R.G. Bennetts

774 citations

26 papers · 487 indexed · h-index 12

Impact in

Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Embedded Systems Design Techniques
Software top 5%
- Software Reliability and Analysis Research

Papers in

Hardware and Architecture 16
- VLSI and Analog Circuit Testing 16
- Embedded Systems Design Techniques 3
Software 6
- Software Reliability and Analysis Research 5

Co-authors: F. P. M. Beenker A. P. Thijssen J.B. Fussell Gary J. Powers Colin Maunder Erik Jan Marinissen Bart Vermeulen Henk D. L. Hollmann
Journals: IEEE Transactions on Reliability (3 papers)Computer (2 papers)The Computer Journal (2 papers)IEEE Transactions on Computers (1 paper)Journal of Electronic Testing (1 paper)
Partner nations: United Kingdom Netherlands United States

In The Last Decade

R.G. Bennetts

25 papers receiving 442 citations

Peers

Countries citing papers authored by R.G. Bennetts

Since Specialization

Citations

This map shows the geographic impact of R.G. Bennetts's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.G. Bennetts with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.G. Bennetts more than expected).

Fields of papers citing papers by R.G. Bennetts

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R.G. Bennetts. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.G. Bennetts. The network helps show where R.G. Bennetts may publish in the future.

Co-authorship network

The 9 scholars most cited alongside R.G. Bennetts, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with R.G. Bennetts Line = papers co-authored together R.G. Bennetts links everyone, so they are left out of the graph.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work
1	Minimizing pattern count for interconnect test under a ground bounce constraint IEEE Design & Test of Computers ·Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, R.G. Bennetts	2003	19
2	Testability Concepts for Digital ICs F. P. M. Beenker, R.G. Bennetts, A. P. Thijssen	1995	28
3	Testability Concepts for Digital ICs: The Macro Test Approach CERN Document Server (European Organization for Nuclear Research) ·F. P. M. Beenker, R.G. Bennetts, A. P. Thijssen	1995	20
4	IEEE standard 1149.1-1990 on boundary scan: History, literature survey, and current status Journal of Electronic Testing ·R.G. Bennetts, Namama Soran Al-Talabani	1991	9
5	Evaluating the cost of using an ATE - a structured approach R.G. Bennetts	1987	1
6	Design of testable logic circuits Medical Entomology and Zoology ·R.G. Bennetts	1984	73
7	Analysis of Reliability Block Diagrams by Boolean Techniques IEEE Transactions on Reliability ·R.G. Bennetts	1982	49
8	Introduction to Digital Board Testing CERN Document Server (European Organization for Nuclear Research) ·R.G. Bennetts	1982	21
9	Techniques for testing microprocessor boards IEE Proceedings A Physical Science, Measurement and Instrumentation, Management and Education, Reviews ·R.G. Bennetts	1981	1
10	COMELOT: a computer-aided measure for logic testability R.G. Bennetts, Colin Maunder, Malda Pramiana	1981	30
11	COMELOT: a computer-aided measure for logic testability IEE Proceedings E Computers and Digital Techniques ·R.G. Bennetts, Yinzhou Guo, Catherine Larrère	1981	8
12	Rademacher–Walsh spectral transform: a new tool for problems in adigital-network fault diagnosis? R.G. Bennetts, S.L. Hurst	1978	1
13	Designing reliable computer systems. The fault-tolerant approach – 1 Electronics and Power ·R.G. Bennetts	1978	2
14	Rademacher–Walsh spectral transform: a new tool for problems in adigital-network fault diagnosis? R.G. Bennetts, S.L. Hurst	1978	4
15	Recent Developments in the Theory and Practice of Testable Logic Design* Computer ·R.G. Bennetts, Li Keqiang	1976	15
16	On the Analysis of Fault Trees IEEE Transactions on Reliability ·R.G. Bennetts	1975	70
17	Fault TreesߞA State of the Art Discussion IEEE Transactions on Reliability ·J.B. Fussell, Gary J. Powers, R.G. Bennetts	1974	38
18	A realistic approach to detection test set generation for combinational logic circuits The Computer Journal ·R.G. Bennetts	1972	4
19	A computer algorithm for state table reduction Radio and Electronic Engineer ·R.G. Bennetts, 宏繁西澤, Andrea Müns	1972	14
20	Fault diagnosis of digital systems--a review The Computer Journal ·R.G. Bennetts	1971	3

About R.G. Bennetts

R.G. Bennetts is a scholar working on Hardware and Architecture, Software, Control and Systems Engineering, Electrical and Electronic Engineering and Statistics, Probability and Uncertainty, having authored 26 papers that have together received 487 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (16 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Engineering and Test Systems (8 papers), VLSI and FPGA Design Techniques (6 papers), Software Reliability and Analysis Research (5 papers), Radiation Effects in Electronics (3 papers), Embedded Systems Design Techniques (3 papers) and Distributed systems and fault tolerance (2 papers). The work is most often cited by research in Hardware and Architecture (261 citations), Software (99 citations), Statistics, Probability and Uncertainty (51 citations), Safety, Risk, Reliability and Quality (60 citations) and Electrical and Electronic Engineering (250 citations). R.G. Bennetts has collaborated with scholars based in United Kingdom, Netherlands and United States. Frequent co-authors include F. P. M. Beenker, A. P. Thijssen, J.B. Fussell, Gary J. Powers, Colin Maunder, Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann and S.L. Hurst. Their work appears in journals such as IEEE Transactions on Reliability, Computer, The Computer Journal, IEEE Transactions on Computers and Journal of Electronic Testing.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact