M. W. Cole

3.6k total citations
129 papers, 3.1k citations indexed

About

M. W. Cole is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, M. W. Cole has authored 129 papers receiving a total of 3.1k indexed citations (citations by other indexed papers that have themselves been cited), including 93 papers in Electrical and Electronic Engineering, 66 papers in Materials Chemistry and 38 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in M. W. Cole's work include Semiconductor materials and devices (55 papers), Ferroelectric and Piezoelectric Materials (54 papers) and Microwave Dielectric Ceramics Synthesis (31 papers). M. W. Cole is often cited by papers focused on Semiconductor materials and devices (55 papers), Ferroelectric and Piezoelectric Materials (54 papers) and Microwave Dielectric Ceramics Synthesis (31 papers). M. W. Cole collaborates with scholars based in United States, Israel and United Kingdom. M. W. Cole's co-authors include P. C. Joshi, E. Ngo, S. P. Alpay, C. Hubbard, M. H. Ervin, Matthew H. Ervin, S. Hirsch, W. D. Nothwang, Robert Pfeffer and F. Ren and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

M. W. Cole

121 papers receiving 3.0k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. W. Cole United States 27 2.3k 2.2k 888 758 459 129 3.1k
Mineo Hiramatsu Japan 28 1.7k 0.8× 1.2k 0.5× 464 0.5× 482 0.6× 157 0.3× 116 2.6k
V. Lantto Finland 34 2.0k 0.9× 2.7k 1.2× 1.3k 1.5× 591 0.8× 434 0.9× 132 3.8k
Ahmad A. Ahmad Jordan 29 1.2k 0.5× 868 0.4× 554 0.6× 311 0.4× 136 0.3× 142 2.3k
Duan Feng China 20 1.3k 0.6× 923 0.4× 519 0.6× 269 0.4× 721 1.6× 169 2.1k
L. Vanzetti Italy 28 1.1k 0.5× 1.3k 0.6× 528 0.6× 183 0.2× 753 1.6× 137 2.2k
G. Scarel United States 26 1.6k 0.7× 1.6k 0.7× 195 0.2× 293 0.4× 259 0.6× 82 2.2k
Chuan‐Pu Liu Taiwan 30 1.8k 0.8× 1.6k 0.7× 888 1.0× 932 1.2× 1.3k 2.9× 149 3.5k
A. Slaoui France 32 2.8k 1.2× 3.0k 1.4× 730 0.8× 444 0.6× 536 1.2× 289 4.0k
Feng Wu China 33 1.8k 0.8× 2.5k 1.1× 528 0.6× 981 1.3× 260 0.6× 156 3.7k
F. Gourbilleau France 32 2.7k 1.2× 2.1k 1.0× 1.1k 1.2× 227 0.3× 583 1.3× 204 3.2k

Countries citing papers authored by M. W. Cole

Since Specialization
Citations

This map shows the geographic impact of M. W. Cole's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. W. Cole with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. W. Cole more than expected).

Fields of papers citing papers by M. W. Cole

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. W. Cole. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. W. Cole. The network helps show where M. W. Cole may publish in the future.

Co-authorship network of co-authors of M. W. Cole

This figure shows the co-authorship network connecting the top 25 collaborators of M. W. Cole. A scholar is included among the top collaborators of M. W. Cole based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. W. Cole. M. W. Cole is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Cole, M. W., et al.. (2012). Third-order electric-field-induced dipolar resonances from patterned barium-strontium-titanate thin-films. Applied Physics Letters. 100(22). 3 indexed citations
2.
Cole, M. W., S. Hirsch, M. Ivill, et al.. (2011). An Elegant Post-Growth Process Science Protocol to Improve the Material Properties of Complex Oxide Thin Films for Tunable Device Applications. Integrated ferroelectrics. 126(1). 34–46. 1 indexed citations
3.
Nath, R., Shan Zhong, S. P. Alpay, Bryan D. Huey, & M. W. Cole. (2008). Enhanced piezoelectric response from barium strontium titanate multilayer films. Applied Physics Letters. 92(1). 51 indexed citations
4.
Podpirka, Adrian, M. W. Cole, & Shriram Ramanathan. (2008). Effect of photon irradiation on structural, dielectric, and insulating properties of Ba0.60Sr0.40TiO3 thin films. Applied Physics Letters. 92(21). 27 indexed citations
5.
6.
Nothwang, W. D., S. Hirsch, J. D. Demaree, et al.. (2006). DIRECT INTEGRATION OF THIN FILM PIEZOELECTRIC SENSORS WITH STRUCTURAL MATERIALS FOR STRUCTURAL HEALTH MONITORING. Integrated ferroelectrics. 83(1). 139–148. 1 indexed citations
7.
Mukhopadhyay, Goutam, Hee Yeon Kim, Darrell Velegol, Jorge O. Sofo, & M. W. Cole. (2005). Static polarizabilities of dielectric nanoclusters (8 pages). Physical Review A. 72(5). 53201. 1 indexed citations
8.
Cole, M. W. & R.G. Geyer. (2004). Novel tunable acceptor doped BST thin films for high quality tunable microwave devices. Revista Mexicana de Física. 50(3). 232–238. 9 indexed citations
9.
Mohanchandra, K. P., et al.. (2004). Damping of polycrystalline Ni-Mn-Ga, bulk, PLD, and sputtered thin film. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5387. 156–156. 4 indexed citations
10.
Nothwang, W. D., M. W. Cole, C. Hubbard, & E. Ngo. (2003). Measuring Residual Stress Effects of Acceptor Doping In Tunable Microwave Dielectric Thin Films. MRS Proceedings. 784. 1 indexed citations
11.
Geyer, R.G., M. W. Cole, P. C. Joshi, et al.. (2002). Correlation of Microwave Dielectric Properties and Microstructure of Unpatterned Ferroelectric Thin Films. MRS Proceedings. 720. 4 indexed citations
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14.
Ren, F., J. R. Lothian, W. S. Hobson, et al.. (1996). BCl3/N2 dry etching of InP, InAlP, and InGaP. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(3). 1758–1763. 10 indexed citations
15.
Jones, Keith, M. W. Cole, P. Cooke, et al.. (1994). Accurately determining the composition and thickness of layers in a GaAs/InGaAs superlattice. Journal of Applied Physics. 76(3). 1609–1614. 4 indexed citations
16.
Pang, S. W., et al.. (1994). Evaluation of surface damage on GaAs etched with an electron cyclotron resonance source. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(6). 3382–3387. 15 indexed citations
17.
Cole, M. W. & Eugene Zakar. (1991). Rapid plan view tem sample preparation for semiconductor grain size analysis. Journal of Electron Microscopy Technique. 19(1). 128–129. 3 indexed citations
18.
Jiao, K.L., Ribhu Sharma, Wayne A. Anderson, et al.. (1991). Microstructural analysis of Pd-based ohmic contacts to p-type GaAs. Journal of materials research/Pratt's guide to venture capital sources. 6(3). 553–559. 3 indexed citations
19.
Cole, M. W., D. W. Eckart, R. T. Lareau, et al.. (1990). Mechanisms for the formation of low temperature, non-alloyed Au-Ge ohmic contacts to n-GaAs. Journal of Electronic Materials. 19(11). 1247–1255. 9 indexed citations
20.
Cole, M. W., et al.. (1990). A Two-Step Process for the Formation of Au-Ge Ohmic Contacts to n-GaAs. MRS Proceedings. 181. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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