability. 217–222. 4 indexed citations

Pio, F., et al.. (2002). Passivation scheme impact on retention reliability of non volatile memory cells. 18–21. 2 indexed citations

Pio, F., et al.. (2001). Select transistor modulated cell array structure test application in EEPROM process reliability. Solid-State Electronics. 45(8). 1279–1291. 11 indexed citations

Pio, F., et al.. (2000). Cell array structure test in EEPROM reliability assessment at an early process development stage. Microelectronics Reliability. 40(4-5). 719–722. 6 indexed citations

Pio, F., et al.. (1996). Double-Poly EEPROM Cell for High Density Memories using Positive and Negative Voltage Programming. European Solid-State Device Research Conference. 693–696. 4 indexed citations

Bouvet, D., M. Dutoit, C. Coluzza, et al.. (1996). Influence of nitrogen profile on electrical characteristics of furnace- or rapid thermally nitrided silicon dioxide films. Journal of Applied Physics. 79(9). 7114–7122. 56 indexed citations

Pio, F.. (1996). Sheet resistance and layout effects in accelerated tests for dielectric reliability evaluation. Microelectronics Journal. 27(7). 675–685. 14 indexed citations

Papadas, C., et al.. (1994). On the Charge Build-Up Mechanisms in Very Thin Insulator Layers. European Solid-State Device Research Conference. 495–498. 7 indexed citations

Papadas, C., G. Ghibaudo, F. Pio, et al.. (1994). On the charge build-up mechanisms in gate dielectrics. Solid-State Electronics. 37(3). 495–505. 32 indexed citations

10.

Pio, F., et al.. (1994). Thin SiO2 films nitrided in N2O. Microelectronics Journal. 25(7). 495–500. 6 indexed citations

11.

Papadas, C., et al.. (1993). Impact of reactive ion etching using O/sub 2/+CHF/sub 3/ plasma on the endurance performance of FLOTOX EEPROM cells. IEEE Transactions on Electron Devices. 40(8). 1549–1551. 4 indexed citations

12.

Pio, F., et al.. (1993). Thin oxide nitridation in N2O by RTP for non-volatile memories. Microelectronics Journal. 24(4). 453–458. 5 indexed citations

13.

Papadas, C., et al.. (1993). On the endurance performance of FLOTOX EEPROM cells with WSi2 overcoated floating gate electrode. Microelectronics Journal. 24(4). 395–399. 1 indexed citations

14.

Pio, F., et al.. (1993). Influence of series resistance in oxide parameter extraction from accelerated tests data. Microelectronics Journal. 24(4). 445–451. 8 indexed citations

15.

Papadas, C., et al.. (1993). Influence of rapid thermal nitridation process in N ₂ O ambient on the endurance performance of FLOTOX EEPROM cells. Electronics Letters. 29(2). 242–243. 2 indexed citations

16.

Pio, F., et al.. (1991). A study of the oxide grown on WSi₂. Semiconductor Science and Technology. 6(7). 684–689. 3 indexed citations

17.

Pio, F., M. Guzzi, G. Spinolo, & M. Martini. (1990). Instrinsic and Impurity‐Related Point Defects in Amorphous Silica. A Spectroscopic Study. physica status solidi (b). 159(2). 577–588. 37 indexed citations

18.

Guzzi, M., et al.. (1990). Thermally stimulated luminescence above room temperature of amorphous SiO2. Solid State Communications. 75(2). 75–79. 13 indexed citations

19.

Guzzi, M., et al.. (1987). Luminescence of fused silica: Observation of theO2−emission band. Physical review. B, Condensed matter. 35(17). 9407–9409. 37 indexed citations

20.

Grilli, E., et al.. (1984). Influence of the cation mixing on the photoelectronic properties of the ZnxCd1−xIn2S4 (III) layered compounds. Progress in Crystal Growth and Characterization. 10. 329–336. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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