H. Brut

604 total citations
15 papers, 264 citations indexed

About

H. Brut is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Biomedical Engineering. According to data from OpenAlex, H. Brut has authored 15 papers receiving a total of 264 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 3 papers in Hardware and Architecture and 2 papers in Biomedical Engineering. Recurrent topics in H. Brut's work include Semiconductor materials and devices (12 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). H. Brut is often cited by papers focused on Semiconductor materials and devices (12 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). H. Brut collaborates with scholars based in France, Switzerland and United States. H. Brut's co-authors include N. Planes, R. Gwoziecki, Dominique Fleury, G. Ghibaudo, Takuma Matsumoto, S. Cristoloveanu, J. Pretet, T. Poiroux, S. Harrison and B. Dumont and has published in prestigious journals such as Electronics Letters, IEEE Transactions on Nanotechnology and IEEE Transactions on Semiconductor Manufacturing.

In The Last Decade

H. Brut

15 papers receiving 252 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
H. Brut France 8 263 35 18 10 3 15 264
Kanyu Cao China 6 269 1.0× 30 0.9× 29 1.6× 12 1.2× 2 0.7× 25 275
Stephen G. Beebe United States 11 316 1.2× 34 1.0× 11 0.6× 10 1.0× 30 321
Declan Carey United States 8 222 0.8× 64 1.8× 18 1.0× 5 0.5× 2 0.7× 11 223
D. Chanemougame France 8 207 0.8× 31 0.9× 17 0.9× 12 1.2× 1 0.3× 15 216
Daehan Kwon South Korea 6 143 0.5× 35 1.0× 7 0.4× 10 1.0× 4 1.3× 11 166
François Andrieu France 8 315 1.2× 33 0.9× 9 0.5× 18 1.8× 2 0.7× 20 319
I. Aller Germany 6 408 1.6× 43 1.2× 24 1.3× 13 1.3× 1 0.3× 7 417
Weize Xiong United States 13 417 1.6× 45 1.3× 14 0.8× 10 1.0× 27 422
Hidemi Noguchi Japan 9 191 0.7× 29 0.8× 8 0.4× 7 0.7× 2 0.7× 32 191
R. Tu United States 8 309 1.2× 15 0.4× 32 1.8× 6 0.6× 4 1.3× 15 319

Countries citing papers authored by H. Brut

Since Specialization
Citations

This map shows the geographic impact of H. Brut's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Brut with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Brut more than expected).

Fields of papers citing papers by H. Brut

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. Brut. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Brut. The network helps show where H. Brut may publish in the future.

Co-authorship network of co-authors of H. Brut

This figure shows the co-authorship network connecting the top 25 collaborators of H. Brut. A scholar is included among the top collaborators of H. Brut based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. Brut. H. Brut is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

15 of 15 papers shown
1.
Fleury, Dominique, et al.. (2009). A new technique to extract the gate bias dependent s/d series resistance of sub-100nm MOSFETs. HAL (Le Centre pour la Communication Scientifique Directe). 109–110. 5 indexed citations
2.
Fleury, Dominique, A. Cros, David P. Roy, et al.. (2008). Automatic Extraction Methodology for Accurate Measurements of Effective Channel Length on 65-nm MOSFET Technology and Below. IEEE Transactions on Semiconductor Manufacturing. 21(4). 504–512. 16 indexed citations
3.
Hofheinz, M., X. Jehl, M. Sanquer, et al.. (2008). Measurement of Capacitances in Multigate Transistors by Coulomb Blockade Spectroscopy. IEEE Transactions on Nanotechnology. 7(1). 74–78. 1 indexed citations
4.
Planes, N., et al.. (2007). A New Combined Methodology for Write-Margin Extraction of Advanced SRAM. 97–100. 58 indexed citations
5.
Fleury, Dominique, S. Harrison, B. Dumont, et al.. (2006). Unexpected mobility degradation for very short devices : A new challenge for CMOS scaling. 1–4. 87 indexed citations
6.
7.
8.
Arora, N.D., et al.. (2004). Test chip characterization of X architecture diagonal lines for SoC design. 75–79. 3 indexed citations
9.
Planes, N., et al.. (2003). Impact of gate current on first order parameter extraction in sub-0.1 μm CMOS technologies. 133. 3–141. 1 indexed citations
10.
11.
Pretet, J., Takuma Matsumoto, T. Poiroux, et al.. (2002). New Mechanism of Body Charging in Partially Depleted SOI-MOSFETs with Ultra-thin Gate Oxides. 515–518. 55 indexed citations
12.
13.
14.
Brut, H., G. Ghibaudo, & A. Juge. (1996). New Method for the Extraction of the Gate Voltage Dependence of the Series Resistance in CMOS Transistors. European Solid-State Device Research Conference. 675–678. 4 indexed citations
15.
Brut, H., A. Juge, & G. Ghibaudo. (1995). Physical model of threshold voltage in siliconMOS transistors including reverse short channel effect. Electronics Letters. 31(5). 411–412. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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