G. F. McLane
- Electrical and Electronic Engineering
- Materials Chemistry
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics top 10%
- Mechanics of Materials
- Co-authors
- J.N. ZemelJ. R. FlemishS. J. PeartonC. R. AbernathyM. MeyyappanM. LevyRichard M. OsgoodR. Scarmozzino
- Topics
- Semiconductor materials and devices (24 papers)Plasma Diagnostics and Applications (11 papers)Metal and Thin Film Mechanics (10 papers)
- Cited by
- Condensed Matter PhysicsElectrical and Electronic EngineeringAtomic and Molecular Physics, and Optics
- Partner nations
- United StatesMexicoCanada
In The Last Decade
G. F. McLane
41 papers receiving 386 citations
Peers
Comparison fields: 5 of 33
- Electrical and Electronic Engineering 287
- Materials Chemistry 152
- Atomic and Molecular Physics, and Optics 143
- Condensed Matter Physics 91
- Mechanics of Materials 69
Countries citing papers authored by G. F. McLane
This map shows the geographic impact of G. F. McLane's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. F. McLane with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. F. McLane more than expected).
Fields of papers citing papers by G. F. McLane
This network shows the impact of papers produced by G. F. McLane. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. F. McLane. The network helps show where G. F. McLane may publish in the future.
Co-authorship network of co-authors of G. F. McLane
This figure shows the co-authorship network connecting the top 25 collaborators of G. F. McLane. A scholar is included among the top collaborators of G. F. McLane based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. F. McLane. G. F. McLane is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 3 | |
| 3 | Carbon Nanotube Tipped Atomic Force Microscopy for Measurement of | 1 |
| 4 | 0 | |
| 5 | 1 | |
| 6 | 37 | |
| 7 | 4 | |
| 8 | 1 | |
| 9 | 1 | |
| 10 | 7 | |
| 11 | 1 | |
| 12 | 12 | |
| 13 | 2 | |
| 14 | 1 | |
| 15 | 3 | |
| 16 | 11 | |
| 17 | 3 | |
| 18 | 1 | |
| 19 | 6 | |
| 20 | 8 |
About G. F. McLane
G. F. McLane is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics, having authored 43 papers that have together received 409 indexed citations. Recurring topics across this work include Semiconductor materials and devices (24 papers), Plasma Diagnostics and Applications (11 papers) and Metal and Thin Film Mechanics (10 papers). The work is most often cited by research in Condensed Matter Physics (91 citations), Electrical and Electronic Engineering (287 citations) and Atomic and Molecular Physics, and Optics (143 citations). G. F. McLane has collaborated with scholars based in United States, Mexico and Canada. Frequent co-authors include J.N. Zemel, J. R. Flemish, S. J. Pearton, C. R. Abernathy, M. Meyyappan, M. Levy, Richard M. Osgood, R. Scarmozzino, Chris A. Michaels and Hongjie Dai. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.