J.N. Zemel
- Electrical and Electronic Engineering top 2%
- Atomic and Molecular Physics, and Optics top 2%
- Materials Chemistry top 5%
- Biomedical Engineering top 5%
- Mechanical Engineering top 2%
- Co-authors
- Haim H. BauJohn C. HarleyR. B. SchoolarJ. D. JensenYufeng HuangB. GebhartPeter J. HeskethI. Lauks
- Topics
- Gas Sensing Nanomaterials and Sensors (24 papers)Chalcogenide Semiconductor Thin Films (21 papers)Analytical Chemistry and Sensors (20 papers)
- Partner nations
- United StatesCanadaJapan
In The Last Decade
J.N. Zemel
120 papers receiving 3.4k citations
Hit Papers
Peers
Comparison fields: 5 of 100
- Electrical and Electronic Engineering 1.9k
- Atomic and Molecular Physics, and Optics 952
- Materials Chemistry 944
- Biomedical Engineering 876
- Mechanical Engineering 792
Countries citing papers authored by J.N. Zemel
This map shows the geographic impact of J.N. Zemel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.N. Zemel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.N. Zemel more than expected).
Fields of papers citing papers by J.N. Zemel
This network shows the impact of papers produced by J.N. Zemel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.N. Zemel. The network helps show where J.N. Zemel may publish in the future.
Co-authorship network of co-authors of J.N. Zemel
This figure shows the co-authorship network connecting the top 25 collaborators of J.N. Zemel. A scholar is included among the top collaborators of J.N. Zemel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J.N. Zemel. J.N. Zemel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | Computational Two-Dimensional Finite-Element Analysis of Flow Behavior Inside Microfluidic Amplifiers | 1 |
| 2 | 11 | |
| 3 | 199 | |
| 4 | 5 | |
| 5 | 9 | |
| 6 | 1 | |
| 7 | 23 | |
| 8 | 1 | |
| 9 | 11 | |
| 10 | 27 | |
| 11 | 53 | |
| 12 | 5 | |
| 13 | 14 | |
| 14 | 5 | |
| 15 | 38 | |
| 16 | 1 | |
| 17 | 58 | |
| 18 | 8 | |
| 19 | Semiconductor surfaces : proceedings of the second conference | 1 |
| 20 | 84 |
About J.N. Zemel
J.N. Zemel is a scholar working on Bioengineering, Electrochemistry and Electrical and Electronic Engineering, having authored 124 papers that have together received 3.7k indexed citations. Recurring topics across this work include Gas Sensing Nanomaterials and Sensors (24 papers), Chalcogenide Semiconductor Thin Films (21 papers) and Analytical Chemistry and Sensors (20 papers). The work is most often cited by research in Bioengineering (448 citations), Electrochemistry (211 citations) and Electrical and Electronic Engineering (1.9k citations). J.N. Zemel has collaborated with scholars based in United States, Canada and Japan. Frequent co-authors include Haim H. Bau, John C. Harley, R. B. Schoolar, J. D. Jensen, Yufeng Huang, B. Gebhart, Peter J. Hesketh, I. Lauks, Arel Weisberg and Teruaki Katsube. Their work appears in journals such as Nature, Physical Review Letters and The Journal of Chemical Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.