Elshad Guliyev

435 total citations
22 papers, 314 citations indexed

About

Elshad Guliyev is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Biomedical Engineering. According to data from OpenAlex, Elshad Guliyev has authored 22 papers receiving a total of 314 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Atomic and Molecular Physics, and Optics, 17 papers in Electrical and Electronic Engineering and 9 papers in Biomedical Engineering. Recurrent topics in Elshad Guliyev's work include Force Microscopy Techniques and Applications (17 papers), Mechanical and Optical Resonators (9 papers) and Advanced MEMS and NEMS Technologies (7 papers). Elshad Guliyev is often cited by papers focused on Force Microscopy Techniques and Applications (17 papers), Mechanical and Optical Resonators (9 papers) and Advanced MEMS and NEMS Technologies (7 papers). Elshad Guliyev collaborates with scholars based in Germany, United Kingdom and United States. Elshad Guliyev's co-authors include Ivo W. Rangelow, Tzvetan Ivanov, Marcus Kaestner, Steve Lenk, Alexander Reum, Ahmad Ahmad, Mathias Holz, Claudia Lenk, Manuel Höfer and Tzv. Ivanov and has published in prestigious journals such as Applied Physics A, Measurement Science and Technology and Journal of Manufacturing Processes.

In The Last Decade

Elshad Guliyev

22 papers receiving 306 citations

Peers

Elshad Guliyev
Tzv. Ivanov Germany
Jeffrey Lam Singapore
W. H. Juan United States
Andrzej Sierakowski Poland
Euclid E. Moon United States
V. Seena India
H.‐J. Timme Germany
Meng-Hsiung Kiang United States
Lee Smith United States
U. Aljančič Slovenia
Tzv. Ivanov Germany
Elshad Guliyev
Citations per year, relative to Elshad Guliyev Elshad Guliyev (= 1×) peers Tzv. Ivanov

Countries citing papers authored by Elshad Guliyev

Since Specialization
Citations

This map shows the geographic impact of Elshad Guliyev's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Elshad Guliyev with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Elshad Guliyev more than expected).

Fields of papers citing papers by Elshad Guliyev

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Elshad Guliyev. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Elshad Guliyev. The network helps show where Elshad Guliyev may publish in the future.

Co-authorship network of co-authors of Elshad Guliyev

This figure shows the co-authorship network connecting the top 25 collaborators of Elshad Guliyev. A scholar is included among the top collaborators of Elshad Guliyev based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Elshad Guliyev. Elshad Guliyev is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Harrison, Philip G., I. M. Campbell, Elshad Guliyev, et al.. (2020). Induction melt thermoforming of advanced multi-axial thermoplastic composite laminates. Journal of Manufacturing Processes. 60. 673–683. 6 indexed citations
2.
Holz, Mathias, Ahmad Ahmad, Alexander Reum, et al.. (2019). Parallel active cantilever AFM tool for high-throughput inspection and metrology. 79–79. 2 indexed citations
3.
Lenk, Claudia, Steve Lenk, Mathias Holz, et al.. (2018). Experimental study of field emission from ultrasharp silicon, diamond, GaN, and tungsten tips in close proximity to the counter electrode. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 36(6). 15 indexed citations
4.
Rangelow, Ivo W., Martin Hofmann, Tzvetan Ivanov, et al.. (2018). Single nano-digit and closed-loop scanning probe lithography for manufacturing of electronic and optical nanodevices. 66–66. 4 indexed citations
5.
Rangelow, Ivo W., Marcus Kaestner, Tzvetan Ivanov, et al.. (2018). Atomic force microscope integrated with a scanning electron microscope for correlative nanofabrication and microscopy. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 36(6). 27 indexed citations
6.
Holz, Mathias, Elshad Guliyev, Ahmad Ahmad, et al.. (2018). Field-emission scanning probe lithography tool for 150 mm wafer. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 36(6). 10 indexed citations
7.
Ahmad, Ahmad, Elshad Guliyev, Alexander Reum, et al.. (2016). Six-axis AFM in SEM with self-sensing and self-transduced cantilever for high speed analysis and nanolithography. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 34(6). 19 indexed citations
8.
Guliyev, Elshad, Ivan Buliev, Marcus Kaestner, et al.. (2016). Scanning probe-based high-accuracy overlay alignment concept for lithography applications. Applied Physics A. 123(1). 10 indexed citations
9.
Ahmad, Ahmad, Nikolay Nıkolov, Tzvetan Ivanov, et al.. (2016). Large area fast-AFM scanning with active “Quattro” cantilever arrays. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 34(6). 27 indexed citations
10.
Höfer, Manuel, et al.. (2015). Fabrication of self-actuated piezoresistive thermal probes. Microelectronic Engineering. 145. 32–37. 10 indexed citations
11.
Ahmad, Ahmad, Tzvetan Ivanov, Alexander Reum, et al.. (2015). Self-actuated, self-sensing cantilever for fast CD measurement. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9424. 94240P–94240P. 7 indexed citations
12.
Kaestner, Marcus, Tzvetan Ivanov, Steve Lenk, et al.. (2014). Electric field scanning probe lithography on molecular glass resists using self-actuating, self-sensing cantilever. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9049. 90490C–90490C. 14 indexed citations
13.
Durrani, Z. A. K., Mervyn Jones, Marcus Kaestner, et al.. (2013). Scanning probe lithography approach for beyond CMOS devices. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8680. 868017–868017. 22 indexed citations
14.
Manske, Eberhard, Marcus Kaestner, Andreas Schuh, et al.. (2013). 0.1-nanometer resolution positioning stage for sub-10 nm scanning probe lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8680. 868018–868018. 15 indexed citations
15.
Guliyev, Elshad, et al.. (2012). Micromachined self-actuated piezoresistive cantilever for high speed SPM. Microelectronic Engineering. 97. 265–268. 21 indexed citations
16.
Weis, Christoph, J. Schwartz, Arun Persaud, et al.. (2012). Improved single ion implantation with scanning probe alignment. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 30(6). 13 indexed citations
17.
Guliyev, Elshad, B. Volland, Y. Sarov, et al.. (2012). Quasi-monolithic integration of silicon-MEMS with piezoelectric actuators for high-speed non-contact atomic force microscopy. Measurement Science and Technology. 23(7). 74012–74012. 21 indexed citations
18.
Guliyev, Elshad, et al.. (2012). High speed quasi-monolithic silicon/piezostack SPM scanning stage. Microelectronic Engineering. 98. 520–523. 11 indexed citations
19.
Volland, B., K. Ivanova, Tzv. Ivanov, et al.. (2007). Duo-action electro thermal micro gripper. Microelectronic Engineering. 84(5-8). 1329–1332. 18 indexed citations
20.
Guliyev, Elshad, et al.. (2004). Modeling of double SAW resonator remote sensor. 1416–1419. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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2026