G. Tempel

578 total citations
33 papers, 441 citations indexed

About

G. Tempel is a scholar working on Electrical and Electronic Engineering, Computer Networks and Communications and Materials Chemistry. According to data from OpenAlex, G. Tempel has authored 33 papers receiving a total of 441 indexed citations (citations by other indexed papers that have themselves been cited), including 30 papers in Electrical and Electronic Engineering, 7 papers in Computer Networks and Communications and 7 papers in Materials Chemistry. Recurrent topics in G. Tempel's work include Semiconductor materials and devices (27 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers) and Advanced Memory and Neural Computing (8 papers). G. Tempel is often cited by papers focused on Semiconductor materials and devices (27 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers) and Advanced Memory and Neural Computing (8 papers). G. Tempel collaborates with scholars based in Germany, Belgium and United States. G. Tempel's co-authors include I. Eisele, H.P. Zeindl, F. Koch, H. Reisinger, H. Oppolzer, Paul Hendrickx, D. Wellekens, G. Groeseneken, L. Haspeslagh and R. Degraeve and has published in prestigious journals such as Applied Physics Letters, Journal of The Electrochemical Society and Surface Science.

In The Last Decade

G. Tempel

31 papers receiving 432 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
G. Tempel Germany 11 366 158 122 48 42 33 441
Tahui Wang Taiwan 18 1.0k 2.9× 87 0.6× 161 1.3× 73 1.5× 116 2.8× 121 1.1k
Otmar Ertl Austria 11 120 0.3× 197 1.2× 46 0.4× 153 3.2× 22 0.5× 23 310
M. Togo Japan 14 599 1.6× 62 0.4× 66 0.5× 24 0.5× 19 0.5× 68 619
M. Morimoto Japan 13 413 1.1× 188 1.2× 41 0.3× 22 0.5× 7 0.2× 53 450
K. Ohyu Japan 15 562 1.5× 108 0.7× 81 0.7× 25 0.5× 17 0.4× 36 601
B. Engel United States 5 205 0.6× 312 2.0× 80 0.7× 141 2.9× 27 0.6× 7 382
K. Ando Japan 10 397 1.1× 44 0.3× 137 1.1× 19 0.4× 10 0.2× 27 459
Minoru Amano Japan 5 261 0.7× 367 2.3× 97 0.8× 209 4.4× 52 1.2× 7 487
T. Horiuchi Japan 12 764 2.1× 79 0.5× 52 0.4× 42 0.9× 22 0.5× 51 820
M. Arafa United States 13 629 1.7× 406 2.6× 106 0.9× 23 0.5× 29 0.7× 24 717

Countries citing papers authored by G. Tempel

Since Specialization
Citations

This map shows the geographic impact of G. Tempel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Tempel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Tempel more than expected).

Fields of papers citing papers by G. Tempel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Tempel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Tempel. The network helps show where G. Tempel may publish in the future.

Co-authorship network of co-authors of G. Tempel

This figure shows the co-authorship network connecting the top 25 collaborators of G. Tempel. A scholar is included among the top collaborators of G. Tempel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. Tempel. G. Tempel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Zambelli, Cristian, et al.. (2013). Erratic bits classification for efficient repair strategies in automotive embedded flash memories. Institutional Research Information System University of Ferrara (University of Ferrara). 2E.3.1–2E.3.7. 3 indexed citations
2.
Zambelli, Cristian, et al.. (2013). Exposing Reliability/Performance Tradeoff in Non-Volatile Memories Through Erratic Bits Signature Classification. IEEE Transactions on Device and Materials Reliability. 14(1). 66–73. 2 indexed citations
3.
4.
Tempel, G., et al.. (2011). Gate-Side and Substrate-Side Oxide Trap and Interface State Generation in Conventional and Nitrided Tunnel Oxides of Floating Gate Cells. IEEE Transactions on Electron Devices. 58(3). 819–825. 1 indexed citations
5.
6.
Krautschneider, Wolfgang H., et al.. (2007). A modified constant field charge pumping method for sensitive profiling of near-junction charges. 279–282. 1 indexed citations
7.
Power, J. R., Yiyang Gong, G. Tempel, et al.. (2007). Improved Reliability of a High-k IPD Flash Cell through use of a Top-oxide. 27–29. 6 indexed citations
8.
Hagenbeck, R., Stefan Decker, Christoph Jungemann, et al.. (2006). Monte Carlo Simulation of Charge Carrier Injection in Twin Flash Memory Devices during Program and Erase. 3. 322–325. 1 indexed citations
9.
10.
Hagenbeck, R., et al.. (2004). Modeling and Simulation of Electron Injection during Programming in Twin FlashTM Devices Based on Energy Transport and the Non-Local Lucky Electron Concept. Journal of Computational Electronics. 3(3-4). 239–242. 1 indexed citations
11.
Degraeve, R., B. Kaczer, M. Lorenzini, et al.. (2004). Analytical Percolation Model for Predicting Anomalous Charge Loss in Flash Memories. IEEE Transactions on Electron Devices. 51(9). 1392–1400. 66 indexed citations
12.
Degraeve, R., M. Lorenzini, D. Wellekens, et al.. (2002). Analytical model for failure rate prediction due to anomalous charge loss of flash memories. 32.1.1–32.1.4. 31 indexed citations
13.
Lindsay, Richard, A. Bergmaier, Wilfried Vandervorst, et al.. (2002). Electrical Activity of B and As Segregated at the Si-SiO2 Interface. MRS Proceedings. 717. 3 indexed citations
14.
Degraeve, R., B. Kaczer, M. Lorenzini, et al.. (2001). Statistical model for SILC and pre-breakdown current jumps in ultra-thin oxide layers. 2 indexed citations
15.
Mitwalsky, A., G. Tempel, G. Zorn, et al.. (1995). Deposition, annealing and characterisation of high‐dielectric‐constant metal oxide films. Advanced Materials for Optics and Electronics. 5(3). 163–175. 23 indexed citations
16.
Mitwalsky, A., G. Tempel, G. Zorn, et al.. (1995). ChemInform Abstract: Deposition, Annealing and Characterization of High‐Dielectric Constant Metal Oxide Films.. ChemInform. 26(41). 1 indexed citations
17.
Tempel, G., Norbert Schwarz, Frank Müller, et al.. (1990). Infrared resonance excitation of δ-layers-a silicon-based infrared quantum-well detector. Thin Solid Films. 184(1-2). 171–176. 29 indexed citations
18.
Zeindl, H.P., B. Bullemer, I. Eisele, & G. Tempel. (1989). Delta‐Doped MESFET with MBE‐Grown Si. Journal of The Electrochemical Society. 136(4). 1129–1131. 16 indexed citations
19.
Zeindl, H.P., I. Eisele, H. Oppolzer, et al.. (1987). Growth and characterization of a delta-function doping layer in Si. Applied Physics Letters. 50(17). 1164–1166. 112 indexed citations
20.
Tempel, G., F. Koch, H.P. Zeindl, & I. Eisele. (1987). ELECTRONIC STATES AND TRANSPORT PROPERTIES OF AN n-TYPE δ-FUNCTION DOPING LAYER IN p-TYPE Si. Le Journal de Physique Colloques. 48(C5). C5–259. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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