J. Geypen

954 citations

12 papers · 102 indexed · h-index 6

Impact in

Electrical and Electronic Engineering
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Photonic and Optical Devices
- Silicon and Solar Cell Technologies
- Integrated Circuits and Semiconductor Failure Analysis
Atomic and Molecular Physics, and Optics
- Semiconductor materials and interfaces
- Semiconductor Quantum Structures and Devices

Papers in ⓘ

Electrical and Electronic Engineering 12
- Silicon and Solar Cell Technologies 6
- Semiconductor materials and devices 6
- Integrated Circuits and Semiconductor Failure Analysis 4
- Advancements in Semiconductor Devices and Circuit Design 4
- Thin-Film Transistor Technologies 3
Atomic and Molecular Physics, and Optics 5
- Semiconductor materials and interfaces 3
- Semiconductor Quantum Structures and Devices 2

Co-authors: H. Bender (6 shared papers)Roger Loo (6 shared papers)Wilfried Vandervorst (2 shared papers)Eddy Simoen (3 shared papers)Andrea Firrincieli (2 shared papers)Matty Caymax (2 shared papers)Marc Meuris (2 shared papers)R. Rooyackers (1 shared paper)
Journals: Microelectronic Engineering (1 paper)Journal of Applied Physics (1 paper)Applied Physics Letters (1 paper)Journal of Materials Science (1 paper)ECS Transactions (4 papers)
Partner nations: Belgium United States South Korea

In The Last Decade

J. Geypen

10 papers receiving 100 citations

Peers

Countries citing papers authored by J. Geypen

Since Specialization

Citations

This map shows the geographic impact of J. Geypen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Geypen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Geypen more than expected).

Fields of papers citing papers by J. Geypen

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Geypen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Geypen. The network helps show where J. Geypen may publish in the future.

Co-authors

The 25 scholars most cited alongside J. Geypen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Geypen Line = papers co-authored together J. Geypen links everyone, so they are left out of the graph.

All Works

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12 of 12 papers shown

#	Work
1	Study of ohmic contacts to n-type Ge: Snowplow and laser activation Applied Physics Letters ·Andrea Firrincieli, Koen Martens, R. Rooyackers, Benjamin Vincent, Erik Rosseel, Eddy Simoen, J. Geypen, H. Bender, Cor Claeys, J. A. Kittl	2011	29
2	Selective Epitaxial Growth of Germanium on Si Wafers with Shallow Trench Isolation: An Approach for Ge Virtual Substrates ECS Transactions ·Gang Wang, Frederik Leys, Laurent Souriau, Roger Loo, Matty Caymax, D.P. Brunco, J. Geypen, H. Bender, Marc Meuris, Wilfried Vandervorst, Marc Heyns	2008	27
3	SiGe SEG Growth for Buried Channels p-MOS Devices ECS Transactions ·Andriy Hikavyy, Roger Loo, Liesbeth Witters, Shinji Takeoka, J. Geypen, Bert Brijs, Clément Merckling, Matty Caymax, J. Dekoster	2009	17
4	Impact of the chemical concentration on the solid-phase epitaxial regrowth of phosphorus implanted preamorphized germanium Journal of Applied Physics ·Eddy Simoen, Antoine Brugère, A. Satta, Andrea Firrincieli, Benny Van Daele, Bert Brijs, Olivier Richard, J. Geypen, Marc Meuris, Wilfried Vandervorst	2009	11
5	Stuffing-enabled surface confinement of silanes used as sealing agents on CF4 plasma-exposed 2.0 p-OSG films Microelectronic Engineering ·Yiting Sun, Elisabeth Levrau, Liping Zhang, J. Geypen, Johan Meersschaut, Alexis Franquet, Quoc Toan Le, Jean‐François de Marneffe, H. Bender, Herbert Struyf, Christophe Detavernier, Mikhaı̈l R. Baklanov, Steven De Feyter, Silvia Armini	2014	6
6	Structural characterization of through silicon vias Journal of Materials Science ·H. Bender, C. Drijbooms, P. Van Marcke, J. Geypen, Harold Philipsen, Aleksandar Radisic	2010	6
7	Source/Drain Epitaxy for Nanosheet-Based CFET Devices ECS Transactions ·Erik Rosseel, Clément Porret, Thomas Dursap, Roger Loo, Hans Mertens, Jishnu Ganguly, Ritam Sarkar, Camila Cavalcante, Olivier Richard, J. Geypen, Brendan Marozas, Daniel Casey, Rami Khazaka, S. Demuynck, Lucas Petersen Barbosa Lima, R. Langer, S. Biesemans, Naoto Horiguchi	2024	2
8	Impact of sub-melt laser annealing on Si<inf>1-x</inf>Ge<inf>x</inf> source /drain defectivity Erik Rosseel, J.P. Lu, Andriy Hikavyy, Peter Verheyen, Thomas Hoffmann, Olivier Richard, J. Geypen, H. Bender, Roger Loo, P. Absil, R. Mc Intosh, Susan B. Felch, R. Schreutelkamp	2007	2
9	Impact of Millisecond Laser Anneal on the Thermal Stress- Induced Defect Creation in Si1-xGex Source /Drain Junctions ECS Transactions ·Mireia Bargalló González, Eddy Simoen, Erik Rosseel, Peter Verheyen, Laurent Souriau, J. Geypen, H. Bender, T. Y. Hoffmann, Roger Loo, P. Absil, Cor Claeys	2008	1
10	Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control Subhali Subhechha, Nouredine Rassoul, A. Belmonte, Hubert Hody, H.F.W. Dekkers, Michiel J. van Setten, A. Chasin, Shamin Houshmand Sharifi, Kaustuv Banerjee, Harinarayanan Puliyalil, Shreya Kundu, Murat Pak, D. Tsvetanova, N. Bazzazian, K. Vandersmissen, Dmitry Batuk, J. Geypen, J. Heijlen, Romain Delhougne, Gouri Sankar Kar	2022	1
11	Source/Drain Epitaxy for Nanosheet-Based CFET Devices ECS Meeting Abstracts ·Erik Rosseel, Clément Porret, Thomas Dursap, Roger Loo, Hans Mertens, Jishnu Ganguly, Ritam Sarkar, Camila Cavalcante, Olivier Richard, J. Geypen, Brendan Marozas, Daniel Casey, Rami Khazaka, S. Demuynck, Lucas Petersen Barbosa Lima, R. Langer, S. Biesemans, Naoto Horiguchi	2024	0
12	Nb Contacts for Thermally-Stable High-Performance Logic and Memory Peripheral Transistor Ritam Sarkar, R. Ritzenthaler, J.-L. Everaert, Pierre Eyben, Kiroubanand Sankaran, Clément Porret, Prasanth Gupta, Jhuma Ganguly, H. Arimura, J. Geypen, E. Capogreco, Seulki Roh, Vladimir Machkaoutsan, Lucas Petersen Barbosa Lima, Myung‐Sun Kim, A. Spessot, Naoto Horiguchi	2024	0

About J. Geypen

J. Geypen is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Polymers and Plastics and Electronic, Optical and Magnetic Materials, having authored 12 papers that have together received 102 indexed citations. Recurring topics across this work include Silicon and Solar Cell Technologies (6 papers), Semiconductor materials and devices (6 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Advancements in Semiconductor Devices and Circuit Design (4 papers), Thin-Film Transistor Technologies (3 papers), Semiconductor materials and interfaces (3 papers), Semiconductor Quantum Structures and Devices (2 papers) and Ion-surface interactions and analysis (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (99 citations), Atomic and Molecular Physics, and Optics (40 citations), Biomedical Engineering (20 citations), Surfaces, Coatings and Films (3 citations) and Materials Chemistry (13 citations). J. Geypen has collaborated with scholars based in Belgium, United States and South Korea. Frequent co-authors include H. Bender, Roger Loo, Wilfried Vandervorst, Eddy Simoen, Andrea Firrincieli, Matty Caymax, Marc Meuris, R. Rooyackers, Bert Brijs and Koen Martens. Their work appears in journals such as Microelectronic Engineering, Journal of Applied Physics, Applied Physics Letters, Journal of Materials Science and ECS Transactions.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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